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Description
Ever reducing time to market, along with short product lifetimes, has created a need to shorten the microprocessor design time. Verification of the design and its analysis are two major components of this design cycle. Design validation techniques can be broadly classified into two major categories: simulation based approaches and

Ever reducing time to market, along with short product lifetimes, has created a need to shorten the microprocessor design time. Verification of the design and its analysis are two major components of this design cycle. Design validation techniques can be broadly classified into two major categories: simulation based approaches and formal techniques. Simulation based microprocessor validation involves running millions of cycles using random or pseudo random tests and allows verification of the register transfer level (RTL) model against an architectural model, i.e., that the processor executes instructions as required. The validation effort involves model checking to a high level description or simulation of the design against the RTL implementation. Formal techniques exhaustively analyze parts of the design but, do not verify RTL against the architecture specification. The focus of this work is to implement a fully automated validation environment for a MIPS based radiation hardened microprocessor using simulation based approaches. The basic framework uses the classical validation approach in which the design to be validated is described in a Hardware Definition Language (HDL) such as VHDL or Verilog. To implement a simulation based approach a number of random or pseudo random tests are generated. The output of the HDL based design is compared against the one obtained from a "perfect" model implementing similar functionality, a mismatch in the results would thus indicate a bug in the HDL based design. Effort is made to design the environment in such a manner that it can support validation during different stages of the design cycle. The validation environment includes appropriate changes so as to support architecture changes which are introduced because of radiation hardening. The manner in which the validation environment is build is highly dependent on the specifications of the perfect model used for comparisons. This work implements the validation environment for two MIPS simulators as the reference model. Two bugs have been discovered in the RTL model, using simulation based approaches through the validation environment.
ContributorsSharma, Abhishek (Author) / Clark, Lawrence (Thesis advisor) / Holbert, Keith E. (Committee member) / Shrivastava, Aviral (Committee member) / Arizona State University (Publisher)
Created2011
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Description
Utilizing the Arizona State University's Performance Based Studies Research Group, and their PIPS program, a roofing materials manufacturing company can evaluate performance of representatives, products and contractors. Service life of the systems can be tracked and customer satisfaction measured it provides an objective viable tool for the consumer to choose

Utilizing the Arizona State University's Performance Based Studies Research Group, and their PIPS program, a roofing materials manufacturing company can evaluate performance of representatives, products and contractors. Service life of the systems can be tracked and customer satisfaction measured it provides an objective viable tool for the consumer to choose a quality product and contractor without the distractions of marketing, promises, or a salesman's hype. Facilities purchasing a new roof system, can benefit from the information gathered as a guide in making sound, value based decisions. Creating a historical, concise and accurate documentation of roofing systems is a benefit to all involved. The procurement process, installation and longevity of the roofing systems can be tracked and graded.
ContributorsGreenfeld, Larry (Author) / Kashiwagi, Dean T. (Thesis advisor) / Sullivan, Kenneth T. (Committee member) / Badger, William W. (Committee member) / Arizona State University (Publisher)
Created2013
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Description
While the piezoelectric effect has been around for some time, it has only recently caught interest as a potential sustainable energy harvesting device. Piezoelectric energy harvesting has been developed for shoes and panels, but has yet to be integrated into a marketable bicycle tire. For this thesis, the development and

While the piezoelectric effect has been around for some time, it has only recently caught interest as a potential sustainable energy harvesting device. Piezoelectric energy harvesting has been developed for shoes and panels, but has yet to be integrated into a marketable bicycle tire. For this thesis, the development and feasibility of a piezoelectric tire was done. This includes the development of a circuit that incorporates piezoceramic elements, energy harvesting circuitry, and an energy storage device. A single phase circuit was designed using an ac-dc diode rectifier. An electrolytic capacitor was used as the energy storage device. A financial feasibility was also done to determine targets for manufacturing cost and sales price. These models take into account market trends for high performance tires, economies of scale, and the possibility of government subsidies. This research will help understand the potential for the marketability of a piezoelectric energy harvesting tire that can create electricity for remote use. This study found that there are many obstacles that must be addressed before a piezoelectric tire can be marketed to the general public. The power output of this device is miniscule compared to an alkaline battery. In order for this device to approach the power output of an alkaline battery the weight of the device would also become an issue. Additionally this device is very costly compared to the average bicycle tire. Lastly, this device is extreme fragile and easily broken. In order for this device to become marketable the issues of power output, cost, weight, and durability must all be successfully overcome.
ContributorsMalotte, Christopher (Author) / Madakannan, Arunachalanadar (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell;

Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell; encapsulant/backsheet). Previous studies carried out at ASU's Photovoltaic Reliability Laboratory (ASU-PRL) showed that only negative voltage bias (positive grounded systems) adversely affects the performance of commonly available crystalline silicon modules. In previous studies, the surface conductivity of the glass surface was obtained using either conductive carbon layer extending from the glass surface to the frame or humidity inside an environmental chamber. This thesis investigates the influence of glass surface conductivity disruption on PV modules. In this study, conductive carbon was applied only on the module's glass surface without extending to the frame and the surface conductivity was disrupted (no carbon layer) at 2cm distance from the periphery of frame inner edges. This study was carried out under dry heat at two different temperatures (60 °C and 85 °C) and three different negative bias voltages (-300V, -400V, and -600V). To replicate closeness to the field conditions, half of the selected modules were pre-stressed under damp heat for 1000 hours (DH 1000) and the remaining half under 200 hours of thermal cycling (TC 200). When the surface continuity was disrupted by maintaining a 2 cm gap from the frame to the edge of the conductive layer, as demonstrated in this study, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a water repelling (hydrophobic) but high transmittance surface coating (such as Teflon) or modifying the frame/glass edges with water repellent properties.
ContributorsTatapudi, Sai Ravi Vasista (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Global photovoltaic (PV) module installation in 2018 is estimated to exceed 100 GW, and crystalline Si (c-Si) solar cell-based modules have a share more than 90% of the global PV market. To reduce the social cost of PV electricity, further developments in reliability of solar panels are expected. These will

Global photovoltaic (PV) module installation in 2018 is estimated to exceed 100 GW, and crystalline Si (c-Si) solar cell-based modules have a share more than 90% of the global PV market. To reduce the social cost of PV electricity, further developments in reliability of solar panels are expected. These will lead to realize longer module lifetime and reduced levelized cost of energy. As many as 86 failure modes are observed in PV modules [1] and series resistance increase is one of the major durability issues of all. Series resistance constitutes emitter sheet resistance, metal-semiconductor contact resistance, and resistance across the metal-solder ribbon. Solder bond degradation at the cell interconnect is one of the primary causes for increase in series resistance, which is also considered to be an invisible defect [1]. Combination of intermetallic compounds (IMC) formation during soldering and their growth due to solid state diffusion over its lifetime result in formation of weak interfaces between the solar cell and the interconnect. Thermal cycling under regular operating conditions induce thermo-mechanical fatigue over these weak interfaces resulting in contact reduction or loss. Contact reduction or loss leads to increase in series resistance which further manifests into power and fill factor loss. The degree of intermixing of metallic interfaces and contact loss depends on climatic conditions as temperature and humidity (moisture ingression into the PV module laminate) play a vital role in reaction kinetics of these layers. Modules from Arizona and Florida served as a good sample set to analyze the effects of hot and humid climatic conditions respectively. The results obtained in the current thesis quantifies the thickness of IMC formation from SEM-EDS profiles, where similar modules obtained from different climatic conditions were compared. The results indicate the thickness of the IMC and detachment degree to be growing with age and operating temperatures of the module. This can be seen in CuxSny IMC which is thicker in the case of Arizona module. The results obtained from FL

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aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ContributorsBuddha, Viswa Sai Pavan (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Alford, Terry (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the

Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the severity of each degradation mode. In this thesis multiple modules from three climate zones (Arizona, California and Colorado) were investigated for a single module glass/polymer construction (Siemens M55) to determine the degree to which they had degraded, and the main factors that contributed to that degradation. To explain the loss in power, various nondestructive and destructive techniques were used to indicate possible causes of loss in performance. This is a two-part thesis. Part 1 presents non-destructive test results and analysis and Part 2 presents destructive test results and analysis.
ContributorsChicca, Matthew (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Overhead high voltage transmission lines are widely used around the world to deliver power to customers because of their low losses and high transmission capability. Well-coordinated insulation systems are capable of withstanding lightning and switching surge voltages. However, flashover is a serious issue to insulation systems, especially if the insulator

Overhead high voltage transmission lines are widely used around the world to deliver power to customers because of their low losses and high transmission capability. Well-coordinated insulation systems are capable of withstanding lightning and switching surge voltages. However, flashover is a serious issue to insulation systems, especially if the insulator is covered by a pollution layer. Many experiments in the laboratory have been conducted to investigate this issue. Since most experiments are time-consuming and costly, good mathematical models could contribute to predicting the insulator flashover performance as well as guide the experiments. This dissertation proposes a new statistical model to calculate the flashover probability of insulators under different supply voltages and contamination levels. An insulator model with water particles in the air is simulated to analyze the effects of rain and mist on flashover performance in reality. Additionally, insulator radius and number of sheds affect insulator surface resistivity and leakage distance. These two factors are studied to improve the efficiency of insulator design. This dissertation also discusses the impact of insulator surface hydrophobicity on flashover voltage.

Because arc propagation is a stochastic process, an arc could travel on different paths based on the electric field distribution. Some arc paths jump between insulator sheds instead of travelling along the insulator surfaces. The arc jumping could shorten the leakage distance and intensify the electric field. Therefore, the probabilities of arc jumping at different locations of sheds are also calculated in this dissertation.

The new simulation model is based on numerical electric field calculation and random walk theory. The electric field is calculated by the variable-grid finite difference method. The random walk theory from the Monte Carlo Method is utilized to describe the random propagation process of arc growth. This model will permit insulator engineers to design the reasonable geometry of insulators, to reduce the flashover phenomena under a wide range of operating conditions.
ContributorsHe, Jiahong (Author) / Gorur, Ravi (Thesis advisor) / Ayyanar, Raja (Committee member) / Holbert, Keith E. (Committee member) / Karady, George G. (Committee member) / Arizona State University (Publisher)
Created2016
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Description
Underground transmission cables in power systems are less likely to experience electrical faults, however, resulting outage times are much greater in the event that a failure does occur. Unlike overhead lines, underground cables are not self-healing from flashover events. The faulted section must be located and repaired before the line

Underground transmission cables in power systems are less likely to experience electrical faults, however, resulting outage times are much greater in the event that a failure does occur. Unlike overhead lines, underground cables are not self-healing from flashover events. The faulted section must be located and repaired before the line can be put back into service. Since this will often require excavation of the underground duct bank, the procedure to repair the faulted section is both costly and time consuming. These added complications are the prime motivators for developing accurate and reliable ratings for underground cable circuits.

This work will review the methods by which power ratings, or ampacity, for underground cables are determined and then evaluate those ratings by making comparison with measured data taken from an underground 69 kV cable, which is part of the Salt River Project (SRP) power subtransmission system. The process of acquiring, installing, and commissioning the temperature monitoring system is covered in detail as well. The collected data are also used to evaluate typical assumptions made when determining underground cable ratings such as cable hot-spot location and ambient temperatures.

Analysis results show that the commonly made assumption that the deepest portion of an underground power cable installation will be the hot-spot location does not always hold true. It is shown that distributed cable temperature measurements can be used to locate the proper line segment to be used for cable ampacity calculations.
ContributorsStowers, Travis (Author) / Tylavsky, Daniel (Thesis advisor) / Karady, George G. (Committee member) / Holbert, Keith E. (Committee member) / Arizona State University (Publisher)
Created2015
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Description
With the growing importance of underground power systems and the need for greater reliability of the power supply, cable monitoring and accurate fault location detection has become an increasingly important issue. The presence of inherent random fluctuations in power system signals can be used to extract valuable information about the

With the growing importance of underground power systems and the need for greater reliability of the power supply, cable monitoring and accurate fault location detection has become an increasingly important issue. The presence of inherent random fluctuations in power system signals can be used to extract valuable information about the condition of system equipment. One such component is the power cable, which is the primary focus of this research.

This thesis investigates a unique methodology that allows online monitoring of an underground power cable. The methodology analyzes conventional power signals in the frequency domain to monitor the condition of a power cable.

First, the proposed approach is analyzed theoretically with the help of mathematical computations. Frequency domain analysis techniques are then used to compute the power spectral density (PSD) of the system signals. The importance of inherent noise in the system, a key requirement of this methodology, is also explained. The behavior of resonant frequencies, which are unique to every system, are then analyzed under different system conditions with the help of mathematical expressions.

Another important aspect of this methodology is its ability to accurately estimate cable fault location. The process is online and hence does not require the system to be disconnected from the grid. A single line to ground fault case is considered and the trend followed by the resonant frequencies for different fault positions is observed.

The approach is initially explained using theoretical calculations followed by simulations in MATLAB/Simulink. The validity of this technique is proved by comparing the results obtained from theory and simulation to actual measurement data.
ContributorsGovindarajan, Sudarshan (Author) / Holbert, Keith E. (Thesis advisor) / Heydt, Gerald (Committee member) / Karady, George G. (Committee member) / Arizona State University (Publisher)
Created2016
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Description
The primary goal of this thesis work is to determine the activation energy for encapsulant browning reaction of photovoltaic (PV) modules using outdoor field degradation data and indoor accelerated degradation data. For the outdoor field data, six PV modules fielded in Arizona (hot climate) over 21 years and four PV

The primary goal of this thesis work is to determine the activation energy for encapsulant browning reaction of photovoltaic (PV) modules using outdoor field degradation data and indoor accelerated degradation data. For the outdoor field data, six PV modules fielded in Arizona (hot climate) over 21 years and four PV modules fielded in New York (cold climate) over 18 years have been analyzed. All the ten modules were manufactured by the same manufacturer with glass/EVA/cell/EVA/back sheet construction. The activation energy for the encapsulant browning is calculated using the degradation rates of short-circuit current (Isc, the response parameter), weather data (temperature, humidity, and UV, the stress parameters) and different empirical rate models such as Arrhenius, Peck, Klinger and modified Peck models. For the indoor accelerated data, three sets of mini-modules with the same construction/manufacturer as that of the outdoor fielded modules were subjected indoor accelerated weathering stress and the test data were analyzed. The indoor accelerated test was carried out in a weathering chamber at the chamber temperature of 20°C, chamber relative humidity of 65%, and irradiance of 1 W/m2 at 340nm using a xenon arc lamp. Typically, to obtain activation energy, the test samples are stressed at two (or more) temperatures in two (or more) chambers. However, in this work, it has been attempted to do the acceleration testing of eight mini-modules at multiple temperatures using a single chamber. Multiple temperatures in a single chamber were obtained using thermal insulators on the back of the mini-modules. Depending on the thickness of the thermal insulators with constant solar gain from the xenon lamp, different temperatures on the test samples were achieved using a single weathering chamber. The Isc loss and temperature of the mini-modules were continuously monitored using a data logger. Also, the mini-modules were taken out every two weeks and various characterization tests such as IV, QE, UV fluorescence and reflectance were carried out. Activation energy from the indoor accelerated tests was calculated using the short circuit current degradation rate and operating temperatures of the mini-modules. The activation energy for the encapsulant browning obtained from the outdoor field data and the indoor accelerated data are compared and analyzed in this work.
ContributorsVeerendra Kumar, Deepak Jain (Author) / Tamizhmani, Govindasamy (Committee member) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2016