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- All Subjects: Mechanical Engineering
- All Subjects: Astronomy
- All Subjects: optics
- Creators: Wang, Robert
The Star Planet Activity Research CubeSat (SPARCS) will be a 6U CubeSat devoted to photometric monitoring of M dwarfs in the far-ultraviolet (FUV) and near-ultraviolet (NUV) (160 and 280 nm respectively), measuring the time-dependent spectral slope, intensity and evolution of M dwarf stellar UV radiation. The delta-doped detectors baselined for SPARCS have demonstrated more than five times the in-band quantum efficiency of the detectors of GALEX. Given that red:UV photon emission from cool, low-mass stars can be million:one, UV observation of thes stars are susceptible to red light contamination. In addition to the high efficiency delta-doped detectors, SPARCS will include red-rejection filters to help minimize red leak. Even so, careful red-rejection and photometric calibration is needed. As was done for GALEX, white dwarfs are used for photometric calibration in the UV. We find that the use of white dwarfs to calibrate the observations of red stars leads to significant errors in the reported flux, due to the differences in white dwarf and red dwarf spectra. Here we discuss the planned SPARCS calibration model and the color correction, and demonstrate the importance of this correction when recording UV measurements of M stars taken by SPARCS.
In this thesis, aluminum metasurface structures are proposed based on colloidal lithography method. High Frequency Structure Simulator is used to numerically study optical properties and design the aluminum metasurfaces with selective absorption. Simulation results show that proposed aluminum metasurface structure on aluminum oxide thin film and aluminum substrate has a major reflectance dip, whose wavelength is tunable within the near-infrared and visible spectrum with metasurface size. As the metasurface is opaque due to aluminum film, it indicates strong wavelength-selective optical absorption, which is due to the magnetic resonance between the top metasurface and bottom Al film within the aluminum oxide layer.
The proposed sample is fabricated based on colloidal lithography method. Monolayer polystyrene particles of 500 nm are successfully prepared and transferred onto silicon substrate. Scanning electron microscope is used to check the surface topography. Aluminum thin film with 20-nm or 50-nm thickness is then deposited on the sample. After monolayer particles are removed, optical properties of samples are measured by micro-scale optical reflectance and transmittance microscope. Measured and simulated reflectance of these samples do not have frequency selective properties and is not sensitive to defects. The next step is to fabricate the Al metasurface on Al_2 O_3 and Al films to experimentally demonstrate the selective absorption predicted from the numerical simulation.