This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.

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Description
Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specifications, requiring multiple test set-ups and long test

Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specifications, requiring multiple test set-ups and long test times, which complicates load-board design, debug, and diagnosis. Second, high frequency operation necessitates the use of expensive equipment, resulting in higher per second test time cost compared with mixed-signal or digital circuits. Moreover, in terms of the non-recurring engineering cost, the need to measure complex specfications complicates the test development process and necessitates a long learning process for test engineers. Test time is dominated by changing and settling time for each test set-up. Thus, single set-up test solutions are desirable. Loop-back configuration where the transmitter output is connected to the receiver input are used as the desirable test set- up for RF transceivers, since it eliminates the reliance on expensive instrumentation for RF signal analysis and enables measuring multiple parameters at once. In-phase and Quadrature (IQ) imbalance, non-linearity, DC offset and IQ time skews are some of the most detrimental imperfections in transceiver performance. Measurement of these parameters in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. Loop-back based solutions are proposed in this work to resolve this issue. A calibration algorithm for a subset of the above mentioned impairments is also presented. Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. EVM is analytically related to system impairments, which are typically measured in a production test i environment. Thus, EVM test can be eliminated from the test list if the relations between EVM and system impairments are derived independent of the circuit implementation and manufacturing process. In this work, the focus is on the WLAN standard, and deriving the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems (IQ imbalance, non-linearity, and noise). Having low cost test techniques for measuring the RF transceivers imperfections and being able to analytically compute EVM from the measured parameters is a complete test solution for RF transceivers. These techniques along with the proposed calibration method can be used in improving the yield by widening the pass/fail boundaries for transceivers imperfections. For all of the proposed methods, simulation and hardware measurements prove that the proposed techniques provide accurate characterization of RF transceivers.
ContributorsNassery, Afsaneh (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2013
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Description
This study is about Thai English (ThaiE), a variety of World Englishes that is presently spoken in Thailand, as the result of the spread of English and the recent Thai government policies towards English communication in Thailand. In the study, I examined the linguistic data of spoken ThaiE, collected from

This study is about Thai English (ThaiE), a variety of World Englishes that is presently spoken in Thailand, as the result of the spread of English and the recent Thai government policies towards English communication in Thailand. In the study, I examined the linguistic data of spoken ThaiE, collected from multiple sources both in the U.S.A. and Thailand. The study made use of a qualitative approach in examining the data, which were from (i) English interviews and questionnaires with 12 highly educated Thai speakers of English during my fieldwork in the Southwestern U.S.A., Central Thailand, and Northeastern Thailand, (ii) English speech samples from the media in Thailand, i.e. television programs, a news report, and a talk radio program, and (iii) the research articles on English used by Thai speakers of English. This study describes the typology of ThaiE in terms of its morpho-syntax, phonology, and sociolinguistics, with the main focus being placed on the structural characteristics of ThaiE. Based on the data, the results show that some of the ThaiE features are similar to the World Englishes features, but some are unique to ThaiE. Therefore, I argue that ThaiE is structurally considered a new variety of World Englishes at the present time. The findings also showed an interesting result, regarding the notion of ThaiE by the fieldwork interview participants. The majority of these participants (n=6) denied the existence of ThaiE, while the minority of the participants (n=5) believed ThaiE existed, and one participant was reluctant to give the answer. The study suggested that the participants' academic backgrounds, the unfamiliar notion of ThaiE, and the level of the participants' social interaction with everyday persons may have influenced their answers to the main research question.
ContributorsRogers, Uthairat (Author) / Gelderen, Elly van (Thesis advisor) / Mailhammer, Robert (Committee member) / Adams, Karen (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Despite the vast research on language carried out by the generative linguistics of Noam Chomsky and his followers since the 1950s, for theoretical reasons (mainly their attention to the mental abstraction of language structure rather than language as a performed product), historical linguistics from the start lay outside their research

Despite the vast research on language carried out by the generative linguistics of Noam Chomsky and his followers since the 1950s, for theoretical reasons (mainly their attention to the mental abstraction of language structure rather than language as a performed product), historical linguistics from the start lay outside their research interest. This study is an attempt to bridge the gap between the formalism and theoretical constructs introduced by generative grammar, whose ultimate goal is to provide not only a description but also an explanation to linguistic phenomena, and historical linguistics, which studies the evolution of language over time. This main objective is met by providing a formal account of the changes hwæðer undergoes throughout the Old English (OE) period. This seemingly inconspicuous word presents itself as a case of particular investigative interest in that it reflects the different stages proclaimed by the theoretical assumptions implemented in the study, namely the economy principles responsible for what has become known as the CP cycle: the Head Preference Principle and the Late Merge Principle, whereby pronominal hwæðer would raise to the specifier position for topicalization purposes, then after frequent use in that position, it would be base-generated there under Late Merge, until later reanalysis as the head of the Complementizer Phrase (CP) under Head Preference. Thus, I set out to classify the diverse functions of OE hwæðer by identifying and analyzing all instances as recorded in the diachronic part of the Helsinki Corpus. Both quantitative and qualitative analyses of the data have rendered the following results: 1) a fully satisfactory functional and chronological classification has been obtained by analyzing the data under investigation following a formal theoretical approach; and 2) a step-by-step historical analysis proves to be indispensable for understanding how language works at the abstract level from a historical point of view. This project is part of a growing body of research on language change which attempts to describe and explain the evolution of certain words as these change in form and function.
ContributorsParra-Guinaldo, Víctor (Author) / Gelderen, Elly van (Thesis advisor) / Bjork, Robert (Committee member) / Nilsen, Don L. F. (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary

Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary with process and requires calibration to make them reliable. This increases test cost and testing time. This challenge can be overcome by combining electrical stimulus based testing along with statistical analysis on MEMS response for electrical stimulus and also limited physical stimulus response data. This thesis proposes electrical stimulus based built in self test(BIST) which can be used to get MEMS data and later this data can be used for statistical analysis. A capacitive MEMS accelerometer is considered to test this BIST approach. This BIST circuit overhead is less and utilizes most of the standard readout circuit. This thesis discusses accelerometer response for electrical stimulus and BIST architecture. As a part of this BIST circuit, a second order sigma delta modulator has been designed. This modulator has a sampling frequency of 1MHz and bandwidth of 6KHz. SNDR of 60dB is achieved with 1Vpp differential input signal and 3.3V supply
ContributorsKundur, Vinay (Author) / Bakkaloglu, Bertan (Committee member) / Ozev, Sule (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Linguistic subjectivity and subjectification are fields of research that are relatively new to those working in English linguistics. After a discussion of linguistic subjectivity and subjectification as they relate to English, I investigate the subjectification of a specific English adjective, and how its usage has changed over time. Subjectivity is

Linguistic subjectivity and subjectification are fields of research that are relatively new to those working in English linguistics. After a discussion of linguistic subjectivity and subjectification as they relate to English, I investigate the subjectification of a specific English adjective, and how its usage has changed over time. Subjectivity is held by many linguists of today to be the major governing factor behind the ordering of English prenominal adjectives. Through the use of a questionnaire, I investigate the effect of subjectivity on English prenominal adjective order from the perspective of the native English speaker. I then discuss the results of the questionnaire, what they mean in relation to how subjectivity affects that order, and a few of the patterns that emerged as I analyzed the data.
ContributorsSkarstedt, Luke (Author) / Gelderen, Elly van (Thesis advisor) / Bjork, Robert (Committee member) / Adams, Karen (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there

Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there is not a single straightforward solution to the problem. Products that are tested have several application domains and distinct customer profiles. Some products are required to operate for long periods of time while others are required to be low cost and optimized for low cost. Multitude of constraints and goals make it impossible to find a single solution that work for all cases. Hence, test development/optimization is typically design/circuit dependent and even process specific. Therefore, test optimization cannot be performed using a single test approach, but necessitates a diversity of approaches. This works aims at addressing test cost minimization and test quality improvement at various levels. In the first chapter of the work, we investigate pre-silicon strategies, such as design for test and pre-silicon statistical simulation optimization. In the second chapter, we investigate efficient post-silicon test strategies, such as adaptive test, adaptive multi-site test, outlier analysis, and process shift detection/tracking.
ContributorsYilmaz, Ender (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Cao, Yu (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2012
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Description
The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured

The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured using CMOS and the final product is integrated on to a single chip. Amount spent on testing of the MEMS devices make up a considerable share of the total final cost of the device. In order to save the cost and time spent on testing, researchers have been trying to develop different methodologies. At present, MEMS devices are tested using mechanical stimuli to measure the device parameters and for calibration the device. This testing is necessary since the MEMS process is not a very well controlled process unlike CMOS. This is done using an ATE and the cost of using ATE (automatic testing equipment) contribute to 30-40% of the devices final cost. This thesis proposes an architecture which can use an Electrical Signal to stimulate the MEMS device and use the data from the MEMS response in approximating the calibration coefficients efficiently. As a proof of concept, we have designed a BIST (Built-in self-test) circuit for MEMS accelerometer. The BIST has an electrical stimulus generator, Capacitance-to-voltage converter, ∑ ∆ ADC. This thesis explains in detail the design of the Electrical stimulus generator. We have also designed a technique to correlate the parameters obtained from electrical stimuli to those obtained by mechanical stimuli. This method is cost effective since the additional circuitry needed to implement BIST is less since the technique utilizes most of the existing standard readout circuitry already present.
ContributorsJangala Naga, Naveen Sai (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2014
Description
The speech of non-native (L2) speakers of a language contains phonological rules that differentiate them from native speakers. These phonological rules characterize or distinguish accents in an L2. The Shibboleth program creates combinatorial rule-sets to describe the phonological pattern of these accents and classifies L2 speakers into their native language.

The speech of non-native (L2) speakers of a language contains phonological rules that differentiate them from native speakers. These phonological rules characterize or distinguish accents in an L2. The Shibboleth program creates combinatorial rule-sets to describe the phonological pattern of these accents and classifies L2 speakers into their native language. The training and classification is done in Shibboleth by support vector machines using a Gaussian radial basis kernel. In one experiment run using Shibboleth, the program correctly identified the native language (L1) of a speaker of unknown origin 42% of the time when there were six possible L1s in which to classify the speaker. This rate is significantly better than the 17% chance classification rate. Chi-squared test (1, N=24) =10.800, p=.0010 In a second experiment, Shibboleth was not able to determine the native language family of a speaker of unknown origin at a rate better than chance (33-44%) when the L1 was not in the transcripts used for training the language family rule-set. Chi-squared test (1, N=18) =1.000, p=.3173 The 318 participants for both experiments were from the Speech Accent Archive (Weinberger, 2013), and ranged in age from 17 to 80 years old. Forty percent of the speakers were female and 60% were male. The factor that most influenced correct classification was higher age of onset for the L2. A higher number of years spent living in an English-speaking country did not have the expected positive effect on classification.
ContributorsFrost, Wende (Author) / Gelderen, Elly van (Thesis advisor) / Perzanowski, Dennis (Committee member) / Gee, Elisabeth (Committee member) / Arizona State University (Publisher)
Created2013
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Description
The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem

The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem to a transistor-level programmable hardware, is proposed. This approach enables fast system level validation and a reduction in post-Silicon bugs, minimizing design risk and cost. The unique features of the approach include 1) transistor-level programmability that emulates each transistor behavior in an analog design, achieving very fine granularity of reconfiguration; 2) programmable switches that are treated as a design component during analog transistor emulating, and optimized with the reconfiguration matrix; 3) compensation of AC performance degradation through boosting the bias current. Based on these principles, a digitally controlled PANDA platform is designed at 45nm node that can map AMS modules across 22nm to 90nm technology nodes. A systematic emulation approach to map any analog transistor to 45nm PANDA cell is proposed, which achieves transistor level matching accuracy of less than 5% for ID and less than 10% for Rout and Gm. Circuit level analog metrics of a voltage-controlled oscillator (VCO) emulated by PANDA, match to those of the original designs in 22nm and 90nm nodes with less than a 5% error. Several other 90nm and 22nm analog blocks are successfully emulated by the 45nm PANDA platform, including a folded-cascode operational amplifier and a sample-and-hold module (S/H). Further capabilities of PANDA are demonstrated by the first full-chip silicon of PANDA which is implemented on 65nm process This system consists of a 24×25 cell array, reconfigurable interconnect and configuration memory. The voltage and current reference circuits, op amps and a VCO with a phase interpolation circuit are emulated by PANDA.
ContributorsSuh, Jounghyuk (Author) / Bakkaloglu, Bertan (Thesis advisor) / Cao, Yu (Committee member) / Ozev, Sule (Committee member) / Kozicki, Michael (Committee member) / Arizona State University (Publisher)
Created2013
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Description
ABSTRACT There are many parts of speech and morphological items in a linguistic lexicon that may be optional in order to have a cohesive language with a complete range of expression. Negation is not one of them. Negation appears to be absolutely essential from a linguistic (and indeed, a psychological)

ABSTRACT There are many parts of speech and morphological items in a linguistic lexicon that may be optional in order to have a cohesive language with a complete range of expression. Negation is not one of them. Negation appears to be absolutely essential from a linguistic (and indeed, a psychological) point of view within any human language. Humans need to be able to say in some fashion "No" and to express our not doing things in various ways. During the discussions that appear in this thesis, I expound upon the historical changes that can be seen within three different language branches - North Germanic (with Gothic, Old Saxon, Old Norse, Swedish, and Icelandic), West Germanic (with English), and Celtic (with Welsh) - focusing on negation particles in particular and their position within these languages. I also examine how each of these chosen languages has seen negation shift over time in relation to Jespersen's negation cycle. Finally, I compare and contrast the results I see from these languages, demonstrating that they all three do follow a distinct negation cycle. I also explain how these three negation cycles are chronologically not in sync with one another and obviously all changed at different rates. This appears to be the case even within the different branches of the Germanic family.
ContributorsLoewenhagen, Angela C (Author) / Gelderen, Elly van (Committee member) / Bjork, Robert (Committee member) / Gillon, Carrie (Committee member) / Arizona State University (Publisher)
Created2014