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Description
Uranium Dioxide (UO2) is a significant nuclear fission fuel, which is widely used

in nuclear reactors. Understanding the influence of microstructure on thermo-mechanical behavior of UO2 is extremely important to predict its performance. In particular, evaluating mechanical properties, such as elasticity, plasticity and creep at sub-grain length scales is key to

Uranium Dioxide (UO2) is a significant nuclear fission fuel, which is widely used

in nuclear reactors. Understanding the influence of microstructure on thermo-mechanical behavior of UO2 is extremely important to predict its performance. In particular, evaluating mechanical properties, such as elasticity, plasticity and creep at sub-grain length scales is key to developing this understanding as well as building multi-scale models of fuel behavior with predicting capabilities. In this work, modeling techniques were developed to study effects of microstructure on Young’s modulus, which was selected as a key representative property that affects overall mechanical behavior, using experimental data obtained from micro-cantilever bending testing as benchmarks. Beam theory was firstly introduced to calculate Young's modulus of UO2 from the experimental data and then three-dimensional finite element models of the micro-cantilever beams were constructed to simulate bending tests in UO2 at room temperature. The influence of the pore distribution was studied to explain the discrepancy between predicted values and experimental results. Results indicate that results of tests are significantly affected by porosity given that both pore size and spacing in the samples are of the order of the micro-beam dimensions. Microstructure reconstruction was conducted with images collected from three-dimensional serial sectioning using focused ion beam (FIB) and electron backscattering diffraction (EBSD) and pore clusters were placed at different locations along the length of the beam. Results indicate that the presence of pore clusters close to the substrate, i.e., the clamp of the micro-cantilever beam, has the strongest effect on load-deflection behavior, leading to a reduction of stiffness that is the largest for any location of the pore cluster. Furthermore, it was also found from both numerical and i

analytical models that pore clusters located towards the middle of the span and close to the end of the beam only have a very small effect on the load-deflection behavior, and it is concluded that better estimates of Young's modulus can be obtained from micro- cantilever experiments by using microstructurally explicit models that account for porosity in about one half of the beam length close to the clamp. This, in turn, provides an avenue to simplify micro-scale experiments and their analysis.
ContributorsGong, Bowen (Author) / Peralta, Pedro (Thesis advisor) / Rajagopalan, Jagannathan (Committee member) / Solanki, Kiran (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Mechanical behavior of metallic thin films at room temperature (RT) is relatively well characterized. However, measuring the high temperature mechanical properties of thin films poses several challenges. These include ensuring uniformity in sample temperature and minimizing temporal fluctuations due to ambient heat loss, in addition to difficulties involved in mechanical

Mechanical behavior of metallic thin films at room temperature (RT) is relatively well characterized. However, measuring the high temperature mechanical properties of thin films poses several challenges. These include ensuring uniformity in sample temperature and minimizing temporal fluctuations due to ambient heat loss, in addition to difficulties involved in mechanical testing of microscale samples. To address these issues, we designed and analyzed a MEMS-based high temperature tensile testing stage made from single crystal silicon. The freestanding thin film specimens were co-fabricated with the stage to ensure uniaxial loading. Multi-physics simulations of Joule heating, incorporating both radiation and convection heat transfer, were carried out using COMSOL to map the temperature distribution across the stage and the specimen. The simulations were validated using temperature measurements from a thermoreflectance microscope.
ContributorsEswarappa Prameela, Suhas (Author) / Rajagopalan, Jagannathan (Thesis advisor) / Wang, Liping (Committee member) / Jiao, Yang (Committee member) / Arizona State University (Publisher)
Created2016
Description
Nanocrystalline (nc) thin films exhibit a wide range of enhanced mechanical properties compared to their coarse-grained counterparts. Furthermore, the mechanical behavior and microstructure of nc films is intimately related. Thus, precise control of the size, aspect ratio and spatial distribution of grains can enable the synthesis of thin films

Nanocrystalline (nc) thin films exhibit a wide range of enhanced mechanical properties compared to their coarse-grained counterparts. Furthermore, the mechanical behavior and microstructure of nc films is intimately related. Thus, precise control of the size, aspect ratio and spatial distribution of grains can enable the synthesis of thin films with exceptional mechanical properties. However, conventional bottom-up techniques for synthesizing thin films are incapable of achieving the microstructural control required to explicitly tune their properties. This dissertation focuses on developing a novel technique to synthesize metallic alloy thin films with precisely controlled microstructures and subsequently characterizing their mechanical properties using in situ transmission electron microscopy (TEM). Control over the grain size and distribution was achieved by controlling the recrystallization process of amorphous films by the use of thin crystalline seed layers. The novel technique was used to manipulate the microstructure of structural (TiAl) and functional (NiTi) thin films thereby exhibiting its capability and versatility. Following the synthesis of thin films with tailored microstructures, in situ TEM techniques were employed to probe their mechanical properties. Firstly, a novel technique was developed to measure local atomic level elastic strains in metallic glass thin films during in situ TEM straining. This technique was used to detect structural changes and anelastic deformation in metallic glass thin films. Finally, as the electron beam (e-beam) in TEMs is known to cause radiation damage to specimen, systematic experiments were carried out to quantify the effect of the e-beam on the stress-strain response of nc metals. Experiments conducted on Al and Au films revealed that the e-beam enhances dislocation activity leading to stress relaxation.
ContributorsSarkar, Rohit (Author) / Rajagopalan, Jagannathan (Thesis advisor) / Peralta, Pedro (Committee member) / Sieradzki, Karl (Committee member) / Crozier, Peter (Committee member) / Arizona State University (Publisher)
Created2017
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Description
With the advancements in technology, it is now possible to synthesize new materials with specific microstructures, and enhanced mechanical and physical properties. One of the new class of materials are nanoscale metallic multilayers, often referred to as nanolaminates. Nanolaminates are composed of alternating, nanometer-thick layers of multiple materials (typically metals

With the advancements in technology, it is now possible to synthesize new materials with specific microstructures, and enhanced mechanical and physical properties. One of the new class of materials are nanoscale metallic multilayers, often referred to as nanolaminates. Nanolaminates are composed of alternating, nanometer-thick layers of multiple materials (typically metals or ceramics), and exhibit very high strength, wear resistance and radiation tolerance. This thesis is focused on the fabrication and mechanical characterization of nanolaminates composed of Copper and Cobalt, two metals which are nearly immiscible across the entire composition range. The synthesis of these Cu-Co nanolaminates is performed using sputtering, a well-known and technologically relevant physical vapor deposition process. X-ray diffraction is used to characterize the microstructure of the nanolaminates. Cu-Co nanolaminates with different layer thicknesses are tested using microelectromechanical systems (MEMS) based tensile testing devices fabricated using photolithography and etching processes. The stress-strain behavior of nanolaminates with varying layer thicknesses are analysed and correlated to their microstructure.
ContributorsRajarajan, Santhosh Kiran (Author) / Rajagopalan, Jagannathan (Thesis advisor) / Oswald, Jay (Committee member) / Solanki, Kiran (Committee member) / Arizona State University (Publisher)
Created2019