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Serial femtosecond crystallography (SFX) takes advantage of extremely bright and ultrashort pulses produced by x-ray free-electron lasers (XFELs), allowing for the collection of high-resolution diffraction intensities from micrometer-sized crystals at

Serial femtosecond crystallography (SFX) takes advantage of extremely bright and ultrashort pulses produced by x-ray free-electron lasers (XFELs), allowing for the collection of high-resolution diffraction intensities from micrometer-sized crystals at room temperature with minimal radiation damage, using the principle of “diffraction-before-destruction.” However, de novo structure factor phase determination using XFELs has been difficult so far.

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    Date Created
    • 2016-09-23
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  • Text
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    Identifier
    • Digital object identifier: 10.1126/sciadv.1600292
    • Identifier Type
      International standard serial number
      Identifier Value
      2375-2548

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    Batyuk, A., Galli, L., Ishchenko, A., Han, G. W., Gati, C., Popov, P. A., . . . Cherezov, V. (2016). Native phasing of x-ray free-electron laser data for a G protein-coupled receptor. Science Advances, 2(9). doi:10.1126/sciadv.1600292

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