In this thesis two methodologies have been proposed for evaluating the fault response of analog/RF circuits. These proposed approaches are used to evaluate the response of the faulty circuit in terms of specifications/measurements. Faulty response can be used to evaluate important test metrics like fail probability, fault coverage and yield coverage of given measurements under process variations.
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- Partial requirement for: M.S., Arizona State University, 2010Note typethesis
- Includes bibliographical references (p. 73-76)Note typebibliography
- Field of study: Electrical engineering