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- All Subjects: engineering
- Genre: Masters Thesis
- Creators: Tamizhmani, Govindasamy
- Member of: Theses and Dissertations
- Status: Published
Description
Photovoltaic (PV) systems are one of the next generation's renewable energy sources for our world energy demand. PV modules are highly reliable. However, in polluted environments, over time, they will collect grime and dust. There are also limited field data studies about soiling losses on PV modules. The study showed how important it is to investigate the effect of tilt angle on soiling. The study includes two sets of mini-modules. Each set has 9 PV modules tilted at 0, 5, 10, 15, 20, 23, 30, 33 and 40°. The first set called "Cleaned" was cleaned every other day. The second set called "Soiled" was never cleaned after the first day. The short circuit current, a measure of irradiance, and module temperature was monitored and recorded every two minutes over three months (January-March 2011). The data were analyzed to investigate the effect of tilt angle on daily and monthly soiling, and hence transmitted solar insolation and energy production by PV modules. The study shows that during the period of January through March 2011 there was an average loss due to soiling of approximately 2.02% for 0° tilt angle. Modules at tilt anlges 23° and 33° also have some insolation losses but do not come close to the module at 0° tilt angle. Tilt anlge 23° has approximately 1.05% monthly insolation loss, and 33° tilt angle has an insolation loss of approximately 0.96%. The soiling effect is present at any tilt angle, but the magnitude is evident: the flatter the solar module is placed the more energy it will lose.
ContributorsCano Valero, José (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Madakannan, Arunachalanadar (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2011
Description
The partially-depleted (PD) silicon Metal Semiconductor Field Effect Transistor (MESFET) is becoming more and more attractive for analog and RF applications due to its high breakdown voltage. Compared to conventional CMOS high voltage transistors, the silicon MESFET can be fabricated in commercial standard Silicon-on-Insulator (SOI) CMOS foundries without any change to the process. The transition frequency of the device is demonstrated to be 45GHz, which makes the MESFET suitable for applications in high power RF power amplifier designs. Also, high breakdown voltage and low turn-on resistance make it the ideal choice for switches in the switching regulator designs. One of the anticipated applications of the MESFET is for the pass device for a low dropout linear regulator. Conventional NMOS and PMOS linear regulators suffer from high dropout voltage, low bandwidth and poor stability issues. In contrast, the N-MESFET pass transistor can provide an ultra-low dropout voltage and high bandwidth without the need for an external compensation capacitor to ensure stability. In this thesis, the design theory and problems of the conventional linear regulators are discussed. N-MESFET low dropout regulators are evaluated and characterized. The error amplifier used a folded cascode architecture with gain boosting. The source follower topology is utilized as the buffer to sink the gate leakage current from the MESFET. A shunt-feedback transistor is added to reduce the output impedance and provide the current adaptively. Measurement results show that the dropout voltage is less than 150 mV for a 1A load current at 1.8V output. Radiation measurements were done for discrete MESFET and fully integrated LDO regulators, which demonstrate their radiation tolerance ability for aerospace applications.
ContributorsChen, Bo (Author) / Thornton, Trevor (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Goryll, Michael (Committee member) / Arizona State University (Publisher)
Created2013
Description
The object of this study was a 26 year old residential Photovoltaic (PV) monocrystalline silicon (c-Si) power plant, called Solar One, built by developer John F. Long in Phoenix, Arizona (a hot-dry field condition). The task for Arizona State University Photovoltaic Reliability Laboratory (ASU-PRL) graduate students was to evaluate the power plant through visual inspection, electrical performance, and infrared thermography. The purpose of this evaluation was to measure and understand the extent of degradation to the system along with the identification of the failure modes in this hot-dry climatic condition. This 4000 module bipolar system was originally installed with a 200 kW DC output of PV array (17 degree fixed tilt) and an AC output of 175 kVA. The system was shown to degrade approximately at a rate of 2.3% per year with no apparent potential induced degradation (PID) effect. The power plant is made of two arrays, the north array and the south array. Due to a limited time frame to execute this large project, this work was performed by two masters students (Jonathan Belmont and Kolapo Olakonu) and the test results are presented in two masters theses. This thesis presents the results obtained on the north array and the other thesis presents the results obtained on the south array. The resulting study showed that PV module design, array configuration, vandalism, installation methods and Arizona environmental conditions have had an effect on this system's longevity and reliability. Ultimately, encapsulation browning, higher series resistance (potentially due to solder bond fatigue) and non-cell interconnect ribbon breakages outside the modules were determined to be the primary causes for the power loss.
ContributorsBelmont, Jonathan (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Henderson, Mark (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2013
Description
Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell; encapsulant/backsheet). Previous studies carried out at ASU's Photovoltaic Reliability Laboratory (ASU-PRL) showed that only negative voltage bias (positive grounded systems) adversely affects the performance of commonly available crystalline silicon modules. In previous studies, the surface conductivity of the glass surface was obtained using either conductive carbon layer extending from the glass surface to the frame or humidity inside an environmental chamber. This thesis investigates the influence of glass surface conductivity disruption on PV modules. In this study, conductive carbon was applied only on the module's glass surface without extending to the frame and the surface conductivity was disrupted (no carbon layer) at 2cm distance from the periphery of frame inner edges. This study was carried out under dry heat at two different temperatures (60 °C and 85 °C) and three different negative bias voltages (-300V, -400V, and -600V). To replicate closeness to the field conditions, half of the selected modules were pre-stressed under damp heat for 1000 hours (DH 1000) and the remaining half under 200 hours of thermal cycling (TC 200). When the surface continuity was disrupted by maintaining a 2 cm gap from the frame to the edge of the conductive layer, as demonstrated in this study, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a water repelling (hydrophobic) but high transmittance surface coating (such as Teflon) or modifying the frame/glass edges with water repellent properties.
ContributorsTatapudi, Sai Ravi Vasista (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
Description
Building applied photovoltaics (BAPV) is a major application sector for photovoltaics (PV). Due to the negative temperature coefficient of power output, the performance of a PV module decreases as the temperature of the module increases. In hot climatic conditions, such as the summer in Arizona, the operating temperature of a BAPV module can reach as high as 90°C. Considering a typical 0.5%/°C power drop for crystalline silicon (c-Si) modules, a performance decrease of approximately 30% would be expected during peak summer temperatures due to the difference between rated temperature (25°C) and operating temperature (~90°C) of the modules. Also, in a worst-case scenario, such as partial shading of the PV cells of air gap-free BAPV modules, some of the components could attain temperatures that would be high enough to compromise the safety and functionality requirements of the module and its components. Based on the temperature and weather data collected over a year in Arizona, a mathematical thermal model has been developed and presented in this paper to predict module temperature for five different air gaps (0", 1", 2", 3", and 4"). For comparison, modules with a thermally-insulated (R30) back were evaluated to determine the worst-case scenario. This thesis also provides key technical details related to the specially-built, simulated rooftop structure; the mounting configuration of the PV modules on the rooftop structure; the LabVIEW program that was developed for data acquisition and the MATLAB program for developing the thermal models. In order to address the safety issue, temperature test results (obtained in accordance with IEC 61730-2 and UL 1703 safety standards) are presented and analyzed for nine different components of a PV module, i.e., the front glass, substrate/backsheet (polymer), PV cell, j-box ambient, j-box surface, positive terminal, backsheet inside j-box, field wiring, and diode. The temperature test results obtained for about 140 crystalline silicon modules from a large number of manufacturers who tested modules between 2006 and 2009 at ASU/TÜV-PTL were analyzed and presented in this paper under three test conditions, i.e., short-circuit, open-circuit, and short-circuit and shaded. Also, the nominal operating cell temperatures (NOCTs) of the BAPV modules and insulated-back PV modules are presented in this paper for use by BAPV module designers and installers.
ContributorsOh, Jaewon (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley R (Committee member) / Macia, Narciso F. (Committee member) / Arizona State University (Publisher)
Created2010
Description
This study introduces a new outdoor accelerated testing method called “Field Accelerated Stress Testing (FAST)” for photovoltaic (PV) modules performed at two
different climatic sites in Arizona (hot-dry) and Florida (hot-humid). FAST is a combined
accelerated test methodology that simultaneously accounts for all the field-specific stresses
and accelerates only key stresses, such as temperature, to forecast the failure modes by 2-
7 times in advance depending on the activation energy of the degradation mechanism (i.e.,
10th year reliability issues can potentially be predicted in the 2nd year itself for an
acceleration factor of 5). In this outdoor combined accelerated stress study, the
temperatures of test modules were increased (by 16-19℃ compared to control modules)
using thermal insulations on the back of the modules. All other conditions (ambient
temperature, humidity, natural sunlight, wind speed, wind direction, and tilt angle) were
left constant for both test modules (with back thermal insulation) and control modules
(without thermal insulation). In this study, a total of sixteen 4-cell modules with two different construction types (glass/glass [GG] and glass/backsheet [GB]) and two different encapsulant types (ethylene
vinyl acetate [EVA] and polyolefin elastomer [POE]), were investigated at both sites with
eight modules at each site (four insulated and four non-insulated modules at each site). All
the modules were extensively characterized before installation in the field and after field
exposure over two years. The methods used for characterizing the devices included I-V
(current-voltage curves), EL (electroluminescence), UVF (ultraviolet fluorescence), and
reflectance. The key findings of this study are: i) the GG modules tend to operate at a higher temperature (1-3℃) than the GB modules at both sites of Arizona and Florida (a lower
lifetime is expected for GG modules compared to GB modules); ii) the GG modules tend
to experience a higher level of encapsulant discoloration and grid finger degradation than
the GB modules at both sites (a higher level of the degradation rate is expected in GG
modules compared to GB modules); and, iii) the EVA-based modules tend to have a higher
level of discoloration and finger degradation compared to the POE-based modules at both
sites.
ContributorsThayumanavan, Rishi Gokul (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Phelan, Patrick (Thesis advisor) / Calhoun, Ronald (Committee member) / Arizona State University (Publisher)
Created2023
Description
With the demand growing for more sustainable forms of energy in replacement of fossil fuels, a major obstacle arises in the end-of life solar modules that are disposed of in landfills. Aside from the hazardous materials, silicon solar modules contain valuable and scarce materials such as silver. Silver is used in many industries and many applications therefore the recycling and recovering of it is financially beneficial. The purpose of this research was to achieve high purity and recovery of silver using hydrofluoric acid. The following work presents the feasibility of silver recovery through the process of leaching and electrowinning by examining the percent recovery and cathodic coulombic efficiency, followed by a chemical analysis to determine the purity. Varying conditions in leaching and electrowinning parameters are conducted in a synthetic solution to determine the effect on silver recovery and cathodic coulombic efficiency. It was determined that the silver recovery was dependent on the applied potential, system configuration and time. The system is capable of recovery rates of over 95% at -1 V. The system is further tested on solar cells to prove that silver can be recovered. There was over 99% purity from the experiments conducted in synthetic solution and from solar cells. Additionally, a circular chemistry is proposed that allows the reuse of hydrofluoric acid for leaching and electrowinning.
ContributorsChen, Theresa (Author) / Tao, Meng (Thesis advisor) / Deng, Shuguang (Committee member) / Goryll, Michael (Committee member) / Arizona State University (Publisher)
Created2024
Description
Global photovoltaic (PV) module installation in 2018 is estimated to exceed 100 GW, and crystalline Si (c-Si) solar cell-based modules have a share more than 90% of the global PV market. To reduce the social cost of PV electricity, further developments in reliability of solar panels are expected. These will lead to realize longer module lifetime and reduced levelized cost of energy. As many as 86 failure modes are observed in PV modules [1] and series resistance increase is one of the major durability issues of all. Series resistance constitutes emitter sheet resistance, metal-semiconductor contact resistance, and resistance across the metal-solder ribbon. Solder bond degradation at the cell interconnect is one of the primary causes for increase in series resistance, which is also considered to be an invisible defect [1]. Combination of intermetallic compounds (IMC) formation during soldering and their growth due to solid state diffusion over its lifetime result in formation of weak interfaces between the solar cell and the interconnect. Thermal cycling under regular operating conditions induce thermo-mechanical fatigue over these weak interfaces resulting in contact reduction or loss. Contact reduction or loss leads to increase in series resistance which further manifests into power and fill factor loss. The degree of intermixing of metallic interfaces and contact loss depends on climatic conditions as temperature and humidity (moisture ingression into the PV module laminate) play a vital role in reaction kinetics of these layers. Modules from Arizona and Florida served as a good sample set to analyze the effects of hot and humid climatic conditions respectively. The results obtained in the current thesis quantifies the thickness of IMC formation from SEM-EDS profiles, where similar modules obtained from different climatic conditions were compared. The results indicate the thickness of the IMC and detachment degree to be growing with age and operating temperatures of the module. This can be seen in CuxSny IMC which is thicker in the case of Arizona module. The results obtained from FL
ii
aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ii
aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ContributorsBuddha, Viswa Sai Pavan (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Alford, Terry (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2018
Description
In this project, current-voltage (I-V) and Deep Level Transient Spectroscopy (DLTS) measurements are used to (a) characterize the electrical properties of Nb/p-type Si Schottky barriers, (b) identify the concentration and physical character of the electrically active defects present in the depletion region, and (c) use thermal processing to reduce the concentration or eliminate the defects. Barrier height determinations using temperature-dependent I-V measurements indicate that the barrier height decreases from 0.50 eV to 0.48 eV for anneals above 200 C. The electrically-active defect concentration measured using DLTS (deep level transient spectroscopy) drops markedly after anneals at 250 C.
A significant increase in leakage currents is almost always observed in near-ideal devices upon annealing. In contrast, non-ideal devices dominated by leakage currents annealed at 150 C to 250 C exhibit a significant decrease in such currents.
A significant increase in leakage currents is almost always observed in near-ideal devices upon annealing. In contrast, non-ideal devices dominated by leakage currents annealed at 150 C to 250 C exhibit a significant decrease in such currents.
ContributorsKrishna Murthy, Madhu (Author) / Newman, Nathan (Thesis advisor) / Goryll, Michael (Committee member) / Alford, Terry (Committee member) / Arizona State University (Publisher)
Created2018
Characterization and analysis of long term field aged photovoltaic modules and encapsulant materials
Description
Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the severity of each degradation mode. In this thesis multiple modules from three climate zones (Arizona, California and Colorado) were investigated for a single module glass/polymer construction (Siemens M55) to determine the degree to which they had degraded, and the main factors that contributed to that degradation. To explain the loss in power, various nondestructive and destructive techniques were used to indicate possible causes of loss in performance. This is a two-part thesis. Part 1 presents non-destructive test results and analysis and Part 2 presents destructive test results and analysis.
ContributorsChicca, Matthew (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2015