Description
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards.
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Contributors
- Juarez, Joseph Moses (Author)
- Montgomery, Douglas C. (Thesis advisor)
- Borror, Connie M. (Thesis advisor)
- Gel, Esma (Committee member)
- Mignolet, Marc (Committee member)
- Pan, Rong (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2012
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Note
- Partial requirement for: Ph.D., Arizona State University, 2012Note typethesis
- Includes bibliographical references (p. 187-192)Note typebibliography
- Field of study: Industrial engineering
Citation and reuse
Statement of Responsibility
by Joseph Moses Juarez