Description

Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction.

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    Date Created
    2011
    Resource Type
  • Text
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    • Partial requirement for: M.S., Arizona State University, 2011
      Note type
      thesis
    • Includes bibliographical references (p. 45-47)
      Note type
      bibliography
    • Field of study: Electrical engineering

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    by Rui Zheng

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