Description
In this project, a novel method is presented for measuring the resistivity of nanoscale metallic conductors (nanowires) using a variable-spacing 2-point method with a modified ultrahigh vacuum scanning tunneling microscope. An auxiliary field emission imaging method that allows for scanning insulating surfaces using a large gap distance (20nm) is also presented.
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Contributors
- Tobler, Samuel (Author)
- Bennett, Peter (Thesis advisor)
- McCartney, Martha (Committee member)
- Tao, Nongjian (Committee member)
- Doak, Bruce (Committee member)
- Chen, Tingyong (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2011
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Note
- Partial requirement for: Ph.D., Arizona State University, 2011Note typethesis
- Includes bibliographical references (p. 90-97)Note typebibliography
- Field of study: Physics
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Statement of Responsibility
by Samuel Tobler