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Description
With the advent of parallel processing, primarily the time-interleaved pipeline ADCs, high speed and high resolution ADCs became a possibility. When these speeds touch giga samples per second and resolutions go beyond 12-bits, the parallelization becomes more extensive leading to repeated presence of several identical blocks in the architecture. This

With the advent of parallel processing, primarily the time-interleaved pipeline ADCs, high speed and high resolution ADCs became a possibility. When these speeds touch giga samples per second and resolutions go beyond 12-bits, the parallelization becomes more extensive leading to repeated presence of several identical blocks in the architecture. This thesis discusses one such block, the sub-ADC (Flash ADC), of the pipeline and sharing it with more than two of the parallel processing channels thereby reducing area and power and input load capacitance to each stage. This work presents a design of 'sub-ADC shared in a time-interleaved pipeline ADC' in the IBM 8HP process. It has been implemented with an offset-compensated, kickback-compensated, fast decision making (large input bandwidth) and low power comparator that forms the core part of the design.
ContributorsBikkina, Phaneendra Kumar (Author) / Barnaby, Hugh (Thesis advisor) / Mikkola, Esko (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2013
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Description
In thesis, a test time reduction (a low cost test) methodology for digitally-calibrated pipeline analog-to-digital converters (ADCs) is presented. A long calibration time is required in the final test to validate performance of these designs. To reduce total test time, optimized calibration technique and calibrated effective number of bits (ENOB)

In thesis, a test time reduction (a low cost test) methodology for digitally-calibrated pipeline analog-to-digital converters (ADCs) is presented. A long calibration time is required in the final test to validate performance of these designs. To reduce total test time, optimized calibration technique and calibrated effective number of bits (ENOB) prediction from calibration coefficient will be presented. With the prediction technique, failed devices can be identified only without actual calibration. This technique reduces significant amount of time for the total test time.
ContributorsKim, Kibeom (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2013
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Description
During the last decades the development of the transistor and its continuous down-scaling allowed the appearance of cost effective wireless communication systems. New generation wideband wireless mobile systems demand high linearity, low power consumption and the low cost devices. Traditional RF systems are mainly analog-based circuitry. Contrary to digital circuits,

During the last decades the development of the transistor and its continuous down-scaling allowed the appearance of cost effective wireless communication systems. New generation wideband wireless mobile systems demand high linearity, low power consumption and the low cost devices. Traditional RF systems are mainly analog-based circuitry. Contrary to digital circuits, the technology scaling results in reduction on the maximum voltage swing which makes RF design very challenging. Pushing the interface between the digital and analog boundary of the RF systems closer to the antenna becomes an attractive trend for modern RF devices. In order to take full advantages of the deep submicron CMOS technologies and digital signal processing (DSP), there is a strong trend towards the development of digital transmitter where the RF upconversion is part of the digital-to-analog conversion (DAC). This thesis presents a new digital intermediate frequency (IF) to RF transmitter for 2GHz wideband code division multiple access (W-CDMA). The proposed transmitter integrates a 3-level digital IF current-steering cell, an up-conversion mixer with a tuned load and an RF variable gain amplifier (RF VGA) with an embedded finite impulse response (FIR) reconstruction filter in the up-conversion path. A 4th-order 1.5-bit IF bandpass sigma delta modulator (BP SDM) is designed to support in-band SNR while the out-of-band quantization noise due to the noise shaping is suppressed by the embedded reconstruction filter to meet spectrum emission mask and ACPR requirements. The RF VGA provides 50dB power scaling in 10-dB steps with less than 1dB gain error. The design is fabricated in a 0.18um CMOS technology with a total core area of 0.8 x 1.6 mm2. The IC delivers 0dBm output power at 2GHz and it draws approximately 120mA from a 1.8V DC supply at the maximum output power. The measurement results proved that a digital-intensive digital IF to RF converter architecture can be successfully employed for WCDMA transmitter application.
ContributorsHan, Yongping (Author) / Kiaei, Sayfe (Thesis advisor) / Yu, Hongyu (Committee member) / Bakkaloglu, Bertan (Committee member) / Aberle, James T., 1961- (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2012
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Description
ABSTRACT As the technology length shrinks down, achieving higher gain is becoming very difficult in deep sub-micron technologies. As the supply voltages drop, cascodes are very difficult to implement and cascade amplifiers are needed to achieve sufficient gain with required output swing. This sets the fundamental limit on the SNR

ABSTRACT As the technology length shrinks down, achieving higher gain is becoming very difficult in deep sub-micron technologies. As the supply voltages drop, cascodes are very difficult to implement and cascade amplifiers are needed to achieve sufficient gain with required output swing. This sets the fundamental limit on the SNR and hence the maximum resolution that can be achieved by ADC. With the RSD algorithm and the range overlap, the sub ADC can tolerate large comparator offsets leaving the linearity and accuracy requirement for the DAC and residue gain stage. Typically, the multiplying DAC requires high gain wide bandwidth op-amp and the design of this high gain op-amp becomes challenging in the deep submicron technologies. This work presents `A 12 bit 25MSPS 1.2V pipelined ADC using split CLS technique' in IBM 130nm 8HP process using only CMOS devices for the application of Large Hadron Collider (LHC). CLS technique relaxes the gain requirement of op-amp and improves the signal-to-noise ratio without increase in power or input sampling capacitor with rail-to-rail swing. An op-amp sharing technique has been incorporated with split CLS technique which decreases the number of op-amps and hence the power further. Entire pipelined converter has been implemented as six 2.5 bit RSD stages and hence decreases the latency associated with the pipelined architecture - one of the main requirements for LHC along with the power requirement. Two different OTAs have been designed to use in the split-CLS technique. Bootstrap switches and pass gate switches are used in the circuit along with a low power dynamic kick-back compensated comparator.
ContributorsSwaminathan, Visu Vaithiyanathan (Author) / Barnaby, Hugh (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2012