This collection includes most of the ASU Theses and Dissertations from 2011 to present. ASU Theses and Dissertations are available in downloadable PDF format; however, a small percentage of items are under embargo. Information about the dissertations/theses includes degree information, committee members, an abstract, supporting data or media.

In addition to the electronic theses found in the ASU Digital Repository, ASU Theses and Dissertations can be found in the ASU Library Catalog.

Dissertations and Theses granted by Arizona State University are archived and made available through a joint effort of the ASU Graduate College and the ASU Libraries. For more information or questions about this collection contact or visit the Digital Repository ETD Library Guide or contact the ASU Graduate College at gradformat@asu.edu.

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Description
Scaling of the classical planar MOSFET below 20 nm gate length is facing not only technological difficulties but also limitations imposed by short channel effects, gate and junction leakage current due to quantum tunneling, high body doping induced threshold voltage variation, and carrier mobility degradation. Non-classical multiple-gate structures such as

Scaling of the classical planar MOSFET below 20 nm gate length is facing not only technological difficulties but also limitations imposed by short channel effects, gate and junction leakage current due to quantum tunneling, high body doping induced threshold voltage variation, and carrier mobility degradation. Non-classical multiple-gate structures such as double-gate (DG) FinFETs and surrounding gate field-effect-transistors (SGFETs) have good electrostatic integrity and are an alternative to planar MOSFETs for below 20 nm technology nodes. Circuit design with these devices need compact models for SPICE simulation. In this work physics based compact models for the common-gate symmetric DG-FinFET, independent-gate asymmetric DG-FinFET, and SGFET are developed. Despite the complex device structure and boundary conditions for the Poisson-Boltzmann equation, the core structure of the DG-FinFET and SGFET models, are maintained similar to the surface potential based compact models for planar MOSFETs such as SP and PSP. TCAD simulations show differences between the transient behavior and the capacitance-voltage characteristics of bulk and SOI FinFETs if the gate-voltage swing includes the accumulation region. This effect can be captured by a compact model of FinFETs only if it includes the contribution of both types of carriers in the Poisson-Boltzmann equation. An accurate implicit input voltage equation valid in all regions of operation is proposed for common-gate symmetric DG-FinFETs with intrinsic or lightly doped bodies. A closed-form algorithm is developed for solving the new input voltage equation including ambipolar effects. The algorithm is verified for both the surface potential and its derivatives and includes a previously published analytical approximation for surface potential as a special case when ambipolar effects can be neglected. The symmetric linearization method for common-gate symmetric DG-FinFETs is developed in a form free of the charge-sheet approximation present in its original formulation for bulk MOSFETs. The accuracy of the proposed technique is verified by comparison with exact results. An alternative and computationally efficient description of the boundary between the trigonometric and hyperbolic solutions of the Poisson-Boltzmann equation for the independent-gate asymmetric DG-FinFET is developed in terms of the Lambert W function. Efficient numerical algorithm is proposed for solving the input voltage equation. Analytical expressions for terminal charges of an independent-gate asymmetric DG-FinFET are derived. The new charge model is C-infinity continuous, valid for weak as well as for strong inversion condition of both the channels and does not involve the charge-sheet approximation. This is accomplished by developing the symmetric linearization method in a form that does not require identical boundary conditions at the two Si-SiO2 interfaces and allows for volume inversion in the DG-FinFET. Verification of the model is performed with both numerical computations and 2D TCAD simulations under a wide range of biasing conditions. The model is implemented in a standard circuit simulator through Verilog-A code. Simulation examples for both digital and analog circuits verify good model convergence and demonstrate the capabilities of new circuit topologies that can be implemented using independent-gate asymmetric DG-FinFETs.
ContributorsDessai, Gajanan (Author) / Gildenblat, Gennady (Committee member) / McAndrew, Colin (Committee member) / Cao, Yu (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Lateral Double-diffused (LDMOS) transistors are commonly used in power management, high voltage/current, and RF circuits. Their characteristics include high breakdown voltage, low on-resistance, and compatibility with standard CMOS and BiCMOS manufacturing processes. As with other semiconductor devices, an accurate and physical compact model is critical for LDMOS-based circuit design. The

Lateral Double-diffused (LDMOS) transistors are commonly used in power management, high voltage/current, and RF circuits. Their characteristics include high breakdown voltage, low on-resistance, and compatibility with standard CMOS and BiCMOS manufacturing processes. As with other semiconductor devices, an accurate and physical compact model is critical for LDMOS-based circuit design. The goal of this research work is to advance the state-of-the-art by developing a physics-based scalable compact model of LDMOS transistors. The new model, SP-HV, is constructed from a surface-potential-based bulk MOSFET model, PSP, and a nonlinear resistor model, R3. The use of independently verified and mature sub-models leads to increased accuracy and robustness of an overall LDMOS model. Improved geometry scaling and simplified statistical modeling are other useful and practical consequences of the approach. Extensions are made to both PSP and R3 for improved modeling of LDMOS devices, and one internal node is introduced to connect the two component models. The presence of the lightly-doped drift region in LDMOS transistors causes some characteristic device effects which are usually not observed in conventional MOSFETs. These include quasi-saturation, a sharp peak in transconductance at low VD, gate capacitance exceeding oxide capacitance at positive VD, negative transcapacitances CBG and CGB at positive VD, a "double-hump" IB(VG) current and expansion effects. SP-HV models these effects accurately. It also includes a scalable self-heating model which is important to model the geometry dependence of the expansion effect. SP-HV, including its scalability, is verified extensively by comparison both to TCAD simulations and experimental data. The close agreement confirms the validity of the model structure. Circuit simulation examples are presented to demonstrate its convergence.
ContributorsYao, Wei (Author) / Gildenblat, Gennady (Thesis advisor) / Barnaby, Hugh (Committee member) / Cao, Yu (Committee member) / McAndrew, Colin (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Static CMOS logic has remained the dominant design style of digital systems for

more than four decades due to its robustness and near zero standby current. Static

CMOS logic circuits consist of a network of combinational logic cells and clocked sequential

elements, such as latches and flip-flops that are used for sequencing computations

over

Static CMOS logic has remained the dominant design style of digital systems for

more than four decades due to its robustness and near zero standby current. Static

CMOS logic circuits consist of a network of combinational logic cells and clocked sequential

elements, such as latches and flip-flops that are used for sequencing computations

over time. The majority of the digital design techniques to reduce power, area, and

leakage over the past four decades have focused almost entirely on optimizing the

combinational logic. This work explores alternate architectures for the flip-flops for

improving the overall circuit performance, power and area. It consists of three main

sections.

First, is the design of a multi-input configurable flip-flop structure with embedded

logic. A conventional D-type flip-flop may be viewed as realizing an identity function,

in which the output is simply the value of the input sampled at the clock edge. In

contrast, the proposed multi-input flip-flop, named PNAND, can be configured to

realize one of a family of Boolean functions called threshold functions. In essence,

the PNAND is a circuit implementation of the well-known binary perceptron. Unlike

other reconfigurable circuits, a PNAND can be configured by simply changing the

assignment of signals to its inputs. Using a standard cell library of such gates, a technology

mapping algorithm can be applied to transform a given netlist into one with

an optimal mixture of conventional logic gates and threshold gates. This approach

was used to fabricate a 32-bit Wallace Tree multiplier and a 32-bit booth multiplier

in 65nm LP technology. Simulation and chip measurements show more than 30%

improvement in dynamic power and more than 20% reduction in core area.

The functional yield of the PNAND reduces with geometry and voltage scaling.

The second part of this research investigates the use of two mechanisms to improve

the robustness of the PNAND circuit architecture. One is the use of forward and reverse body biases to change the device threshold and the other is the use of RRAM

devices for low voltage operation.

The third part of this research focused on the design of flip-flops with non-volatile

storage. Spin-transfer torque magnetic tunnel junctions (STT-MTJ) are integrated

with both conventional D-flipflop and the PNAND circuits to implement non-volatile

logic (NVL). These non-volatile storage enhanced flip-flops are able to save the state of

system locally when a power interruption occurs. However, manufacturing variations

in the STT-MTJs and in the CMOS transistors significantly reduce the yield, leading

to an overly pessimistic design and consequently, higher energy consumption. A

detailed analysis of the design trade-offs in the driver circuitry for performing backup

and restore, and a novel method to design the energy optimal driver for a given yield is

presented. Efficient designs of two nonvolatile flip-flop (NVFF) circuits are presented,

in which the backup time is determined on a per-chip basis, resulting in minimizing

the energy wastage and satisfying the yield constraint. To achieve a yield of 98%,

the conventional approach would have to expend nearly 5X more energy than the

minimum required, whereas the proposed tunable approach expends only 26% more

energy than the minimum. A non-volatile threshold gate architecture NV-TLFF are

designed with the same backup and restore circuitry in 65nm technology. The embedded

logic in NV-TLFF compensates performance overhead of NVL. This leads to the

possibility of zero-overhead non-volatile datapath circuits. An 8-bit multiply-and-

accumulate (MAC) unit is designed to demonstrate the performance benefits of the

proposed architecture. Based on the results of HSPICE simulations, the MAC circuit

with the proposed NV-TLFF cells is shown to consume at least 20% less power and

area as compared to the circuit designed with conventional DFFs, without sacrificing

any performance.
ContributorsYang, Jinghua (Author) / Vrudhula, Sarma (Thesis advisor) / Barnaby, Hugh (Committee member) / Cao, Yu (Committee member) / Seo, Jae-Sun (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Semiconductor memory is a key component of the computing systems. Beyond the conventional memory and data storage applications, in this dissertation, both mainstream and eNVM memory technologies are explored for radiation environment, hardware security system and machine learning applications.

In the radiation environment, e.g. aerospace, the memory devices face different

Semiconductor memory is a key component of the computing systems. Beyond the conventional memory and data storage applications, in this dissertation, both mainstream and eNVM memory technologies are explored for radiation environment, hardware security system and machine learning applications.

In the radiation environment, e.g. aerospace, the memory devices face different energetic particles. The strike of these energetic particles can generate electron-hole pairs (directly or indirectly) as they pass through the semiconductor device, resulting in photo-induced current, and may change the memory state. First, the trend of radiation effects of the mainstream memory technologies with technology node scaling is reviewed. Then, single event effects of the oxide based resistive switching random memory (RRAM), one of eNVM technologies, is investigated from the circuit-level to the system level.

Physical Unclonable Function (PUF) has been widely investigated as a promising hardware security primitive, which employs the inherent randomness in a physical system (e.g. the intrinsic semiconductor manufacturing variability). In the dissertation, two RRAM-based PUF implementations are proposed for cryptographic key generation (weak PUF) and device authentication (strong PUF), respectively. The performance of the RRAM PUFs are evaluated with experiment and simulation. The impact of non-ideal circuit effects on the performance of the PUFs is also investigated and optimization strategies are proposed to solve the non-ideal effects. Besides, the security resistance against modeling and machine learning attacks is analyzed as well.

Deep neural networks (DNNs) have shown remarkable improvements in various intelligent applications such as image classification, speech classification and object localization and detection. Increasing efforts have been devoted to develop hardware accelerators. In this dissertation, two types of compute-in-memory (CIM) based hardware accelerator designs with SRAM and eNVM technologies are proposed for two binary neural networks, i.e. hybrid BNN (HBNN) and XNOR-BNN, respectively, which are explored for the hardware resource-limited platforms, e.g. edge devices.. These designs feature with high the throughput, scalability, low latency and high energy efficiency. Finally, we have successfully taped-out and validated the proposed designs with SRAM technology in TSMC 65 nm.

Overall, this dissertation paves the paths for memory technologies’ new applications towards the secure and energy-efficient artificial intelligence system.
ContributorsLiu, Rui (Author) / Yu, Shimeng (Thesis advisor, Committee member) / Cao, Yu (Committee member) / Barnaby, Hugh (Committee member) / Seo, Jae-Sun (Committee member) / Arizona State University (Publisher)
Created2018
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Description
The rapid improvement in computation capability has made deep convolutional neural networks (CNNs) a great success in recent years on many computer vision tasks with significantly improved accuracy. During the inference phase, many applications demand low latency processing of one image with strict power consumption requirement, which reduces the efficiency

The rapid improvement in computation capability has made deep convolutional neural networks (CNNs) a great success in recent years on many computer vision tasks with significantly improved accuracy. During the inference phase, many applications demand low latency processing of one image with strict power consumption requirement, which reduces the efficiency of GPU and other general-purpose platform, bringing opportunities for specific acceleration hardware, e.g. FPGA, by customizing the digital circuit specific for the deep learning algorithm inference. However, deploying CNNs on portable and embedded systems is still challenging due to large data volume, intensive computation, varying algorithm structures, and frequent memory accesses. This dissertation proposes a complete design methodology and framework to accelerate the inference process of various CNN algorithms on FPGA hardware with high performance, efficiency and flexibility.

As convolution contributes most operations in CNNs, the convolution acceleration scheme significantly affects the efficiency and performance of a hardware CNN accelerator. Convolution involves multiply and accumulate (MAC) operations with four levels of loops. Without fully studying the convolution loop optimization before the hardware design phase, the resulting accelerator can hardly exploit the data reuse and manage data movement efficiently. This work overcomes these barriers by quantitatively analyzing and optimizing the design objectives (e.g. memory access) of the CNN accelerator based on multiple design variables. An efficient dataflow and hardware architecture of CNN acceleration are proposed to minimize the data communication while maximizing the resource utilization to achieve high performance.

Although great performance and efficiency can be achieved by customizing the FPGA hardware for each CNN model, significant efforts and expertise are required leading to long development time, which makes it difficult to catch up with the rapid development of CNN algorithms. In this work, we present an RTL-level CNN compiler that automatically generates customized FPGA hardware for the inference tasks of various CNNs, in order to enable high-level fast prototyping of CNNs from software to FPGA and still keep the benefits of low-level hardware optimization. First, a general-purpose library of RTL modules is developed to model different operations at each layer. The integration and dataflow of physical modules are predefined in the top-level system template and reconfigured during compilation for a given CNN algorithm. The runtime control of layer-by-layer sequential computation is managed by the proposed execution schedule so that even highly irregular and complex network topology, e.g. GoogLeNet and ResNet, can be compiled. The proposed methodology is demonstrated with various CNN algorithms, e.g. NiN, VGG, GoogLeNet and ResNet, on two different standalone FPGAs achieving state-of-the art performance.

Based on the optimized acceleration strategy, there are still a lot of design options, e.g. the degree and dimension of computation parallelism, the size of on-chip buffers, and the external memory bandwidth, which impact the utilization of computation resources and data communication efficiency, and finally affect the performance and energy consumption of the accelerator. The large design space of the accelerator makes it impractical to explore the optimal design choice during the real implementation phase. Therefore, a performance model is proposed in this work to quantitatively estimate the accelerator performance and resource utilization. By this means, the performance bottleneck and design bound can be identified and the optimal design option can be explored early in the design phase.
ContributorsMa, Yufei (Author) / Vrudhula, Sarma (Thesis advisor) / Seo, Jae-Sun (Thesis advisor) / Cao, Yu (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2018