Description

Testing and calibration constitute a significant part of the overall manufacturing cost of microelectromechanical system (MEMS) devices. Developing a low-cost testing and calibration scheme applicable at the user side that ensures the continuous reliability and accuracy is a crucial need.

Reuse Permissions
  • Downloads
    pdf (3.6 MB)

    Download count: 0

    Details

    Contributors
    Date Created
    2017
    Resource Type
  • Text
  • Collections this item is in
    Note
    • Doctoral Dissertation Electrical Engineering 2017

    Machine-readable links