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  • Real Time in Situ Composition Control of InGaAs Lattice Matched to InP by an 88-Wavelength Ellipsometer
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Date Created
1998
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  • Text
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    C.-H. Kuo, M. Boonzaayer, M. DeHerrera, T. Kyong, Y.-H. Zhang, B. Johs, and J. S. Hale, Journal of Vacuum Science & Technology B 16, 1484 (1998)

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