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- Creators: Electrical Engineering Program
Description
This thesis project explores the TID susceptibility of 12nm FinFETs. Along with the basic effects, the mechanisms and patterns of these effects are analyzed and reported.
ContributorsWallace, Trace (Author) / Barnaby, Hugh (Thesis director) / Marinella, Mathew (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor) / Dean, W.P. Carey School of Business (Contributor)
Created2022-05