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In this thesis two methodologies have been proposed for evaluating the fault response of analog/RF circuits. These proposed approaches are used to evaluate the response of the faulty circuit in

In this thesis two methodologies have been proposed for evaluating the fault response of analog/RF circuits. These proposed approaches are used to evaluate the response of the faulty circuit in terms of specifications/measurements. Faulty response can be used to evaluate important test metrics like fail probability, fault coverage and yield coverage of given measurements under process variations.

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    Date Created
    • 2010
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  • Text
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    Note
    • Partial requirement for: M.S., Arizona State University, 2010
      Note type
      thesis
    • Includes bibliographical references (p. 73-76)
      Note type
      bibliography
    • Field of study: Electrical engineering

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    by Gurusubrahmaniyan Subrahmaniyan Radhakrishnan

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