ETDs

This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.

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The feasibility of domain specific compilation for spatially programmable architectures

Description
Integrated circuits must be energy efficient. This efficiency affects all aspects of chip design, from the battery life of embedded devices to thermal heating on high performance servers. As technology scaling slows, future generations of transistors will lack the energy efficiency gains as it has had in previous generations. Therefore,…

Integrated circuits must be energy efficient. This efficiency affects all aspects of chip design, from the battery life of embedded devices to thermal heating on high performance servers. As technology scaling slows, future generations of transistors will lack the energy efficiency gains as it has had in previous generations. Therefore, other sources of energy efficiency will be much more important. Many computations have the potential to be executed for extreme energy efficiency but are not instigated because the platforms they run on are not optimized for efficient execution. ASICs improve energy efficiency by reducing flexibility and leveraging the properties of a specific computation. However, ASICs are fixed in function and therefore have incredible opportunity cost. FPGAs offer a reconfigurable solution but are 25x less energy efficient than ASIC implementation. Spatially programmable architectures (SPAs) are similar in design and structure to ASICs and FPGAs but are able bridge the ASIC-FPGA energy efficiency gap by trading flexibility for efficiency. However, SPAs are difficult to program because they do not share the same programming model as normal architectures that execute in time. This work addresses compiler challenges for coarse grained, locally interconnected SPA for domain efficiency (SPADE). A novel SPADE topology, called the wave pipeline, is introduced that is designed for the image signal processing domain that is both efficient and simple to compile to. A compiler for the wave pipeline is created that solves for maximum energy and area efficiency using low complexity, greedy methods. The wave pipeline topology and compiler allow for us to investigate and experiment with image signal processing applications to prove the feasibility of SPADE compilers.
ContributorsMackay, Curtis (Author) / Brunhaver, John (Thesis advisor) / Karam, Lina J (Committee member) / Seo, Jae-Sun (Committee member) / Arizona State University (Publisher)
Created2016
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6T-SRAM 1Mb design with test structures and post silicon validation

Description
Static random-access memories (SRAM) are integral part of design systems as caches and data memories that and occupy one-third of design space. The work presents an embedded low power SRAM on a triple well process that allows body-biasing control. In addition to the normal mode operation, the design is embedded…

Static random-access memories (SRAM) are integral part of design systems as caches and data memories that and occupy one-third of design space. The work presents an embedded low power SRAM on a triple well process that allows body-biasing control. In addition to the normal mode operation, the design is embedded with Physical Unclonable Function (PUF) [Suh07] and Sense Amplifier Test (SA Test) mode. With PUF mode structures, the fabrication and environmental mismatches in bit cells are used to generate unique identification bits. These bits are fixed and known as preferred state of an SRAM bit cell. The direct access test structure is a measurement unit for offset voltage analysis of sense amplifiers. These designs are manufactured using a foundry bulk CMOS 55 nm low-power (LP) process. The details about SRAM bit-cell and peripheral circuit design is discussed in detail, for certain cases the circuit simulation analysis is performed with random variations embedded in SPICE models. Further, post-silicon testing results are discussed for normal operation of SRAMs and the special test modes. The silicon and circuit simulation results for various tests are presented.
ContributorsDosi, Ankita (Author) / Clark, Lawrence (Thesis advisor) / Seo, Jae-Sun (Committee member) / Brunhaver, John (Committee member) / Arizona State University (Publisher)
Created2017