Description
Testing and calibration constitute a significant part of the overall manufacturing cost of microelectromechanical system (MEMS) devices. Developing a low-cost testing and calibration scheme applicable at the user side that ensures the continuous reliability and accuracy is a crucial need.
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Contributors
- Ozel, Muhlis Kenan (Author)
- Bakkaloglu, Bertan (Thesis advisor)
- Ozev, Sule (Thesis advisor)
- Kiaei, Sayfe (Committee member)
- Ogras, Umit Y. (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2017
Resource Type
Collections this item is in
Note
- Doctoral Dissertation Electrical Engineering 2017