Matching Items (28)
Filtering by

Clear all filters

149829-Thumbnail Image.png
Description
Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research,

Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research, a new three dimensional model for tolerance transfer in manufacturing process planning is presented that is user friendly in the sense that it is built upon the Coordinate Measuring Machine (CMM) readings that are readily available in any decent manufacturing facility. This model can take care of datum reference change between non orthogonal datums (squeezed datums), non-linearly oriented datums (twisted datums) etc. Graph theoretic approach based upon ACIS, C++ and MFC is laid out to facilitate its implementation for automation of the model. A totally new approach to determining dimensions and tolerances for the manufacturing process plan is also presented. Secondly, a new statistical model for the statistical tolerance analysis based upon joint probability distribution of the trivariate normal distributed variables is presented. 4-D probability Maps have been developed in which the probability value of a point in space is represented by the size of the marker and the associated color. Points inside the part map represent the pass percentage for parts manufactured. The effect of refinement with form and orientation tolerance is highlighted by calculating the change in pass percentage with the pass percentage for size tolerance only. Delaunay triangulation and ray tracing algorithms have been used to automate the process of identifying the points inside and outside the part map. Proof of concept software has been implemented to demonstrate this model and to determine pass percentages for various cases. The model is further extended to assemblies by employing convolution algorithms on two trivariate statistical distributions to arrive at the statistical distribution of the assembly. Map generated by using Minkowski Sum techniques on the individual part maps is superimposed on the probability point cloud resulting from convolution. Delaunay triangulation and ray tracing algorithms are employed to determine the assembleability percentages for the assembly.
ContributorsKhan, M Nadeem Shafi (Author) / Phelan, Patrick E (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Farin, Gerald (Committee member) / Roberts, Chell (Committee member) / Henderson, Mark (Committee member) / Arizona State University (Publisher)
Created2011
152223-Thumbnail Image.png
Description
Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has

Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has been done in the ALT area and optimal design for ALT is a major topic. This dissertation consists of three main studies. First, a methodology of finding optimal design for ALT with right censoring and interval censoring have been developed and it employs the proportional hazard (PH) model and generalized linear model (GLM) to simplify the computational process. A sensitivity study is also given to show the effects brought by parameters to the designs. Second, an extended version of I-optimal design for ALT is discussed and then a dual-objective design criterion is defined and showed with several examples. Also in order to evaluate different candidate designs, several graphical tools are developed. Finally, when there are more than one models available, different model checking designs are discussed.
ContributorsYang, Tao (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Borror, Connie (Committee member) / Rigdon, Steve (Committee member) / Arizona State University (Publisher)
Created2013
150494-Thumbnail Image.png
Description
Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a

Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a mixed model with a longitudinal database of test scores. There is concern, however, that missing values that are common in the longitudinal student scores can bias value-added assessments, especially when the models serve as a basis for personnel decisions -- such as promoting or dismissing teachers -- as they are being used in some states. Certain types of missing data require that the VAM be modeled jointly with the missingness process in order to obtain unbiased parameter estimates. This dissertation studies two problems. First, the flexibility and multimembership random effects structure of the generalized persistence model lead to computational challenges that have limited the model's availability. To this point, no methods have been developed for scalable maximum likelihood estimation of the model. An EM algorithm to compute maximum likelihood estimates efficiently is developed, making use of the sparse structure of the random effects and error covariance matrices. The algorithm is implemented in the package GPvam in R statistical software. Illustrations of the gains in computational efficiency achieved by the estimation procedure are given. Furthermore, to address the presence of potentially nonignorable missing data, a flexible correlated random effects model is developed that extends the generalized persistence model to jointly model the test scores and the missingness process, allowing the process to depend on both students and teachers. The joint model gives the ability to test the sensitivity of the VAM to the presence of nonignorable missing data. Estimation of the model is challenging due to the non-hierarchical dependence structure and the resulting intractable high-dimensional integrals. Maximum likelihood estimation of the model is performed using an EM algorithm with fully exponential Laplace approximations for the E step. The methods are illustrated with data from university calculus classes and with data from standardized test scores from an urban school district.
ContributorsKarl, Andrew (Author) / Lohr, Sharon L (Thesis advisor) / Yang, Yan (Thesis advisor) / Kao, Ming-Hung (Committee member) / Montgomery, Douglas C. (Committee member) / Wilson, Jeffrey R (Committee member) / Arizona State University (Publisher)
Created2012
150547-Thumbnail Image.png
Description
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but

This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but the data generated and their analysis is for high performance avionics. Avionics equipment typically requires 20 years expected life by aircraft equipment manufacturers and therefore ALT is the only practical way of performing life test estimates. Both thermal and vibration ALT induced failure are performed and analyzed to resolve industry questions relating to the introduction of lead-free solder product and processes into high reliability avionics. In chapter 2, thermal ALT using an industry standard failure machine implementing Interconnect Stress Test (IST) that simulates circuit board life data is compared to real production failure data by likelihood ratio tests to arrive at a mechanical theory. This mechanical theory results in a statistically equivalent energy bound such that failure distributions below a specific energy level are considered to be from the same distribution thus allowing testers to quantify parameter setting in IST prior to life testing. In chapter 3, vibration ALT comparing tin-lead and lead-free circuit board solder designs involves the use of the likelihood ratio (LR) test to assess both complete failure data and S-N curves to present methods for analyzing data. Failure data is analyzed using Regression and two-way analysis of variance (ANOVA) and reconciled with the LR test results that indicating that a costly aging pre-process may be eliminated in certain cases. In chapter 4, vibration ALT for side-by-side tin-lead and lead-free solder black box designs are life tested. Commercial models from strain data do not exist at the low levels associated with life testing and need to be developed because testing performed and presented here indicate that both tin-lead and lead-free solders are similar. In addition, earlier failures due to vibration like connector failure modes will occur before solder interconnect failures.
ContributorsJuarez, Joseph Moses (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie M. (Thesis advisor) / Gel, Esma (Committee member) / Mignolet, Marc (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2012
Description
The object of the present study is to examine methods in which the company can optimize their costs on third-party suppliers whom oversee other third-party trade labor. The third parties in scope of this study are suspected to overstaff their workforce, thus overcharging the company. We will introduce a complex

The object of the present study is to examine methods in which the company can optimize their costs on third-party suppliers whom oversee other third-party trade labor. The third parties in scope of this study are suspected to overstaff their workforce, thus overcharging the company. We will introduce a complex spreadsheet model that will propose a proper project staffing level based on key qualitative variables and statistics. Using the model outputs, the Thesis team proposes a headcount solution for the company and problem areas to focus on, going forward. All sources of information come from company proprietary and confidential documents.
ContributorsLoo, Andrew (Co-author) / Brennan, Michael (Co-author) / Sheiner, Alexander (Co-author) / Hertzel, Michael (Thesis director) / Simonson, Mark (Committee member) / Barrett, The Honors College (Contributor) / Department of Information Systems (Contributor) / Department of Finance (Contributor) / Department of Supply Chain Management (Contributor) / WPC Graduate Programs (Contributor) / School of Accountancy (Contributor)
Created2014-05
149613-Thumbnail Image.png
Description
Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is

Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is essential to identifying processing issues, improving quality, and meeting customer demand in the industry. However, the complicated fabrication process, the massive amount of data collected, and the number of models available make yield modeling a complex and challenging task. This work presents modeling strategies to forecast yield using generalized linear models (GLMs) based on defect metrology data. The research is divided into three main parts. First, the data integration and aggregation necessary for model building are described, and GLMs are constructed for yield forecasting. This technique yields results at both the die and the wafer levels, outperforms existing models found in the literature based on prediction errors, and identifies significant factors that can drive process improvement. This method also allows the nested structure of the process to be considered in the model, improving predictive capabilities and violating fewer assumptions. To account for the random sampling typically used in fabrication, the work is extended by using generalized linear mixed models (GLMMs) and a larger dataset to show the differences between batch-specific and population-averaged models in this application and how they compare to GLMs. These results show some additional improvements in forecasting abilities under certain conditions and show the differences between the significant effects identified in the GLM and GLMM models. The effects of link functions and sample size are also examined at the die and wafer levels. The third part of this research describes a methodology for integrating classification and regression trees (CART) with GLMs. This technique uses the terminal nodes identified in the classification tree to add predictors to a GLM. This method enables the model to consider important interaction terms in a simpler way than with the GLM alone, and provides valuable insight into the fabrication process through the combination of the tree structure and the statistical analysis of the GLM.
ContributorsKrueger, Dana Cheree (Author) / Montgomery, Douglas C. (Thesis advisor) / Fowler, John (Committee member) / Pan, Rong (Committee member) / Pfund, Michele (Committee member) / Arizona State University (Publisher)
Created2011
149476-Thumbnail Image.png
Description
In mixture-process variable experiments, it is common that the number of runs is greater than in mixture-only or process-variable experiments. These experiments have to estimate the parameters from the mixture components, process variables, and interactions of both variables. In some of these experiments there are variables that are hard to

In mixture-process variable experiments, it is common that the number of runs is greater than in mixture-only or process-variable experiments. These experiments have to estimate the parameters from the mixture components, process variables, and interactions of both variables. In some of these experiments there are variables that are hard to change or cannot be controlled under normal operating conditions. These situations often prohibit a complete randomization for the experimental runs due to practical and economical considerations. Furthermore, the process variables can be categorized into two types: variables that are controllable and directly affect the response, and variables that are uncontrollable and primarily affect the variability of the response. These uncontrollable variables are called noise factors and assumed controllable in a laboratory environment for the purpose of conducting experiments. The model containing both noise variables and control factors can be used to determine factor settings for the control factor that makes the response "robust" to the variability transmitted from the noise factors. These types of experiments can be analyzed in a model for the mean response and a model for the slope of the response within a split-plot structure. When considering the experimental designs, low prediction variances for the mean and slope model are desirable. The methods for the mixture-process variable designs with noise variables considering a restricted randomization are demonstrated and some mixture-process variable designs that are robust to the coefficients of interaction with noise variables are evaluated using fraction design space plots with the respect to the prediction variance properties. Finally, the G-optimal design that minimizes the maximum prediction variance over the entire design region is created using a genetic algorithm.
ContributorsCho, Tae Yeon (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie M. (Thesis advisor) / Shunk, Dan L. (Committee member) / Gel, Esma S (Committee member) / Kulahci, Murat (Committee member) / Arizona State University (Publisher)
Created2010
149443-Thumbnail Image.png
Description
Public health surveillance is a special case of the general problem where counts (or rates) of events are monitored for changes. Modern data complements event counts with many additional measurements (such as geographic, demographic, and others) that comprise high-dimensional covariates. This leads to an important challenge to detect a change

Public health surveillance is a special case of the general problem where counts (or rates) of events are monitored for changes. Modern data complements event counts with many additional measurements (such as geographic, demographic, and others) that comprise high-dimensional covariates. This leads to an important challenge to detect a change that only occurs within a region, initially unspecified, defined by these covariates. Current methods are typically limited to spatial and/or temporal covariate information and often fail to use all the information available in modern data that can be paramount in unveiling these subtle changes. Additional complexities associated with modern health data that are often not accounted for by traditional methods include: covariates of mixed type, missing values, and high-order interactions among covariates. This work proposes a transform of public health surveillance to supervised learning, so that an appropriate learner can inherently address all the complexities described previously. At the same time, quantitative measures from the learner can be used to define signal criteria to detect changes in rates of events. A Feature Selection (FS) method is used to identify covariates that contribute to a model and to generate a signal. A measure of statistical significance is included to control false alarms. An alternative Percentile method identifies the specific cases that lead to changes using class probability estimates from tree-based ensembles. This second method is intended to be less computationally intensive and significantly simpler to implement. Finally, a third method labeled Rule-Based Feature Value Selection (RBFVS) is proposed for identifying the specific regions in high-dimensional space where the changes are occurring. Results on simulated examples are used to compare the FS method and the Percentile method. Note this work emphasizes the application of the proposed methods on public health surveillance. Nonetheless, these methods can easily be extended to a variety of applications where counts (or rates) of events are monitored for changes. Such problems commonly occur in domains such as manufacturing, economics, environmental systems, engineering, as well as in public health.
ContributorsDavila, Saylisse (Author) / Runger, George C. (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Young, Dennis (Committee member) / Gel, Esma (Committee member) / Arizona State University (Publisher)
Created2010
136255-Thumbnail Image.png
Description
Over the course of six months, we have worked in partnership with Arizona State University and a leading producer of semiconductor chips in the United States market (referred to as the "Company"), lending our skills in finance, statistics, model building, and external insight. We attempt to design models that hel

Over the course of six months, we have worked in partnership with Arizona State University and a leading producer of semiconductor chips in the United States market (referred to as the "Company"), lending our skills in finance, statistics, model building, and external insight. We attempt to design models that help predict how much time it takes to implement a cost-saving project. These projects had previously been considered only on the merit of cost savings, but with an added dimension of time, we hope to forecast time according to a number of variables. With such a forecast, we can then apply it to an expense project prioritization model which relates time and cost savings together, compares many different projects simultaneously, and returns a series of present value calculations over different ranges of time. The goal is twofold: assist with an accurate prediction of a project's time to implementation, and provide a basis to compare different projects based on their present values, ultimately helping to reduce the Company's manufacturing costs and improve gross margins. We believe this approach, and the research found toward this goal, is most valuable for the Company. Two coaches from the Company have provided assistance and clarified our questions when necessary throughout our research. In this paper, we begin by defining the problem, setting an objective, and establishing a checklist to monitor our progress. Next, our attention shifts to the data: making observations, trimming the dataset, framing and scoping the variables to be used for the analysis portion of the paper. Before creating a hypothesis, we perform a preliminary statistical analysis of certain individual variables to enrich our variable selection process. After the hypothesis, we run multiple linear regressions with project duration as the dependent variable. After regression analysis and a test for robustness, we shift our focus to an intuitive model based on rules of thumb. We relate these models to an expense project prioritization tool developed using Microsoft Excel software. Our deliverables to the Company come in the form of (1) a rules of thumb intuitive model and (2) an expense project prioritization tool.
ContributorsAl-Assi, Hashim (Co-author) / Chiang, Robert (Co-author) / Liu, Andrew (Co-author) / Ludwick, David (Co-author) / Simonson, Mark (Thesis director) / Hertzel, Michael (Committee member) / Barrett, The Honors College (Contributor) / Department of Information Systems (Contributor) / Department of Finance (Contributor) / Department of Economics (Contributor) / Department of Supply Chain Management (Contributor) / School of Accountancy (Contributor) / School of Mathematical and Statistical Sciences (Contributor) / Mechanical and Aerospace Engineering Program (Contributor) / WPC Graduate Programs (Contributor)
Created2015-05
133787-Thumbnail Image.png
Description
This paper about the Garden Grub concerns the growing Agritech industry along with exposing middle school students to STEM education. Currently over half of America's students are not prepared to be successful in our technology driven world. These students did not have the opportunity to be exposed to many Science,

This paper about the Garden Grub concerns the growing Agritech industry along with exposing middle school students to STEM education. Currently over half of America's students are not prepared to be successful in our technology driven world. These students did not have the opportunity to be exposed to many Science, Technology, Engineering, and Math related careers or majors before entering the working world and/or college. These students are unaware of the real-life applications these topics can have and will never have the chance to pursue these fields. Using the Garden Grub, students will be introduced to the world of Agritech and how traditional agriculture is changing in include more technology. The Garden Grub is designed to not only introduce students to STEM in general, but specifically the Agritech Industry. With the Garden Grub kit and instructions students will be able to construct a small device that will monitor the external temperature and the soil moisture of a plant they are growing. For future implementations of the Garden Grub, we will develop a structured lesson plan to teach the users more about the device they are building. This is so in the future users could continue their education in Agritech and STEM because they have more knowledge on the subjects From standalone testing the Garden Grub, the device was able to successfully monitor the lettuce to ensure that it grew successfully. The Garden Grub instructions and kit were tested in a fourth-grade classroom, where college volunteers worked with the students to begin to create their own device. While there was not enough time to successfully complete the product the fourth graders were more interested in STEM than when we first started. Even though they struggled in the beginning, students quickly learned basic concepts , such as +/- circuit power, transfer of data, and sensor connections. More recently we were able to go into a middle school and teach in a classroom with the students who were part of a coding elective course. Since our last outing we were able to update the user manual and prepare more ahead of time. This gave us more time to explain the concepts to the students, along with being able to successful build all of the devices. They began to think of ways that this device could be applicable to their lives along with how the Garden Grub could be improved in the future.
ContributorsWynia, Rachel Marie (Author) / Lin, Elva (Thesis director) / Eakin, Hallie (Committee member) / WPC Graduate Programs (Contributor) / Department of Information Systems (Contributor) / Barrett, The Honors College (Contributor)
Created2018-05