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Voltage Sense Amplifier (VSA) Design For RRAM Cross-Point Memory Array Structures

Description
RRAM is an emerging technology that looks to replace FLASH NOR and possibly NAND memory. It is attractive because it uses an adjustable resistance and does not rely on charge; in the sub-10nm feature size circuitry this is critical. However, RRAM cross-point arrays suffer tremendously from leakage currents that prevent…

RRAM is an emerging technology that looks to replace FLASH NOR and possibly NAND memory. It is attractive because it uses an adjustable resistance and does not rely on charge; in the sub-10nm feature size circuitry this is critical. However, RRAM cross-point arrays suffer tremendously from leakage currents that prevent proper readings in larger array sizes. In this research an exponential IV selector was added to each cell to minimize this current. Using this technique the largest array-size supportable was determined to be 512x512 cells using the conventional voltage sense amplifier by HSPICE simulations. However, with the increase in array size, the sensing latency also remarkably increases due to more sneak path currents, approaching 873 ns for the 512x512 array.
ContributorsMadler, Ryan Anton (Author) / Yu, Shimeng (Thesis director) / Cao, Yu (Committee member) / Electrical Engineering Program (Contributor) / Barrett, The Honors College (Contributor)
Created2016-05