Description
Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget.
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Contributors
- Yilmaz, Ender (Author)
- Ozev, Sule (Thesis advisor)
- Bakkaloglu, Bertan (Committee member)
- Cao, Yu (Committee member)
- Christen, Jennifer Blain (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2012
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Note
- Partial requirement for: Ph.D., Arizona State University, 2012Note typethesis
- Includes bibliographical references (p. 196-203)Note typebibliography
- Field of study: Electrical engineering
Citation and reuse
Statement of Responsibility
by Ender Yilmaz