A critical assumption underlying in situ transmission electron microscopy studies is that the electron beam (e-beam) exposure does not fundamentally alter the intrinsic deformation behavior of the materials being probed. Here, we show that e-beam exposure causes increased dislocation activation and marked stress relaxation in aluminum and gold films spanning a range of thicknesses (80–400 nanometers) and grain sizes (50–220 nanometers). Furthermore, the e-beam induces anomalous sample necking, which unusually depends more on the e-beam diameter than intensity.
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- Sarkar, Rohit (Contributor)
- Rentenberger, Christian (Author)
- Rajagopalan, Jagannathan (Contributor)
- Ira A. Fulton Schools of Engineering (Contributor)
- 2015-11-10
- Digital object identifier: 10.1038/srep16345
- Identifier TypeInternational standard serial numberIdentifier Value2045-2322
- The final version of this article, as published in Scientific Reports, can be viewed online at: https://www.nature.com/articles/srep16345, opens in a new window
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Sarkar, R., Rentenberger, C., & Rajagopalan, J. (2015). Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals. Scientific Reports, 5(1). doi:10.1038/srep16345