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X-ray free-electron lasers (XFELs) provide new opportunities for structure determination of biomolecules, viruses and nanomaterials. With unprecedented peak brilliance and ultra-short pulse duration, XFELs can tolerate higher X-ray doses by

X-ray free-electron lasers (XFELs) provide new opportunities for structure determination of biomolecules, viruses and nanomaterials. With unprecedented peak brilliance and ultra-short pulse duration, XFELs can tolerate higher X-ray doses by exploiting the femtosecond-scale exposure time, and can thus go beyond the resolution limits achieved with conventional X-ray diffraction imaging techniques.

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    Date Created
    • 2017-08-27
    Resource Type
  • Text
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    Identifier
    • Digital object identifier: 10.1107/S2052252517012398
    • Identifier Type
      International standard serial number
      Identifier Value
      2052-2525

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    Li, X., Spence, J. C., Hogue, B. G., & Liu, H. (2017). Merging single-shot XFEL diffraction data from inorganic nanoparticles: a new approach to size and orientation determination. IUCrJ, 4(6), 741-750. doi:10.1107/s2052252517012398

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