ASU Electronic Theses and Dissertations
This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.
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- Creators: Sugar, Thomas
When parts are assembled together, feature level manufacturing variations accumulate (stack up) to cause variations in one or more critical dimensions, e.g. one or more clearances. When the T-Maps model is applied to complex assemblies it is possible to obtain as many as six dimensional stack up relation, instead of the one or two typical of 1D or 2D charts. The sensitivity of the critical assembly dimension to the manufacturing variations at each feature can be evaluated by fitting a functional T-Map over a kinematically transformed T-Map of the feature. By considering individual features and the tolerance specifications, one by one, the sensitivity of each tolerance on variations of a critical assembly level dimension can be evaluated. The sum of products of tolerance values and respective sensitivities gives value of worst case functional variation. The same sensitivity equation can be used for statistical tolerance analysis by fitting a Gaussian normal distribution function to each tolerance range and forming an equation of variances from all the contributors. The method for evaluating sensitivities and variances for each contributing feature is explained with engineering examples.
The overall objective of this research is to develop method for automation friendly and efficient T-Map generation and statistical tolerance analysis.