Description
Over the last decade copper electrodeposition has become the dominant process by which microelectronic interconnects are made. Replacing ultra-high vacuum evaporative film growth, the technology known as the Cu damascene process has been widely implemented in the microelectronics industry since the early 2000s.
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Contributors
- Heaton, Thomas Stanley (Author)
- Friesen, Cody (Thesis advisor)
- Buttry, Daniel (Committee member)
- Sieradzki, Karl (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2011
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Note
- Ph.D. Materials Science and Engineering 2011