Singly deuterated silylene has been detected and characterized in the gas-phase using high-resolution, two-dimensional, optical spectroscopy. Rotationally resolved lines in the 0[0 over 0][˜ over X]1A′ → [˜ over A]1A′′000X˜1A′→A˜1A″ band are assigned to both c-type perpendicular transition and additional parallel, axis-switching induced bands. The extracted rotational constants were combined with those for SiH2 and SiD2 to determine an improved equilibrium bond length, rSiH, and bond angle, θ, of 1.5137 ± 0.0003 Å and 92.04° ± 0.05°, and 1.4853 ± 0.0005 Å and 122.48° ± 0.08° for the [˜ over X]1A′(0, 0, 0) and [˜ over A]1A″(0, 0, 0) state respectively. The dispersed fluorescence consists of a long progression in the [˜ over A]1A″(0,0,0) → [˜ over X]1A′(0, ν2, 0) emission which was analyzed to produce vibrational parameters. A strong quantum level dependence of the rotationally resolved radiative decay curves is analyzed.
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- Detection and Characterization of Singly Deuterated Silylene, SiHD, Via Optical Spectroscopy
- Kokkin, Damian (Author)
- Ma, Tongmei (Author)
- Steimle, Timothy (Author)
- Sears, Trevor J. (Author)
- College of Liberal Arts and Sciences (Contributor)
- Digital object identifier: 10.1063/1.4954702
- Identifier TypeInternational standard serial numberIdentifier Value1833-3672
- Identifier TypeInternational standard serial numberIdentifier Value1839-3527
- This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in The Journal of Chemical Physics and may be found at http://aip.scitation.org/doi/10.1063/1.4954702, opens in a new window.
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Kokkin, D. L., Ma, T., Steimle, T., & Sears, T. J. (2016). Detection and characterization of singly deuterated silylene, SiHD, via optical spectroscopy. The Journal of Chemical Physics, 144(24), 244304. doi:10.1063/1.4954702