ETDs

This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.

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Design of an automated validation environment for a radiation hardened MIPS microprocessor

Description
Ever reducing time to market, along with short product lifetimes, has created a need to shorten the microprocessor design time. Verification of the design and its analysis are two major components of this design cycle. Design validation techniques can be broadly classified into two major categories: simulation based approaches and…

Ever reducing time to market, along with short product lifetimes, has created a need to shorten the microprocessor design time. Verification of the design and its analysis are two major components of this design cycle. Design validation techniques can be broadly classified into two major categories: simulation based approaches and formal techniques. Simulation based microprocessor validation involves running millions of cycles using random or pseudo random tests and allows verification of the register transfer level (RTL) model against an architectural model, i.e., that the processor executes instructions as required. The validation effort involves model checking to a high level description or simulation of the design against the RTL implementation. Formal techniques exhaustively analyze parts of the design but, do not verify RTL against the architecture specification. The focus of this work is to implement a fully automated validation environment for a MIPS based radiation hardened microprocessor using simulation based approaches. The basic framework uses the classical validation approach in which the design to be validated is described in a Hardware Definition Language (HDL) such as VHDL or Verilog. To implement a simulation based approach a number of random or pseudo random tests are generated. The output of the HDL based design is compared against the one obtained from a "perfect" model implementing similar functionality, a mismatch in the results would thus indicate a bug in the HDL based design. Effort is made to design the environment in such a manner that it can support validation during different stages of the design cycle. The validation environment includes appropriate changes so as to support architecture changes which are introduced because of radiation hardening. The manner in which the validation environment is build is highly dependent on the specifications of the perfect model used for comparisons. This work implements the validation environment for two MIPS simulators as the reference model. Two bugs have been discovered in the RTL model, using simulation based approaches through the validation environment.
ContributorsSharma, Abhishek (Author) / Clark, Lawrence (Thesis advisor) / Holbert, Keith E. (Committee member) / Shrivastava, Aviral (Committee member) / Arizona State University (Publisher)
Created2011
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Modeling and implementation of threshold logic circuits and architectures

Description
Threshold logic has long been studied as a means of achieving higher performance and lower power dissipation, providing improvements by condensing simple logic gates into more complex primitives, effectively reducing gate count, pipeline depth, and number of interconnects. This work proposes a new physical implementation of threshold logic, the threshold…

Threshold logic has long been studied as a means of achieving higher performance and lower power dissipation, providing improvements by condensing simple logic gates into more complex primitives, effectively reducing gate count, pipeline depth, and number of interconnects. This work proposes a new physical implementation of threshold logic, the threshold logic latch (TLL), which overcomes the difficulties observed in previous work, particularly with respect to gate reliability in the presence of noise and process variations. Simple but effective models were created to assess the delay, power, and noise margin of TLL gates for the purpose of determining the physical parameters and assignment of input signals that achieves the lowest delay subject to constraints on power and reliability. From these models, an optimized library of standard TLL cells was developed to supplement a commercial library of static CMOS gates. The new cells were then demonstrated on a number of automatically synthesized, placed, and routed designs. A two-stage 2's complement integer multiplier designed with CMOS and TLL gates utilized 19.5% less area, 28.0% less active power, and 61.5% less leakage power than an equivalent design with the same performance using only static CMOS gates. Additionally, a two-stage 32-instruction 4-way issue queue designed with CMOS and TLL gates utilized 30.6% less area, 31.0% less active power, and 58.9% less leakage power than an equivalent design with the same performance using only static CMOS gates.
ContributorsLeshner, Samuel (Author) / Vrudhula, Sarma (Thesis advisor) / Chatha, Karamvir (Committee member) / Clark, Lawrence (Committee member) / Shrivastava, Aviral (Committee member) / Arizona State University (Publisher)
Created2010