This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.

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Description
Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specifications, requiring multiple test set-ups and long test

Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specifications, requiring multiple test set-ups and long test times, which complicates load-board design, debug, and diagnosis. Second, high frequency operation necessitates the use of expensive equipment, resulting in higher per second test time cost compared with mixed-signal or digital circuits. Moreover, in terms of the non-recurring engineering cost, the need to measure complex specfications complicates the test development process and necessitates a long learning process for test engineers. Test time is dominated by changing and settling time for each test set-up. Thus, single set-up test solutions are desirable. Loop-back configuration where the transmitter output is connected to the receiver input are used as the desirable test set- up for RF transceivers, since it eliminates the reliance on expensive instrumentation for RF signal analysis and enables measuring multiple parameters at once. In-phase and Quadrature (IQ) imbalance, non-linearity, DC offset and IQ time skews are some of the most detrimental imperfections in transceiver performance. Measurement of these parameters in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. Loop-back based solutions are proposed in this work to resolve this issue. A calibration algorithm for a subset of the above mentioned impairments is also presented. Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. EVM is analytically related to system impairments, which are typically measured in a production test i environment. Thus, EVM test can be eliminated from the test list if the relations between EVM and system impairments are derived independent of the circuit implementation and manufacturing process. In this work, the focus is on the WLAN standard, and deriving the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems (IQ imbalance, non-linearity, and noise). Having low cost test techniques for measuring the RF transceivers imperfections and being able to analytically compute EVM from the measured parameters is a complete test solution for RF transceivers. These techniques along with the proposed calibration method can be used in improving the yield by widening the pass/fail boundaries for transceivers imperfections. For all of the proposed methods, simulation and hardware measurements prove that the proposed techniques provide accurate characterization of RF transceivers.
ContributorsNassery, Afsaneh (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary

Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary with process and requires calibration to make them reliable. This increases test cost and testing time. This challenge can be overcome by combining electrical stimulus based testing along with statistical analysis on MEMS response for electrical stimulus and also limited physical stimulus response data. This thesis proposes electrical stimulus based built in self test(BIST) which can be used to get MEMS data and later this data can be used for statistical analysis. A capacitive MEMS accelerometer is considered to test this BIST approach. This BIST circuit overhead is less and utilizes most of the standard readout circuit. This thesis discusses accelerometer response for electrical stimulus and BIST architecture. As a part of this BIST circuit, a second order sigma delta modulator has been designed. This modulator has a sampling frequency of 1MHz and bandwidth of 6KHz. SNDR of 60dB is achieved with 1Vpp differential input signal and 3.3V supply
ContributorsKundur, Vinay (Author) / Bakkaloglu, Bertan (Committee member) / Ozev, Sule (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
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Description
As technology enhances our communication capabilities, the number of distributed teams has risen in both public and private sectors. There is no doubt that these technological advancements have addressed a need for communication and collaboration of distributed teams. However, is all technology useful for effective collaboration? Are some methods (modalities)

As technology enhances our communication capabilities, the number of distributed teams has risen in both public and private sectors. There is no doubt that these technological advancements have addressed a need for communication and collaboration of distributed teams. However, is all technology useful for effective collaboration? Are some methods (modalities) of communication more conducive than others to effective performance and collaboration of distributed teams? Although previous literature identifies some differences in modalities, there is little research on geographically distributed mobile teams (DMTs) performing a collaborative task. To investigate communication and performance in this context, I developed the GeoCog system. This system is a mobile communications and collaboration platform enabling small, distributed teams of three to participate in a variant of the military-inspired game, "Capture the Flag". Within the task, teams were given one hour to complete as many "captures" as possible while utilizing resources to the advantage of the team. In this experiment, I manipulated the modality of communication across three conditions with text-based messaging only, vocal communication only, and a combination of the two conditions. It was hypothesized that bi-modal communication would yield superior performance compared to either single modality conditions. Results indicated that performance was not affected by modality. Further results, including communication analysis, are discussed within this paper.
ContributorsChampion, Michael (Author) / Cooke, Nancy J. (Thesis advisor) / Shope, Steven (Committee member) / Wu, Bing (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there

Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there is not a single straightforward solution to the problem. Products that are tested have several application domains and distinct customer profiles. Some products are required to operate for long periods of time while others are required to be low cost and optimized for low cost. Multitude of constraints and goals make it impossible to find a single solution that work for all cases. Hence, test development/optimization is typically design/circuit dependent and even process specific. Therefore, test optimization cannot be performed using a single test approach, but necessitates a diversity of approaches. This works aims at addressing test cost minimization and test quality improvement at various levels. In the first chapter of the work, we investigate pre-silicon strategies, such as design for test and pre-silicon statistical simulation optimization. In the second chapter, we investigate efficient post-silicon test strategies, such as adaptive test, adaptive multi-site test, outlier analysis, and process shift detection/tracking.
ContributorsYilmaz, Ender (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Cao, Yu (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2012
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Description
The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured

The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured using CMOS and the final product is integrated on to a single chip. Amount spent on testing of the MEMS devices make up a considerable share of the total final cost of the device. In order to save the cost and time spent on testing, researchers have been trying to develop different methodologies. At present, MEMS devices are tested using mechanical stimuli to measure the device parameters and for calibration the device. This testing is necessary since the MEMS process is not a very well controlled process unlike CMOS. This is done using an ATE and the cost of using ATE (automatic testing equipment) contribute to 30-40% of the devices final cost. This thesis proposes an architecture which can use an Electrical Signal to stimulate the MEMS device and use the data from the MEMS response in approximating the calibration coefficients efficiently. As a proof of concept, we have designed a BIST (Built-in self-test) circuit for MEMS accelerometer. The BIST has an electrical stimulus generator, Capacitance-to-voltage converter, ∑ ∆ ADC. This thesis explains in detail the design of the Electrical stimulus generator. We have also designed a technique to correlate the parameters obtained from electrical stimuli to those obtained by mechanical stimuli. This method is cost effective since the additional circuitry needed to implement BIST is less since the technique utilizes most of the existing standard readout circuitry already present.
ContributorsJangala Naga, Naveen Sai (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2014
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Description
The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem

The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem to a transistor-level programmable hardware, is proposed. This approach enables fast system level validation and a reduction in post-Silicon bugs, minimizing design risk and cost. The unique features of the approach include 1) transistor-level programmability that emulates each transistor behavior in an analog design, achieving very fine granularity of reconfiguration; 2) programmable switches that are treated as a design component during analog transistor emulating, and optimized with the reconfiguration matrix; 3) compensation of AC performance degradation through boosting the bias current. Based on these principles, a digitally controlled PANDA platform is designed at 45nm node that can map AMS modules across 22nm to 90nm technology nodes. A systematic emulation approach to map any analog transistor to 45nm PANDA cell is proposed, which achieves transistor level matching accuracy of less than 5% for ID and less than 10% for Rout and Gm. Circuit level analog metrics of a voltage-controlled oscillator (VCO) emulated by PANDA, match to those of the original designs in 22nm and 90nm nodes with less than a 5% error. Several other 90nm and 22nm analog blocks are successfully emulated by the 45nm PANDA platform, including a folded-cascode operational amplifier and a sample-and-hold module (S/H). Further capabilities of PANDA are demonstrated by the first full-chip silicon of PANDA which is implemented on 65nm process This system consists of a 24×25 cell array, reconfigurable interconnect and configuration memory. The voltage and current reference circuits, op amps and a VCO with a phase interpolation circuit are emulated by PANDA.
ContributorsSuh, Jounghyuk (Author) / Bakkaloglu, Bertan (Thesis advisor) / Cao, Yu (Committee member) / Ozev, Sule (Committee member) / Kozicki, Michael (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Research on priming has shown that exposure to the concept of fast food can have an effect on human behavior by inducing haste and impatience (Zhong & E. DeVoe, 2010). This research suggests that thinking about fast food makes individuals impatient and strengthens their desire to complete tasks such as

Research on priming has shown that exposure to the concept of fast food can have an effect on human behavior by inducing haste and impatience (Zhong & E. DeVoe, 2010). This research suggests that thinking about fast food makes individuals impatient and strengthens their desire to complete tasks such as reading and decision making as quickly and efficiently as possible. Two experiments were conducted in which the effects of fast food priming were examined using a driving simulator. The experiments examined whether fast food primes can induce impatient driving. In experiment 1, 30 adult drivers drove a course in a driving simulator after being exposed to images by rating aesthetics of four different logos. Experiment 1 did not yield faster driving speeds nor an impatient and faster break at the yellow light in the fast food logo prime condition. In experiment 2, 30 adult drivers drove the same course from experiment 1. Participants did not rate logos on their aesthetics prior to the drive, instead billboards were included in the simulation that had either fast food or diner logos. Experiment 2 did not yielded faster driving speeds, however there was a significant effect of faster breaking and a higher number of participants running the yellow light.
ContributorsTaggart, Mistey. L (Author) / Branaghan, Russell (Thesis advisor) / Cooke, Nancy J. (Committee member) / Song, Hyunjin (Committee member) / Arizona State University (Publisher)
Created2014
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Description
When discussing human factors and performance, researchers recognize stress as a factor, but overlook mood as contributing factor. To explore the relationship between mood, stress and cognitive performance, a field study was conducted involving fire fighters engaged in a fire response simulation. Firefighter participants completed a stress questionnaire, an emotional

When discussing human factors and performance, researchers recognize stress as a factor, but overlook mood as contributing factor. To explore the relationship between mood, stress and cognitive performance, a field study was conducted involving fire fighters engaged in a fire response simulation. Firefighter participants completed a stress questionnaire, an emotional state questionnaire, and a cognitive task. Stress and cognitive task performance scores were examined before and after the firefighting simulation for individual cognitive performance depreciation caused by stress or mood. They study revealed that existing stress was a reliable predictor of the pre-simulation cognitive task score, that, as mood becomes more positive, perceived stress scores decrease, and that negative mood and pre-simulation stress are also positively and significantly correlated.
ContributorsGomez-Herbert, Maria Elena (Author) / Cooke, Nancy J. (Thesis advisor) / Becker, Vaughn (Committee member) / Branaghan, Russell (Committee member) / Hyunjin, Song (Committee member) / Arizona State University (Publisher)
Created2014
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Description
Preoperative team briefings have been suggested to be important for improving team performance in the operating room. Many high risk environments have accepted team briefings; however healthcare has been slower to follow. While applying briefings in the operating room has shown positive benefits including improved communication and perceptions of teamwork,

Preoperative team briefings have been suggested to be important for improving team performance in the operating room. Many high risk environments have accepted team briefings; however healthcare has been slower to follow. While applying briefings in the operating room has shown positive benefits including improved communication and perceptions of teamwork, most research has only focused on feasibility of implementation and not on understanding how the quality of briefings can impact subsequent surgical procedures. Thus, there are no formal protocols or methodologies that have been developed.

The goal of this study was to relate specific characteristics of team briefings back to objective measures of team performance. The study employed cognitive interviews, prospective observations, and principle component regression to characterize and model the relationship between team briefing characteristics and non-routine events (NREs) in gynecological surgery. Interviews were conducted with 13 team members representing each role on the surgical team and data were collected for 24 pre-operative team briefings and 45 subsequent surgical cases. The findings revealed that variations within the team briefing are associated with differences in team-related outcomes, namely NREs, during the subsequent surgical procedures. Synthesis of the data highlighted three important trends which include the need to promote team communication during the briefing, the importance of attendance by all surgical team members, and the value of holding a briefing prior to each surgical procedure. These findings have implications for development of formal briefing protocols.

Pre-operative team briefings are beneficial for team performance in the operating room. Future research will be needed to continue understanding this relationship between how briefings are conducted and team performance to establish more consistent approaches and as well as for the continuing assessment of team briefings and other similar team-related events in the operating room.
ContributorsHildebrand, Emily A (Author) / Branaghan, Russell J (Thesis advisor) / Cooke, Nancy J. (Committee member) / Hallbeck, M. Susan (Committee member) / Bekki, Jennifer M (Committee member) / Blocker, Renaldo C (Committee member) / Arizona State University (Publisher)
Created2014
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Description
The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on

The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on the resolution of microscope scan tool, all these defects are categorized into four groups of defects by both function and location, bias circuit defect, first stage amplifier defect, output stage defect and common mode feedback defect, separately. Each fault result is attributed to one of these four region defects.Therefore, analog testing algorithm and automotive tool could be generated to assist testing engineers to meet the demand of large numbers of chips.
ContributorsLu, Zhijian (Author) / Ozev, Sule (Thesis advisor) / Kiaei, Sayfe (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2014