ASU Electronic Theses and Dissertations
This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.
In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.
Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.
Displaying 1 - 7 of 7
Filtering by
- Creators: Ogras, Umit Y.
Description
Power Management circuits are employed in almost all electronic equipment and they have energy storage elements (capacitors and inductors) as building blocks along with other active circuitry. Power management circuits employ feedback to achieve good load and line regulation. The feedback loop is designed at an operating point and component values are chosen to meet that design requirements. But the capacitors and inductors are subject to variations due to temperature, aging and load stress. Due to these variations, the feedback loop can cross its robustness margins and can lead to degraded performance and potential instability. Another issue in power management circuits is the measurement of their frequency response for stability assessment. The standard techniques used in production test environment require expensive measurement equipment (Network Analyzer) and time. These two issues of component variations and frequency response measurement can be addressed if the frequency response of the power converter is used as measure of component (capacitor and inductor) variations. So, a single solution of frequency response measurement solves both the issues. This work examines system identification (frequency response measurement) of power management circuits based on cross correlation technique and proposes the use of switched capacitor correlator for this purpose. A switched capacitor correlator has been designed and used in the system identification of Linear and Switching regulators. The obtained results are compared with the standard frequency response measurement methods of power converters.
ContributorsMalladi, Venkata Naga Koushik (Author) / Bakkaloglu, Bertan (Thesis advisor) / Kitchen, Jennifer (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
Description
Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary and ensure proper operation. Therefore low-overhead built-in Self-Test (BIST) solution for advanced RF transceiver is proposed. In this dissertation. Firstly, comprehensive BIST solution for RF polar transceivers using on-chip resources is presented. In the receiver, phase and gain mismatches degrade sensitivity and error vector magnitude (EVM). In the transmitter, delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to violation of spectral mask requirements. Characterization and calibration of these parameters with analytical model would reduce the test time and cost considerably. Hence, a technique to measure and calibrate impairments of the polar transceiver in the loop-back mode is proposed.
Secondly, robust amplitude measurement technique for RF BIST application and BIST circuits for loop-back connection are discussed. Test techniques using analytical model are explained and BIST circuits are introduced.
Next, a self-compensating built-in self-test solution for RF Phased Array Mismatch is proposed. In the proposed method, a sinusoidal test signal with unknown amplitude is applied to the inputs of two adjacent phased array elements and measure the baseband output signal after down-conversion. Mathematical modeling of the circuit impairments and phased array behavior indicates that by using two distinct input amplitudes, both of which can remain unknown, it is possible to measure the important parameters of the phased array, such as gain and phase mismatch. In addition, proposed BIST system is designed and fabricated using IBM 180nm process and a prototype four-element phased-array PCB is also designed and fabricated for verifying the proposed method.
Finally, process independent gain measurement via BIST/DUT co-design is explained. Design methodology how to reduce performance impact significantly is discussed.
Simulation and hardware measurements results for the proposed techniques show that the proposed technique can characterize the targeted impairments accurately.
Secondly, robust amplitude measurement technique for RF BIST application and BIST circuits for loop-back connection are discussed. Test techniques using analytical model are explained and BIST circuits are introduced.
Next, a self-compensating built-in self-test solution for RF Phased Array Mismatch is proposed. In the proposed method, a sinusoidal test signal with unknown amplitude is applied to the inputs of two adjacent phased array elements and measure the baseband output signal after down-conversion. Mathematical modeling of the circuit impairments and phased array behavior indicates that by using two distinct input amplitudes, both of which can remain unknown, it is possible to measure the important parameters of the phased array, such as gain and phase mismatch. In addition, proposed BIST system is designed and fabricated using IBM 180nm process and a prototype four-element phased-array PCB is also designed and fabricated for verifying the proposed method.
Finally, process independent gain measurement via BIST/DUT co-design is explained. Design methodology how to reduce performance impact significantly is discussed.
Simulation and hardware measurements results for the proposed techniques show that the proposed technique can characterize the targeted impairments accurately.
ContributorsJeong, Jae Woong (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Cao, Yu (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
Description
Performance failure due to aging is an increasing concern for RF circuits. While most aging studies are focused on the concept of mean-time-to-failure, for analog circuits, aging results in continuous degradation in performance before it causes catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as the point where at least one specification fails, is not just determined by aging at the device level, but also by the slack in the specifications, process variations, and the stress conditions on the devices. In this dissertation, firstly, a methodology for analyzing the performance degradation of RF circuits caused by aging mechanisms in MOSFET devices at design-time (pre-silicon) is presented. An algorithm to determine reliability hotspots in the circuit is proposed and design-time optimization methods to enhance the lifetime by making the most likely to fail circuit components more reliable is performed. RF circuits are used as test cases to demonstrate that the lifetime can be enhanced using the proposed design-time technique with low area and no performance impact. Secondly, in-field monitoring and recovering technique for the performance of aged RF circuits is discussed. The proposed in-field technique is based on two phases: During the design time, degradation profiles of the aged circuit are obtained through simulations. From these profiles, hotspot identification of aged RF circuits are conducted and the circuit variable that is easy to measure but highly correlated to the performance of the primary circuit is determined for a monitoring purpose. After deployment, an on-chip DC monitor is periodically activated and its results are used to monitor, and if necessary, recover the circuit performances degraded by aging mechanisms. It is also necessary to co-design the monitoring and recovery mechanism along with the primary circuit for minimal performance impact. A low noise amplifier (LNA) and LC-tank oscillators are fabricated for case studies to demonstrate that the lifetime can be enhanced using the proposed monitoring and recovery techniques in the field. Experimental results with fabricated LNA/oscillator chips show the performance degradation from the accelerated stress conditions and this loss can be recovered by the proposed mitigation scheme.
ContributorsChang, Doo Hwang (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kitchen, Jennifer (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2017
Description
This dissertation proposes and presents two different passive sigma-delta
modulator zoom Analog to Digital Converter (ADC) architectures. The first ADC is fullydifferential, synthesizable zoom-ADC architecture with a passive loop filter for lowfrequency Built in Self-Test (BIST) applications. The detailed ADC architecture and a step
by step process designing the zoom-ADC along with a synthesis tool that can target various
design specifications are presented. The design flow does not rely on extensive knowledge
of an experienced ADC designer. Two example set of BIST ADCs have been synthesized
with different performance requirements in 65nm CMOS process. The first ADC achieves
90.4dB Signal to Noise Ratio (SNR) in 512µs measurement time and consumes 17µW
power. Another example achieves 78.2dB SNR in 31.25µs measurement time and
consumes 63µW power. The second ADC architecture is a multi-mode, dynamically
zooming passive sigma-delta modulator. The architecture is based on a 5b interpolating
flash ADC as the zooming unit, and a passive discrete time sigma delta modulator as the
fine conversion unit. The proposed ADC provides an Oversampling Ratio (OSR)-
independent, dynamic zooming technique, employing an interpolating zooming front-end.
The modulator covers between 0.1 MHz and 10 MHz signal bandwidth which makes it
suitable for cellular applications including 4G radio systems. By reconfiguring the OSR,
bias current, and component parameters, optimal power consumption can be achieved for
every mode. The ADC is implemented in 0.13 µm CMOS technology and it achieves an
SNDR of 82.2/77.1/74.2/68 dB for 0.1/1.92/5/10MHz bandwidth with 1.3/5.7/9.6/11.9mW
power consumption from a 1.2 V supply.
modulator zoom Analog to Digital Converter (ADC) architectures. The first ADC is fullydifferential, synthesizable zoom-ADC architecture with a passive loop filter for lowfrequency Built in Self-Test (BIST) applications. The detailed ADC architecture and a step
by step process designing the zoom-ADC along with a synthesis tool that can target various
design specifications are presented. The design flow does not rely on extensive knowledge
of an experienced ADC designer. Two example set of BIST ADCs have been synthesized
with different performance requirements in 65nm CMOS process. The first ADC achieves
90.4dB Signal to Noise Ratio (SNR) in 512µs measurement time and consumes 17µW
power. Another example achieves 78.2dB SNR in 31.25µs measurement time and
consumes 63µW power. The second ADC architecture is a multi-mode, dynamically
zooming passive sigma-delta modulator. The architecture is based on a 5b interpolating
flash ADC as the zooming unit, and a passive discrete time sigma delta modulator as the
fine conversion unit. The proposed ADC provides an Oversampling Ratio (OSR)-
independent, dynamic zooming technique, employing an interpolating zooming front-end.
The modulator covers between 0.1 MHz and 10 MHz signal bandwidth which makes it
suitable for cellular applications including 4G radio systems. By reconfiguring the OSR,
bias current, and component parameters, optimal power consumption can be achieved for
every mode. The ADC is implemented in 0.13 µm CMOS technology and it achieves an
SNDR of 82.2/77.1/74.2/68 dB for 0.1/1.92/5/10MHz bandwidth with 1.3/5.7/9.6/11.9mW
power consumption from a 1.2 V supply.
ContributorsEROL, OSMAN EMIR (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Ogras, Umit Y. (Committee member) / Blain-Christen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2018
Description
In this work, a 12-bit ADC with three types of calibration is proposed for high speed security applications as well as a precision application. This converter performs for both applications because it satisfies all the necessary specifications such as minimal device mismatch and offset, programmability to decrease aging effects, high SNR for increased ENOB and fast conversion rate. The designed converter implements three types of calibration necessary for offset and gain error, including: a correlated double sampling integrator used in the first stage of the ADC, a power up auto zero technique implemented in the digital code to store any offset and subtract out if necessary, and an automatic startup and manual calibration to control the common mode voltages. The proposed ADC was designed in Intel’s 10nm technology. This ADC is designed to monitor DC voltages for the precision and high speed applications. The conversion rate of the analog to digital converter is programmable to 7µs or 910ns, depending on the precision or high speed application, respectively. The range of the input and reference supply is 0 to 1.25V. The ADC is designed in Intel 10nm technology using a 1.8V supply consuming an area of 0.0705mm2. This thesis explores challenges of designing a dual-purpose analog to digital converter, which include: 1.) increased offset in 10nm technology, 2.) dual application ADC that can be accurate and fast, 3.) reducing the parasitic capacitance of the ADC, and 4.) gain error that occurs in ADCs.
ContributorsSchmelter, Brooke (Author) / Bakkaloglu, Bertan (Thesis advisor) / Ogras, Umit Y. (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2017
Description
Power management circuits have been more and more widely used in various applications, while providing fully integrated voltage regulation remains a challenging topic. Switched-capacitor (SC) voltage converters have received attentions in integrated power conversion for fixed-ratio voltage conversions with good efficiency and feasibility of integration. During my PhD study, an on-chip current sensing technique is proposed to dynamically modulate both switching frequency and switch widths of SC voltage converters, enhancing fast transient response and higher efficiency across a wide range of load currents. In conjunction with SC converters, a low-dropout regulator (LDO) is implemented which is driven by a push-pull operational transconductance amplifier (OTA), whose current is mirrored and sensed with minimal power and efficiency overhead. The sensed load current directly controls the frequency and width of SC converters through a voltage-controlled oscillator (VCO) and a time-to-digital converter, respectively.
Theoretical analysis and optimization for SC DC-DC converters have been presented in prior works, however optimization of different capacitors, namely flying and input/output decoupling capacitors, in SC voltage regulators (SCVRs) under an area constraint has not been addressed. A methodology to optimize flying and decoupling capacitance for area-constrained on-chip SCVRs to achieve the highest system-level power efficiency. Considering both conversion efficiency and droop voltage against fast load transients, the proposed model determines the optimal ratio between flying and decoupling.
Based on the previous design, a fully integrated switched-capacitor voltage regulator with voltage comparison and on-chip lossless current sensing control is proposed. Based on the voltage comparison result and sensed current as the load current changes, the frequency of the SC converters are modulated for optimal efficiency. The voltage regulator targets 2.1V input voltage and 0.9V output voltage, which offers higher-voltage power transfer across chip package. A 17-phase interleaved structure is used to reduce output voltage ripple.
In 65nm CMOS, the regulator is implemented with MIM-capacitor, targeting 2.1V input voltage and 0.9V output voltage. According to the measurement results, the proposed SC voltage regulator achieves 69.6% peak efficiency at 60mA load current, which corresponds to a 4.2mW/mm2 power-area density and 12.5mW
F power-capacitance density. The efficiency across 20mA to 92mA regulator load current range is above 62%. The steady-state output voltage ripple across 22x load current range of 3.5mA-76mA is between 50mV to 60mV.
Theoretical analysis and optimization for SC DC-DC converters have been presented in prior works, however optimization of different capacitors, namely flying and input/output decoupling capacitors, in SC voltage regulators (SCVRs) under an area constraint has not been addressed. A methodology to optimize flying and decoupling capacitance for area-constrained on-chip SCVRs to achieve the highest system-level power efficiency. Considering both conversion efficiency and droop voltage against fast load transients, the proposed model determines the optimal ratio between flying and decoupling.
Based on the previous design, a fully integrated switched-capacitor voltage regulator with voltage comparison and on-chip lossless current sensing control is proposed. Based on the voltage comparison result and sensed current as the load current changes, the frequency of the SC converters are modulated for optimal efficiency. The voltage regulator targets 2.1V input voltage and 0.9V output voltage, which offers higher-voltage power transfer across chip package. A 17-phase interleaved structure is used to reduce output voltage ripple.
In 65nm CMOS, the regulator is implemented with MIM-capacitor, targeting 2.1V input voltage and 0.9V output voltage. According to the measurement results, the proposed SC voltage regulator achieves 69.6% peak efficiency at 60mA load current, which corresponds to a 4.2mW/mm2 power-area density and 12.5mW
F power-capacitance density. The efficiency across 20mA to 92mA regulator load current range is above 62%. The steady-state output voltage ripple across 22x load current range of 3.5mA-76mA is between 50mV to 60mV.
ContributorsMi, Xiaoyang (Author) / Seo, Jae-Sun (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Ogras, Umit Y. (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2020
Description
The manufacturing process for electronic systems involves many players, from chip/board design and fabrication to firmware design and installation.
In today's global supply chain, any of these steps are prone to interference from rogue players, creating a security risk.
Manufactured devices need to be verified to perform only their intended operations since it is not economically feasible to control the supply chain and use only trusted facilities.
It is becoming increasingly necessary to trust but verify the received devices both at production and in the field.
Unauthorized hardware or firmware modifications, known as Trojans,
can steal information, drain the battery, or damage battery-driven embedded systems and lightweight Internet of Things (IoT) devices.
Since Trojans may be triggered in the field at an unknown instance,
it is essential to detect their presence at run-time.
However, it isn't easy to run sophisticated detection algorithms on these devices
due to limited computational power and energy, and in some cases, lack of accessibility.
Since finding a trusted sample is infeasible in general, the proposed technique is based on self-referencing to remove any effect of environmental or device-to-device variations in the frequency domain.
In particular, the self-referencing is achieved by exploiting the band-limited nature of Trojan activity using signal detection theory.
When the device enters the test mode, a predefined test application is run on the device
repetitively for a known period. The periodicity ensures that the spectral electromagnetic power of the test application concentrates at known frequencies, leaving the remaining frequencies within the operating bandwidth at the noise level. Any deviations from the noise level for these unoccupied frequency locations indicate the presence of unknown (unauthorized) activity. Hence, the malicious activity can differentiate without using a golden reference or any knowledge of the Trojan activity attributes.
The proposed technique's effectiveness is demonstrated through experiments with collecting and processing side-channel signals, such as involuntarily electromagnetic emissions and power consumption, of a wearable electronics prototype and commercial system-on-chip under a variety of practical scenarios.
In today's global supply chain, any of these steps are prone to interference from rogue players, creating a security risk.
Manufactured devices need to be verified to perform only their intended operations since it is not economically feasible to control the supply chain and use only trusted facilities.
It is becoming increasingly necessary to trust but verify the received devices both at production and in the field.
Unauthorized hardware or firmware modifications, known as Trojans,
can steal information, drain the battery, or damage battery-driven embedded systems and lightweight Internet of Things (IoT) devices.
Since Trojans may be triggered in the field at an unknown instance,
it is essential to detect their presence at run-time.
However, it isn't easy to run sophisticated detection algorithms on these devices
due to limited computational power and energy, and in some cases, lack of accessibility.
Since finding a trusted sample is infeasible in general, the proposed technique is based on self-referencing to remove any effect of environmental or device-to-device variations in the frequency domain.
In particular, the self-referencing is achieved by exploiting the band-limited nature of Trojan activity using signal detection theory.
When the device enters the test mode, a predefined test application is run on the device
repetitively for a known period. The periodicity ensures that the spectral electromagnetic power of the test application concentrates at known frequencies, leaving the remaining frequencies within the operating bandwidth at the noise level. Any deviations from the noise level for these unoccupied frequency locations indicate the presence of unknown (unauthorized) activity. Hence, the malicious activity can differentiate without using a golden reference or any knowledge of the Trojan activity attributes.
The proposed technique's effectiveness is demonstrated through experiments with collecting and processing side-channel signals, such as involuntarily electromagnetic emissions and power consumption, of a wearable electronics prototype and commercial system-on-chip under a variety of practical scenarios.
ContributorsKarabacak, Fatih (Author) / Ozev, Sule (Thesis advisor) / Ogras, Umit Y. (Thesis advisor) / Christen, Jennifer Blain (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2020