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Description
Statistical model selection using the Akaike Information Criterion (AIC) and similar criteria is a useful tool for comparing multiple and non-nested models without the specification of a null model, which has made it increasingly popular in the natural and social sciences. De- spite their common usage, model selection methods are

Statistical model selection using the Akaike Information Criterion (AIC) and similar criteria is a useful tool for comparing multiple and non-nested models without the specification of a null model, which has made it increasingly popular in the natural and social sciences. De- spite their common usage, model selection methods are not driven by a notion of statistical confidence, so their results entail an unknown de- gree of uncertainty. This paper introduces a general framework which extends notions of Type-I and Type-II error to model selection. A theo- retical method for controlling Type-I error using Difference of Goodness of Fit (DGOF) distributions is given, along with a bootstrap approach that approximates the procedure. Results are presented for simulated experiments using normal distributions, random walk models, nested linear regression, and nonnested regression including nonlinear mod- els. Tests are performed using an R package developed by the author which will be made publicly available on journal publication of research results.
ContributorsCullan, Michael J (Author) / Sterner, Beckett (Thesis advisor) / Fricks, John (Committee member) / Kao, Ming-Hung (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Acoustic emission (AE) signals have been widely employed for tracking material properties and structural characteristics. In this study, the aim is to analyze the AE signals gathered during a scanning probe lithography process to classify the known microstructure types and discover unknown surface microstructures/anomalies. To achieve this, a Hidden Markov

Acoustic emission (AE) signals have been widely employed for tracking material properties and structural characteristics. In this study, the aim is to analyze the AE signals gathered during a scanning probe lithography process to classify the known microstructure types and discover unknown surface microstructures/anomalies. To achieve this, a Hidden Markov Model is developed to consider the temporal dependency of the high-resolution AE data. Furthermore, the posterior classification probability and the negative likelihood score for microstructure classification and discovery are computed. Subsequently, a diagnostic procedure to identify the dominant AE frequencies that were used to track the microstructural characteristics is presented. In addition, machine learning methods such as KNN, Naive Bayes, and Logistic Regression classifiers are applied. Finally, the proposed approach applied to identify the surface microstructures of additively manufactured Ti-6Al-4V and show that it not only achieved a high classification accuracy (e.g., more than 90\%) but also correctly identified the microstructural anomalies that may be subjected to further investigation to discover new material phases/properties.
ContributorsSun, Huifeng (Author) / Yan, Hao (Thesis advisor) / Fricks, John (Thesis advisor) / Cheng, Dan (Committee member) / Arizona State University (Publisher)
Created2020