Description

Negative bias temperature instability (NBTI) is a leading aging mechanism in modern digital and analog circuits. Recent NBTI data exhibits an excessive amount of randomness and fast recovery, which are

Negative bias temperature instability (NBTI) is a leading aging mechanism in modern digital and analog circuits. Recent NBTI data exhibits an excessive amount of randomness and fast recovery, which are difficult to be handled by conventional power-law model (tn). Such discrepancies further pose the challenge on long-term reliability prediction under statistical variations and Dynamic Voltage Scaling (DVS) in real circuit operation.

Reuse Permissions
  • 2.8 MB application/pdf

    Download count: 0

    Details

    Contributors
    Date Created
    • 2012
    Resource Type
  • Text
  • Collections this item is in
    Note
    • Partial requirement for: Ph.D., Arizona State University, 2012
      Note type
      thesis
    • Includes bibliographical references (p. 90-97)
      Note type
      bibliography
    • Field of study: Electrical engineering

    Citation and reuse

    Statement of Responsibility

    by Jyothi Bhaskarr Velamala

    Machine-readable links