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- All Subjects: Linear Bipolar Circuits
- Creators: Kozicki, Michael
- Creators: Forman, Oliver Ethan
- Resource Type: Text
- Status: Published
Description
This is a test plan document for Team Aegis' capstone project that has the goal of mitigating single event upsets in NAND flash memory caused by space radiation.
ContributorsForman, Oliver Ethan (Co-author) / Smith, Aiden (Co-author) / Salls, Demetra (Co-author) / Kozicki, Michael (Thesis director) / Hodge, Chris (Committee member) / Electrical Engineering Program (Contributor) / Barrett, The Honors College (Contributor)
Created2021-05
Description
When exposed to radiation, many electronic components become damaged and operate incorrectly. Making sure these components are resistant to radiation effects is especially important for components used in space flight operations. At low dose rates, a phenomenon known as the enhanced low dose rate sensitivity (ELDRS) effect causes an increase in current within linear bipolar circuits. This increase in current is not desirable for space flight operations. Correctly selecting radiation hardened components or figuring out how to deal with the effects for space operation is important, however, radiation testing each component is very expensive and time consuming. To further the future of space travel, a more efficient way of testing is highly desired by the space industry.
A low-cost and time-efficient solution is the IMPACT tool. The Multiscale Tool for Modeling Radiation Effects in Linear Bipolar Circuits project aims to improve the existing IMPACT tool for radiation simulation. This tool contains a database of commonly used linear bipolar circuits and allows the user to model the radiation effects. Currently the tool is not very easy to use and the circuit database is limited. The team’s goal and overall outcome of the project is to deliver the IMPACT tool with a user-friendly interface and an expanded circuit database. The team is using multiple tools to improve the overall appearance of the IMPACT tool and running simulations to collect any necessary data for the database expansion.
In our thesis, Kerri and Kylie are using LTSpice simulations to expand the database. Cheyenne is using TCAD modeling to create TCAD models of transistors and compare them with her other group member’s simulations.
ContributorsWelch, Kylie (Author) / Welch, Kerri (Co-author) / Cook, Cheyenne (Co-author) / Barnaby, Hugh (Thesis director) / Kozicki, Michael (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor)
Created2022-05
Description
When exposed to radiation, many electronic components become damaged and operate incorrectly. Making sure these components are resistant to radiation effects is especially important for components used in space flight operations. At low dose rates, a phenomenon known as the enhanced low dose rate sensitivity (ELDRS) effect causes an increase in current within linear bipolar circuits. This increase in current is not desirable for space flight operations. Correctly selecting radiation hardened components or figuring out how to deal with the effects for space operation is important, however, radiation testing each component is very expensive and time consuming. To further the future of space travel, a more efficient way of testing is highly desired by the space industry.
A low-cost and time-efficient solution is the IMPACT tool. The Multiscale Tool for Modeling Radiation Effects in Linear Bipolar Circuits project aims to improve the existing IMPACT tool for radiation simulation. This tool contains a database of commonly used linear bipolar circuits and allows the user to model the radiation effects. Currently the tool is not very easy to use and the circuit database is limited. The team’s goal and overall outcome of the project is to deliver the IMPACT tool with a user-friendly interface and an expanded circuit database. The team is using multiple tools to improve the overall appearance of the IMPACT tool and running simulations to collect any necessary data for the database expansion.
In our thesis, Kerri and Kylie are using LTSpice simulations to expand the database. Cheyenne is using TCAD modeling to create TCAD models of transistors and compare them with her other group member’s simulations.
ContributorsWelch, Kerri (Author) / Welch, Kylie (Co-author) / Cook, Cheyenne (Co-author) / Barnaby, Hugh (Thesis director) / Kozicki, Michael (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor)
Created2022-05