Description
Testing and calibration constitute a significant part of the overall manufacturing cost of microelectromechanical system (MEMS) devices. Developing a low-cost testing and calibration scheme applicable at the user side that ensures the continuous reliability and accuracy is a crucial need.
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Contributors
- Ozel, Muhlis Kenan (Author)
- Bakkaloglu, Bertan (Thesis advisor)
- Ozev, Sule (Thesis advisor)
- Kiaei, Sayfe (Committee member)
- Ogras, Umit Y. (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2017
Resource Type
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Note
- Doctoral Dissertation Electrical Engineering 2017