Description
Fluctuation Electron Microscopy (FEM) has become an effective materials' structure characterization technique, capable of probing medium-range order (MRO) that may be present in amorphous materials. Although its sensitivity to MRO has been exercised in numerous studies, FEM is not yet a quantitative technique.
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- Rezikyan, Aram (Author)
- Treacy, Michael M.J. (Thesis advisor)
- Smith, David J. (Committee member)
- McCartney, Martha R. (Committee member)
- Rez, Peter (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2015
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Note
- Partial requirement for: Ph.D., Arizona State University, 2015Note typethesis
- Includes bibliographical references (p. 100-118)Note typebibliography
- Field of study: Physics
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by Aram Rezikyan