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X-ray tomography has provided a non-destructive means for microstructure characterization in three and four dimensions. A stochastic procedure to accurately reconstruct material microstructure from limited-angle X-ray tomographic projections is presented

X-ray tomography has provided a non-destructive means for microstructure characterization in three and four dimensions. A stochastic procedure to accurately reconstruct material microstructure from limited-angle X-ray tomographic projections is presented and its utility is demonstrated by reconstructing a variety of distinct heterogeneous materials and elucidating the information content of different projection data sets. A small number of projections (e.g.

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  • 2014-09-01
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    • NOTICE: this is the author's version of a work that was accepted for publication in . Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in SCRIPTA MATERIALIA, 86, 48-51. DOI: 10.1016/j.scriptamat.2014.05.002, opens in a new window

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    Li, Hechao, Chawla, Nikhilesh, & Jiao, Yang (2014). Reconstruction of heterogeneous materials via stochastic optimization of limited-angle X-ray tomographic projections. SCRIPTA MATERIALIA, 86, 48-51. http://dx.doi.org/10.1016/j.scriptamat.2014.05.002

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