This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.

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Description
Continuous Delivery, as one of the youngest and most popular member of agile model family, has become a popular concept and method in software development industry recently. Instead of the traditional software development method, which requirements and solutions must be fixed before starting software developing, it promotes adaptive planning, evolutionary

Continuous Delivery, as one of the youngest and most popular member of agile model family, has become a popular concept and method in software development industry recently. Instead of the traditional software development method, which requirements and solutions must be fixed before starting software developing, it promotes adaptive planning, evolutionary development and delivery, and encourages rapid and flexible response to change. However, several problems prevent Continuous Delivery to be introduced into education world. Taking into the consideration of the barriers, we propose a new Cloud based Continuous Delivery Software Developing System. This system is designed to fully utilize the whole life circle of software developing according to Continuous Delivery concepts in a virtualized environment in Vlab platform.
ContributorsDeng, Yuli (Author) / Huang, Dijiang (Thesis advisor) / Davulcu, Hasan (Committee member) / Chen, Yinong (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specifications, requiring multiple test set-ups and long test

Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specifications, requiring multiple test set-ups and long test times, which complicates load-board design, debug, and diagnosis. Second, high frequency operation necessitates the use of expensive equipment, resulting in higher per second test time cost compared with mixed-signal or digital circuits. Moreover, in terms of the non-recurring engineering cost, the need to measure complex specfications complicates the test development process and necessitates a long learning process for test engineers. Test time is dominated by changing and settling time for each test set-up. Thus, single set-up test solutions are desirable. Loop-back configuration where the transmitter output is connected to the receiver input are used as the desirable test set- up for RF transceivers, since it eliminates the reliance on expensive instrumentation for RF signal analysis and enables measuring multiple parameters at once. In-phase and Quadrature (IQ) imbalance, non-linearity, DC offset and IQ time skews are some of the most detrimental imperfections in transceiver performance. Measurement of these parameters in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. Loop-back based solutions are proposed in this work to resolve this issue. A calibration algorithm for a subset of the above mentioned impairments is also presented. Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. EVM is analytically related to system impairments, which are typically measured in a production test i environment. Thus, EVM test can be eliminated from the test list if the relations between EVM and system impairments are derived independent of the circuit implementation and manufacturing process. In this work, the focus is on the WLAN standard, and deriving the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems (IQ imbalance, non-linearity, and noise). Having low cost test techniques for measuring the RF transceivers imperfections and being able to analytically compute EVM from the measured parameters is a complete test solution for RF transceivers. These techniques along with the proposed calibration method can be used in improving the yield by widening the pass/fail boundaries for transceivers imperfections. For all of the proposed methods, simulation and hardware measurements prove that the proposed techniques provide accurate characterization of RF transceivers.
ContributorsNassery, Afsaneh (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary

Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary with process and requires calibration to make them reliable. This increases test cost and testing time. This challenge can be overcome by combining electrical stimulus based testing along with statistical analysis on MEMS response for electrical stimulus and also limited physical stimulus response data. This thesis proposes electrical stimulus based built in self test(BIST) which can be used to get MEMS data and later this data can be used for statistical analysis. A capacitive MEMS accelerometer is considered to test this BIST approach. This BIST circuit overhead is less and utilizes most of the standard readout circuit. This thesis discusses accelerometer response for electrical stimulus and BIST architecture. As a part of this BIST circuit, a second order sigma delta modulator has been designed. This modulator has a sampling frequency of 1MHz and bandwidth of 6KHz. SNDR of 60dB is achieved with 1Vpp differential input signal and 3.3V supply
ContributorsKundur, Vinay (Author) / Bakkaloglu, Bertan (Committee member) / Ozev, Sule (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there

Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there is not a single straightforward solution to the problem. Products that are tested have several application domains and distinct customer profiles. Some products are required to operate for long periods of time while others are required to be low cost and optimized for low cost. Multitude of constraints and goals make it impossible to find a single solution that work for all cases. Hence, test development/optimization is typically design/circuit dependent and even process specific. Therefore, test optimization cannot be performed using a single test approach, but necessitates a diversity of approaches. This works aims at addressing test cost minimization and test quality improvement at various levels. In the first chapter of the work, we investigate pre-silicon strategies, such as design for test and pre-silicon statistical simulation optimization. In the second chapter, we investigate efficient post-silicon test strategies, such as adaptive test, adaptive multi-site test, outlier analysis, and process shift detection/tracking.
ContributorsYilmaz, Ender (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Cao, Yu (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2012
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Description
The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured

The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured using CMOS and the final product is integrated on to a single chip. Amount spent on testing of the MEMS devices make up a considerable share of the total final cost of the device. In order to save the cost and time spent on testing, researchers have been trying to develop different methodologies. At present, MEMS devices are tested using mechanical stimuli to measure the device parameters and for calibration the device. This testing is necessary since the MEMS process is not a very well controlled process unlike CMOS. This is done using an ATE and the cost of using ATE (automatic testing equipment) contribute to 30-40% of the devices final cost. This thesis proposes an architecture which can use an Electrical Signal to stimulate the MEMS device and use the data from the MEMS response in approximating the calibration coefficients efficiently. As a proof of concept, we have designed a BIST (Built-in self-test) circuit for MEMS accelerometer. The BIST has an electrical stimulus generator, Capacitance-to-voltage converter, ∑ ∆ ADC. This thesis explains in detail the design of the Electrical stimulus generator. We have also designed a technique to correlate the parameters obtained from electrical stimuli to those obtained by mechanical stimuli. This method is cost effective since the additional circuitry needed to implement BIST is less since the technique utilizes most of the existing standard readout circuitry already present.
ContributorsJangala Naga, Naveen Sai (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2014
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Description
Access control is necessary for information assurance in many of today's applications such as banking and electronic health record. Access control breaches are critical security problems that can result from unintended and improper implementation of security policies. Security testing can help identify security vulnerabilities early and avoid unexpected expensive cost

Access control is necessary for information assurance in many of today's applications such as banking and electronic health record. Access control breaches are critical security problems that can result from unintended and improper implementation of security policies. Security testing can help identify security vulnerabilities early and avoid unexpected expensive cost in handling breaches for security architects and security engineers. The process of security testing which involves creating tests that effectively examine vulnerabilities is a challenging task. Role-Based Access Control (RBAC) has been widely adopted to support fine-grained access control. However, in practice, due to its complexity including role management, role hierarchy with hundreds of roles, and their associated privileges and users, systematically testing RBAC systems is crucial to ensure the security in various domains ranging from cyber-infrastructure to mission-critical applications. In this thesis, we introduce i) a security testing technique for RBAC systems considering the principle of maximum privileges, the structure of the role hierarchy, and a new security test coverage criterion; ii) a MTBDD (Multi-Terminal Binary Decision Diagram) based representation of RBAC security policy including RHMTBDD (Role Hierarchy MTBDD) to efficiently generate effective positive and negative security test cases; and iii) a security testing framework which takes an XACML-based RBAC security policy as an input, parses it into a RHMTBDD representation and then generates positive and negative test cases. We also demonstrate the efficacy of our approach through case studies.
ContributorsGupta, Poonam (Author) / Ahn, Gail-Joon (Thesis advisor) / Collofello, James (Committee member) / Huang, Dijiang (Committee member) / Arizona State University (Publisher)
Created2014
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Description
The energy consumption of data centers is increasing steadily along with the associ- ated power-density. Approximately half of such energy consumption is attributed to the cooling energy, as a result of which reducing cooling energy along with reducing servers energy consumption in data centers is becoming imperative so as to

The energy consumption of data centers is increasing steadily along with the associ- ated power-density. Approximately half of such energy consumption is attributed to the cooling energy, as a result of which reducing cooling energy along with reducing servers energy consumption in data centers is becoming imperative so as to achieve greening of the data centers. This thesis deals with cooling energy management in data centers running data-processing frameworks. In particular, we propose ther- mal aware scheduling for MapReduce framework and its Hadoop implementation to reduce cooling energy in data centers. Data-processing frameworks run many low- priority batch processing jobs, such as background log analysis, that do not have strict completion time requirements; they can be delayed by a bounded amount of time. Cooling energy savings are possible by being able to temporally spread the workload, and assign it to the computing equipments which reduce the heat recirculation in data center room and therefore the load on the cooling systems. We implement our scheme in Hadoop and performs some experiments using both CPU-intensive and I/O-intensive workload benchmarks in order to evaluate the efficiency of our scheme. The evaluation results highlight that our thermal aware scheduling reduces hot-spots and makes uniform temperature distribution within the data center possible. Sum- marizing the contribution, we incorporated thermal awareness in Hadoop MapReduce framework by enhancing the native scheduler to make it thermally aware, compare the Thermal Aware Scheduler(TAS) with the Hadoop scheduler (FCFS) by running PageRank and TeraSort benchmarks in the BlueTool data center of Impact lab and show that there is reduction in peak temperature and decrease in cooling power using TAS over FCFS scheduler.
ContributorsKole, Sayan (Author) / Gupta, Sandeep (Thesis advisor) / Huang, Dijiang (Committee member) / Varsamopoulos, Georgios (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Attribute Based Access Control (ABAC) mechanisms have been attracting a lot of interest from the research community in recent times. This is especially because of the flexibility and extensibility it provides by using attributes assigned to subjects as the basis for access control. ABAC enables an administrator of a server

Attribute Based Access Control (ABAC) mechanisms have been attracting a lot of interest from the research community in recent times. This is especially because of the flexibility and extensibility it provides by using attributes assigned to subjects as the basis for access control. ABAC enables an administrator of a server to enforce access policies on the data, services and other such resources fairly easily. It also accommodates new policies and changes to existing policies gracefully, thereby making it a potentially good mechanism for implementing access control in large systems, particularly in today's age of Cloud Computing. However management of the attributes in ABAC environment is an area that has been little touched upon. Having a mechanism to allow multiple ABAC based systems to share data and resources can go a long way in making ABAC scalable. At the same time each system should be able to specify their own attribute sets independently. In the research presented in this document a new mechanism is proposed that would enable users to share resources and data in a cloud environment using ABAC techniques in a distributed manner. The focus is mainly on decentralizing the access policy specifications for the shared data so that each data owner can specify the access policy independent of others. The concept of ontologies and semantic web is introduced in the ABAC paradigm that would help in giving a scalable structure to the attributes and also allow systems having different sets of attributes to communicate and share resources.
ContributorsPrabhu Verleker, Ashwin Narayan (Author) / Huang, Dijiang (Thesis advisor) / Ahn, Gail-Joon (Committee member) / Dasgupta, Partha (Committee member) / Arizona State University (Publisher)
Created2014
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Description
The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem

The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem to a transistor-level programmable hardware, is proposed. This approach enables fast system level validation and a reduction in post-Silicon bugs, minimizing design risk and cost. The unique features of the approach include 1) transistor-level programmability that emulates each transistor behavior in an analog design, achieving very fine granularity of reconfiguration; 2) programmable switches that are treated as a design component during analog transistor emulating, and optimized with the reconfiguration matrix; 3) compensation of AC performance degradation through boosting the bias current. Based on these principles, a digitally controlled PANDA platform is designed at 45nm node that can map AMS modules across 22nm to 90nm technology nodes. A systematic emulation approach to map any analog transistor to 45nm PANDA cell is proposed, which achieves transistor level matching accuracy of less than 5% for ID and less than 10% for Rout and Gm. Circuit level analog metrics of a voltage-controlled oscillator (VCO) emulated by PANDA, match to those of the original designs in 22nm and 90nm nodes with less than a 5% error. Several other 90nm and 22nm analog blocks are successfully emulated by the 45nm PANDA platform, including a folded-cascode operational amplifier and a sample-and-hold module (S/H). Further capabilities of PANDA are demonstrated by the first full-chip silicon of PANDA which is implemented on 65nm process This system consists of a 24×25 cell array, reconfigurable interconnect and configuration memory. The voltage and current reference circuits, op amps and a VCO with a phase interpolation circuit are emulated by PANDA.
ContributorsSuh, Jounghyuk (Author) / Bakkaloglu, Bertan (Thesis advisor) / Cao, Yu (Committee member) / Ozev, Sule (Committee member) / Kozicki, Michael (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Security has been one of the top concerns in cloud community while cloud resource abuse and malicious insiders are considered as top threats. Traditionally, Intrusion Detection Systems (IDS) and Intrusion Prevention Systems (IPS) have been widely deployed to manipulate cloud security, with the latter one providing additional prevention capability. However,

Security has been one of the top concerns in cloud community while cloud resource abuse and malicious insiders are considered as top threats. Traditionally, Intrusion Detection Systems (IDS) and Intrusion Prevention Systems (IPS) have been widely deployed to manipulate cloud security, with the latter one providing additional prevention capability. However, as one of the most creative networking technologies, Software-Defined Networking (SDN) is rarely used to implement IDPS in the cloud computing environment because the lack of comprehensive development framework and processing flow. Simply migration from traditional IDS/IPS systems to SDN environment are not effective enough for detecting and defending malicious attacks. Hence, in this thesis, we present an IPS development framework to help user easily design and implement their defensive systems in cloud system by SDN technology. This framework enables SDN approaches to enhance the system security and performance. A Traffic Information Platform (TIP) is proposed as the cornerstone with several upper layer security modules such as Detection, Analysis and Prevention components. Benefiting from the flexible, compatible and programmable features of SDN, Customized Detection Engine, Network Topology Finder, Source Tracer and further user-developed security appliances are plugged in our framework to construct a SDN-based defensive system. Two main categories Python-based APIs are designed to support developers for further development. This system is designed and implemented based on the POX controller and Open vSwitch in the cloud computing environment. The efficiency of this framework is demonstrated by a sample IPS implementation and the performance of our framework is also evaluated.
ContributorsXiong, Zhengyang (Author) / Huang, Dijiang (Thesis advisor) / Xue, Guoliang (Committee member) / Dalvucu, Hasan (Committee member) / Arizona State University (Publisher)
Created2014