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Current hard X-ray free-electron laser (XFEL) sources can deliver doses to biological macromolecules well exceeding 1 GGy, in timescales of a few tens of femtoseconds. During the pulse, photoionization can

Current hard X-ray free-electron laser (XFEL) sources can deliver doses to biological macromolecules well exceeding 1 GGy, in timescales of a few tens of femtoseconds. During the pulse, photoionization can reach the point of saturation in which certain atomic species in the sample lose most of their electrons. This electronic radiation damage causes the atomic scattering factors to change, affecting, in particular, the heavy atoms, due to their higher photoabsorption cross sections.

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    Date Created
    • 2015-04-29
    Resource Type
  • Text
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    Identifier
    • Digital object identifier: 10.1063/1.4919398
    • Identifier Type
      International standard serial number
      Identifier Value
      2329-7778
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    Galli, L., Son, S., Klinge, M., Bajt, S., Barty, A., Bean, R., . . . Chapman, H. N. (2015). Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse. Structural Dynamics, 2(4), 041703. doi:10.1063/1.4919398

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