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A critical assumption underlying in situ transmission electron microscopy studies is that the electron beam (e-beam) exposure does not fundamentally alter the intrinsic deformation behavior of the materials being probed.

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    Date Created
    2015-11-10
    Resource Type
  • Text
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    Identifier
    • Digital object identifier: 10.1038/srep16345
    • Identifier Type
      International standard serial number
      Identifier Value
      2045-2322
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    Sarkar, R., Rentenberger, C., & Rajagopalan, J. (2015). Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals. Scientific Reports, 5(1). doi:10.1038/srep16345

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