Serial femtosecond crystallography (SFX) uses diffraction patterns from crystals delivered in a serial fashion to an X-Ray Free Electron Laser (XFEL) for structure determination. Typically, each diffraction pattern is a snapshot from a different crystal. SFX limits the effect of radiation damage and enables the use of nano/micro crystals for structure determination. However, analysis of SFX data is challenging since each snapshot is processed individually.
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- Partial requirement for: Ph.D., Arizona State University, 2019Note typethesis
- Includes bibliographical referencesNote typebibliography
- Field of study: Biochemistry