Description
This thesis project explores the TID susceptibility of 12nm FinFETs. Along with the basic effects, the mechanisms and patterns of these effects are analyzed and reported.
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Details
Title
- Radiation Testing and Effects on NMOS Transistor Technologies
Contributors
Agent
- Wallace, Trace (Author)
- Barnaby, Hugh (Thesis director)
- Marinella, Mathew (Committee member)
- Barrett, The Honors College (Contributor)
- Electrical Engineering Program (Contributor)
- Dean, W.P. Carey School of Business (Contributor)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2022-05
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