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Description
Register file (RF) memory is important in low power system on chip (SOC) due to its

inherent low voltage stability. Moreover, designs increasingly use compiled instead of custom memory blocks, which frequently employ static, rather than pre-charged dynamic RFs. In this work, the various RFs designed for a microprocessor cache and

Register file (RF) memory is important in low power system on chip (SOC) due to its

inherent low voltage stability. Moreover, designs increasingly use compiled instead of custom memory blocks, which frequently employ static, rather than pre-charged dynamic RFs. In this work, the various RFs designed for a microprocessor cache and register files are discussed. Comparison between static and dynamic RF power dissipation and timing characteristics is also presented. The relative timing and power advantages of the designs are shown to be dependent on the memory aspect ratio, i.e. array width and height.
ContributorsVashishtha, Vinay (Author) / Clark, Lawrence T. (Thesis advisor) / Seo, Jae-Sun (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2014
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Description
Power Management circuits are employed in almost all electronic equipment and they have energy storage elements (capacitors and inductors) as building blocks along with other active circuitry. Power management circuits employ feedback to achieve good load and line regulation. The feedback loop is designed at an operating point and component

Power Management circuits are employed in almost all electronic equipment and they have energy storage elements (capacitors and inductors) as building blocks along with other active circuitry. Power management circuits employ feedback to achieve good load and line regulation. The feedback loop is designed at an operating point and component values are chosen to meet that design requirements. But the capacitors and inductors are subject to variations due to temperature, aging and load stress. Due to these variations, the feedback loop can cross its robustness margins and can lead to degraded performance and potential instability. Another issue in power management circuits is the measurement of their frequency response for stability assessment. The standard techniques used in production test environment require expensive measurement equipment (Network Analyzer) and time. These two issues of component variations and frequency response measurement can be addressed if the frequency response of the power converter is used as measure of component (capacitor and inductor) variations. So, a single solution of frequency response measurement solves both the issues. This work examines system identification (frequency response measurement) of power management circuits based on cross correlation technique and proposes the use of switched capacitor correlator for this purpose. A switched capacitor correlator has been designed and used in the system identification of Linear and Switching regulators. The obtained results are compared with the standard frequency response measurement methods of power converters.
ContributorsMalladi, Venkata Naga Koushik (Author) / Bakkaloglu, Bertan (Thesis advisor) / Kitchen, Jennifer (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
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Description
RF transmitter manufacturers go to great extremes and expense to ensure that their product meets the RF output power requirements for which they are designed. Therefore, there is an urgent need for in-field monitoring of output power and gain to bring down the costs of RF transceiver testing and ensure

RF transmitter manufacturers go to great extremes and expense to ensure that their product meets the RF output power requirements for which they are designed. Therefore, there is an urgent need for in-field monitoring of output power and gain to bring down the costs of RF transceiver testing and ensure product reliability. Built-in self-test (BIST) techniques can perform such monitoring without the requirement for expensive RF test equipment. In most BIST techniques, on-chip resources, such as peak detectors, power detectors, or envelope detectors are used along with frequency down conversion to analyze the output of the design under test (DUT). However, this conversion circuitry is subject to similar process, voltage, and temperature (PVT) variations as the DUT and affects the measurement accuracy. So, it is important to monitor BIST performance over time, voltage and temperature, such that accurate in-field measurements can be performed.

In this research, a multistep BIST solution using only baseband signals for test analysis is presented. An on-chip signal generation circuit, which is robust with respect to time, supply voltage, and temperature variations is used for self-calibration of the BIST system before the DUT measurement. Using mathematical modelling, an analytical expression for the output signal is derived first and then test signals are devised to extract the output power of the DUT. By utilizing a standard 180nm IBM7RF CMOS process, a 2.4GHz low power RF IC incorporated with the proposed BIST circuitry and on-chip test signal source is designed and fabricated. Experimental results are presented, which show this BIST method can monitor the DUT’s output power with +/- 0.35dB accuracy over a 20dB power dynamic range.
ContributorsGangula, Sudheer Kumar Reddy (Author) / Kitchen, Jennifer (Thesis advisor) / Ozev, Sule (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Object tracking is an important topic in multimedia, particularly in applications such as teleconferencing, surveillance and human-computer interface. Its goal is to determine the position of objects in images continuously and reliably. The key steps involved in object tracking are foreground detection to detect moving objects, clustering to enable representation

Object tracking is an important topic in multimedia, particularly in applications such as teleconferencing, surveillance and human-computer interface. Its goal is to determine the position of objects in images continuously and reliably. The key steps involved in object tracking are foreground detection to detect moving objects, clustering to enable representation of an object by its centroid, and tracking the centroids to determine the motion parameters.

In this thesis, a low cost object tracking system is implemented on a hardware accelerator that is a warp based processor for SIMD/Vector style computations. First, the different foreground detection techniques are explored to figure out the best technique that involves the least number of computations without compromising on the performance. It is found that the Gaussian Mixture Model proposed by Zivkovic gives the best performance with respect to both accuracy and number of computations. Pixel level parallelization is applied to this algorithm and it is mapped onto the hardware accelerator.

Next, the different clustering algorithms are studied and it is found that while DBSCAN is highly accurate and robust to outliers, it is very computationally intensive. In contrast, K-means is computationally simple, but it requires that the number of means to be specified beforehand. So, a new clustering algorithm is proposed that uses a combination of both DBSCAN and K-means algorithm along with a diagnostic algorithm on K-means to estimate the right number of centroids. The proposed hybrid algorithm is shown to be faster than the DBSCAN algorithm by ~2.5x with minimal loss in accuracy. Also, the 1D Kalman filter is implemented assuming constant acceleration model. Since the computations involved in Kalman filter is just a set of recursive equations, the sequential model in itself exhibits good performance, thereby alleviating the need for parallelization. The tracking performance of the low cost implementation is evaluated against the sequential version. It is found that the proposed hybrid algorithm performs very close to the reference algorithm based on the DBSCAN algorithm.
ContributorsSasikumar, Asha (Author) / Chakrabarti, Chaitali (Thesis advisor) / Ogras, Umit Y. (Committee member) / Suppapola, Antonia Pappandreau (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary and ensure proper operation.

Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary and ensure proper operation. Therefore low-overhead built-in Self-Test (BIST) solution for advanced RF transceiver is proposed. In this dissertation. Firstly, comprehensive BIST solution for RF polar transceivers using on-chip resources is presented. In the receiver, phase and gain mismatches degrade sensitivity and error vector magnitude (EVM). In the transmitter, delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to violation of spectral mask requirements. Characterization and calibration of these parameters with analytical model would reduce the test time and cost considerably. Hence, a technique to measure and calibrate impairments of the polar transceiver in the loop-back mode is proposed.

Secondly, robust amplitude measurement technique for RF BIST application and BIST circuits for loop-back connection are discussed. Test techniques using analytical model are explained and BIST circuits are introduced.

Next, a self-compensating built-in self-test solution for RF Phased Array Mismatch is proposed. In the proposed method, a sinusoidal test signal with unknown amplitude is applied to the inputs of two adjacent phased array elements and measure the baseband output signal after down-conversion. Mathematical modeling of the circuit impairments and phased array behavior indicates that by using two distinct input amplitudes, both of which can remain unknown, it is possible to measure the important parameters of the phased array, such as gain and phase mismatch. In addition, proposed BIST system is designed and fabricated using IBM 180nm process and a prototype four-element phased-array PCB is also designed and fabricated for verifying the proposed method.

Finally, process independent gain measurement via BIST/DUT co-design is explained. Design methodology how to reduce performance impact significantly is discussed.

Simulation and hardware measurements results for the proposed techniques show that the proposed technique can characterize the targeted impairments accurately.
ContributorsJeong, Jae Woong (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Cao, Yu (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Clock generation and distribution are essential to CMOS microchips, providing synchronization to external devices and between internal sequential logic. Clocks in microprocessors are highly vulnerable to single event effects and designing reliable energy efficient clock networks for mission critical applications is a major challenge. This dissertation studies the basics of

Clock generation and distribution are essential to CMOS microchips, providing synchronization to external devices and between internal sequential logic. Clocks in microprocessors are highly vulnerable to single event effects and designing reliable energy efficient clock networks for mission critical applications is a major challenge. This dissertation studies the basics of radiation hardening, essentials of clock design and impact of particle strikes on clocks in detail and presents design techniques for hardening complete clock systems in digital ICs.

Since the sequential elements play a key role in deciding the robustness of any clocking strategy, hardened-by-design implementations of triple-mode redundant (TMR) pulse clocked latches and physical design methodologies for using TMR master-slave flip-flops in application specific ICs (ASICs) are proposed. A novel temporal pulse clocked latch design for low power radiation hardened applications is also proposed. Techniques for designing custom RHBD clock distribution networks (clock spines) and ASIC clock trees for a radiation hardened microprocessor using standard CAD tools are presented. A framework for analyzing the vulnerabilities of clock trees in general, and study the parameters that contribute the most to the tree’s failure, including impact on controlled latches is provided. This is then used to design an integrated temporally redundant clock tree and pulse clocked flip-flop based clocking scheme that is robust to single event transients (SETs) and single event upsets (SEUs). Subsequently, designing robust clock delay lines for use in double data rate (DDRx) memory applications is studied in detail. Several modules of the proposed radiation hardened all-digital delay locked loop are designed and studied. Many of the circuits proposed in this entire body of work have been implemented and tested on a standard low-power 90-nm process.
ContributorsChellappa, Srivatsan (Author) / Clark, Lawrence T (Thesis advisor) / Holbert, Keith E. (Committee member) / Cao, Yu (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Performance failure due to aging is an increasing concern for RF circuits. While most aging studies are focused on the concept of mean-time-to-failure, for analog circuits, aging results in continuous degradation in performance before it causes catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as

Performance failure due to aging is an increasing concern for RF circuits. While most aging studies are focused on the concept of mean-time-to-failure, for analog circuits, aging results in continuous degradation in performance before it causes catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as the point where at least one specification fails, is not just determined by aging at the device level, but also by the slack in the specifications, process variations, and the stress conditions on the devices. In this dissertation, firstly, a methodology for analyzing the performance degradation of RF circuits caused by aging mechanisms in MOSFET devices at design-time (pre-silicon) is presented. An algorithm to determine reliability hotspots in the circuit is proposed and design-time optimization methods to enhance the lifetime by making the most likely to fail circuit components more reliable is performed. RF circuits are used as test cases to demonstrate that the lifetime can be enhanced using the proposed design-time technique with low area and no performance impact. Secondly, in-field monitoring and recovering technique for the performance of aged RF circuits is discussed. The proposed in-field technique is based on two phases: During the design time, degradation profiles of the aged circuit are obtained through simulations. From these profiles, hotspot identification of aged RF circuits are conducted and the circuit variable that is easy to measure but highly correlated to the performance of the primary circuit is determined for a monitoring purpose. After deployment, an on-chip DC monitor is periodically activated and its results are used to monitor, and if necessary, recover the circuit performances degraded by aging mechanisms. It is also necessary to co-design the monitoring and recovery mechanism along with the primary circuit for minimal performance impact. A low noise amplifier (LNA) and LC-tank oscillators are fabricated for case studies to demonstrate that the lifetime can be enhanced using the proposed monitoring and recovery techniques in the field. Experimental results with fabricated LNA/oscillator chips show the performance degradation from the accelerated stress conditions and this loss can be recovered by the proposed mitigation scheme.
ContributorsChang, Doo Hwang (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kitchen, Jennifer (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2017
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Description
Parkinson’s disease (PD) is a neurological disorder with complicated and disabling motor and non-motor symptoms. The pathology for PD is difficult and expensive. Furthermore, it depends on patient diaries and the neurologist’s subjective assessment of clinical scales. Objective, accurate, and continuous patient monitoring have become possible with the

Parkinson’s disease (PD) is a neurological disorder with complicated and disabling motor and non-motor symptoms. The pathology for PD is difficult and expensive. Furthermore, it depends on patient diaries and the neurologist’s subjective assessment of clinical scales. Objective, accurate, and continuous patient monitoring have become possible with the advancement in mobile and portable equipment. Consequently, a significant amount of work has been done to explore new cost-effective and subjective assessment methods or PD symptoms. For example, smart technologies, such as wearable sensors and optical motion capturing systems, have been used to analyze the symptoms of a PD patient to assess their disease progression and even to detect signs in their nascent stage for early diagnosis of PD.

This review focuses on the use of modern equipment for PD applications that were developed in the last decade. Four significant fields of research were identified: Assistance diagnosis, Prognosis or Monitoring of Symptoms and their Severity, Predicting Response to Treatment, and Assistance to Therapy or Rehabilitation. This study reviews the papers published between January 2008 and December 2018 in the following four databases: Pubmed Central, Science Direct, IEEE Xplore and MDPI. After removing unrelated articles, ones published in languages other than English, duplicate entries and other articles that did not fulfill the selection criteria, 778 papers were manually investigated and included in this review. A general overview of PD applications, devices used and aspects monitored for PD management is provided in this systematic review.
ContributorsDeb, Ranadeep (Author) / Ogras, Umit Y. (Thesis advisor) / Shill, Holly (Committee member) / Chakrabarti, Chaitali (Committee member) / Arizona State University (Publisher)
Created2019
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Description
Nearly 60% of the world population uses a mobile phone, which is typically powered by a system-on-chip (SoC). While the mobile platform capabilities range widely, responsiveness, long battery life and reliability are common design concerns that are crucial to remain competitive. Consequently, state-of-the-art mobile platforms have become highly heterogeneous by

Nearly 60% of the world population uses a mobile phone, which is typically powered by a system-on-chip (SoC). While the mobile platform capabilities range widely, responsiveness, long battery life and reliability are common design concerns that are crucial to remain competitive. Consequently, state-of-the-art mobile platforms have become highly heterogeneous by combining a powerful SoC with numerous other resources, including display, memory, power management IC, battery and wireless modems. Furthermore, the SoC itself is a heterogeneous resource that integrates many processing elements, such as CPU cores, GPU, video, image, and audio processors. Therefore, CPU cores do not dominate the platform power consumption under many application scenarios.

Competitive performance requires higher operating frequency, and leads to larger power consumption. In turn, power consumption increases the junction and skin temperatures, which have adverse effects on the device reliability and user experience. As a result, allocating the power budget among the major platform resources and temperature control have become fundamental consideration for mobile platforms. Dynamic thermal and power management algorithms address this problem by putting a subset of the processing elements or shared resources to sleep states, or throttling their frequencies. However, an adhoc approach could easily cripple the performance, if it slows down the performance-critical processing element. Furthermore, mobile platforms run a wide range of applications with time varying workload characteristics, unlike early generations, which supported only limited functionality. As a result, there is a need for adaptive power and performance management approaches that consider the platform as a whole, rather than focusing on a subset. Towards this need, our specific contributions include (a) a framework to dynamically select the Pareto-optimal frequency and active cores for the heterogeneous CPUs, such as ARM big.Little architecture, (b) a dynamic power budgeting approach for allocating optimal power consumption to the CPU and GPU using performance sensitivity models for each PE, (c) an adaptive GPU frame time sensitivity prediction model to aid power management algorithms, and (d) an online learning algorithm that constructs adaptive run-time models for non-stationary workloads.
ContributorsGupta, Ujjwala (Author) / Ogras, Umit Y. (Thesis advisor) / Chakrabarti, Chaitali (Committee member) / Kishinevsky, Michael (Committee member) / Dutt, Nikil (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Portable devices often require multiple power management IC (PMIC) to power different sub-modules, Li-ion batteries are well suited for portable devices because of its small size, high energy density and long life cycle. Since Li-ion battery is the major power source for portable device, fast and high-efficiency battery charging solution

Portable devices often require multiple power management IC (PMIC) to power different sub-modules, Li-ion batteries are well suited for portable devices because of its small size, high energy density and long life cycle. Since Li-ion battery is the major power source for portable device, fast and high-efficiency battery charging solution has become a major requirement in portable device application.

In the first part of dissertation, a high performance Li-ion switching battery charger is proposed. Cascaded two loop (CTL) control architecture is used for seamless CC-CV transition, time based technique is utilized to minimize controller area and power consumption. Time domain controller is implemented by using voltage controlled oscillator (VCO) and voltage controlled delay line (VCDL). Several efficiency improvement techniques such as segmented power-FET, quasi-zero voltage switching (QZVS) and switching frequency reduction are proposed. The proposed switching battery charger is able to provide maximum 2 A charging current and has an peak efficiency of 93.3%. By configure the charger as boost converter, the charger is able to provide maximum 1.5 A charging current while achieving 96.3% peak efficiency.

The second part of dissertation presents a digital low dropout regulator (DLDO) for system on a chip (SoC) in portable devices application. The proposed DLDO achieve fast transient settling time, lower undershoot/overshoot and higher PSR performance compared to state of the art. By having a good PSR performance, the proposed DLDO is able to power mixed signal load. To achieve a fast load transient response, a load transient detector (LTD) enables boost mode operation of the digital PI controller. The boost mode operation achieves sub microsecond settling time, and reduces the settling time by 50% to 250 ns, undershoot/overshoot by 35% to 250 mV and 17% to 125 mV without compromising the system stability.
ContributorsLim, Chai Yong (Author) / Kiaei, Sayfe (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Ogras, Umit Y. (Committee member) / Seo, Jae-Sun (Committee member) / Arizona State University (Publisher)
Created2018