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Description
The study of soft magnetic materials has been growing in popularity in recent years. Driving this interest are new applications for traditional electrical power-management components, such as inductors and transformers, which must be scaled down to the micro and nano scale while the frequencies of operation have been scaling up to the gigahertz range and beyond. The exceptional magnetic properties of the materials make them highly effective in these small-component applications, but the ability of these materials to provide highly-effective shielding has not been so thoroughly considered. Most shielding is done with traditional metals, such as aluminum, because of the relatively low cost of the material and high workability in shaping the material to meet size and dimensional requirements.
This research project focuses on analyzing the variance in shielding effectiveness and electromagnetic field effects of a thin film of Cobalt Zirconium Tantalum Boron (CZTB) in the band of frequencies most likely to require innovative solutions to long-standing problems of noise and interference. The measurements include Near H-Field attenuation and field effects, Far Field shielding, and Backscatter. Minor variances in the thickness and layering of sputter deposition can have significant changes electromagnetic signature of devices which radiate energy through the material.
The material properties presented in this research are H-Field attenuation, H-Field Flux Orientation, Far-Field Approximation, E Field Vector Directivity, H Field Vector Directivity, and Backscatter Magnitude. The results are presented, analyzed and explained using characterization techniques. Future work includes the effect of sputter deposition orientation, application to devices, and applicability in mitigating specific noise signals beyond the 5G band.
This research project focuses on analyzing the variance in shielding effectiveness and electromagnetic field effects of a thin film of Cobalt Zirconium Tantalum Boron (CZTB) in the band of frequencies most likely to require innovative solutions to long-standing problems of noise and interference. The measurements include Near H-Field attenuation and field effects, Far Field shielding, and Backscatter. Minor variances in the thickness and layering of sputter deposition can have significant changes electromagnetic signature of devices which radiate energy through the material.
The material properties presented in this research are H-Field attenuation, H-Field Flux Orientation, Far-Field Approximation, E Field Vector Directivity, H Field Vector Directivity, and Backscatter Magnitude. The results are presented, analyzed and explained using characterization techniques. Future work includes the effect of sputter deposition orientation, application to devices, and applicability in mitigating specific noise signals beyond the 5G band.
ContributorsMiller, Phillip Carl (Author) / Yu, Hongbin (Thesis advisor) / Aberle, James T., 1961- (Committee member) / Blain Christen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2019