Description
Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction.
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Contributors
- Zheng, Rui (Author)
- Cao, Yu (Thesis advisor)
- Yu, Hongyu (Committee member)
- Bakkaloglu, Bertan (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2011
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Note
- Partial requirement for: M.S., Arizona State University, 2011Note typethesis
- Includes bibliographical references (p. 45-47)Note typebibliography
- Field of study: Electrical engineering
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Statement of Responsibility
by Rui Zheng