Matching Items (3)
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- All Subjects: engineering
- All Subjects: Single Event Upset (SEU)
Description
The space environment comprises cosmic ray particles, heavy ions and high energy electrons and protons. Microelectronic circuits used in space applications such as satellites and space stations are prone to upsets induced by these particles. With transistor dimensions shrinking due to continued scaling, terrestrial integrated circuits are also increasingly susceptible to radiation upsets. Hence radiation hardening is a requirement for microelectronic circuits used in both space and terrestrial applications.
This work begins by exploring the different radiation hardened flip-flops that have been proposed in the literature and classifies them based on the different hardening techniques.
A reduced power delay element for the temporal hardening of sequential digital circuits is presented. The delay element single event transient tolerance is demonstrated by simulations using it in a radiation hardened by design master slave flip-flop (FF). Using the proposed delay element saves up to 25% total FF power at 50% activity factor. The delay element is used in the implementation of an 8-bit, 8051 designed in the TSMC 130 nm bulk CMOS.
A single impinging ionizing radiation particle is increasingly likely to upset multiple circuit nodes and produce logic transients that contribute to the soft error rate in most modern scaled process technologies. The design of flip-flops is made more difficult with increasing multi-node charge collection, which requires that charge storage and other sensitive nodes be separated so that one impinging radiation particle does not affect redundant nodes simultaneously. We describe a correct-by-construction design methodology to determine a-priori which hardened FF nodes must be separated, as well as a general interleaving scheme to achieve this separation. We apply the methodology to radiation hardened flip-flops and demonstrate optimal circuit physical organization for protection against multi-node charge collection.
Finally, the methodology is utilized to provide critical node separation for a new hardened flip-flop design that reduces the power and area by 31% and 35% respectively compared to a temporal FF with similar hardness. The hardness is verified and compared to other published designs via the proposed systematic simulation approach that comprehends multiple node charge collection and tests resiliency to upsets at all internal and input nodes. Comparison of the hardness, as measured by estimated upset cross-section, is made to other published designs. Additionally, the importance of specific circuit design aspects to achieving hardness is shown.
This work begins by exploring the different radiation hardened flip-flops that have been proposed in the literature and classifies them based on the different hardening techniques.
A reduced power delay element for the temporal hardening of sequential digital circuits is presented. The delay element single event transient tolerance is demonstrated by simulations using it in a radiation hardened by design master slave flip-flop (FF). Using the proposed delay element saves up to 25% total FF power at 50% activity factor. The delay element is used in the implementation of an 8-bit, 8051 designed in the TSMC 130 nm bulk CMOS.
A single impinging ionizing radiation particle is increasingly likely to upset multiple circuit nodes and produce logic transients that contribute to the soft error rate in most modern scaled process technologies. The design of flip-flops is made more difficult with increasing multi-node charge collection, which requires that charge storage and other sensitive nodes be separated so that one impinging radiation particle does not affect redundant nodes simultaneously. We describe a correct-by-construction design methodology to determine a-priori which hardened FF nodes must be separated, as well as a general interleaving scheme to achieve this separation. We apply the methodology to radiation hardened flip-flops and demonstrate optimal circuit physical organization for protection against multi-node charge collection.
Finally, the methodology is utilized to provide critical node separation for a new hardened flip-flop design that reduces the power and area by 31% and 35% respectively compared to a temporal FF with similar hardness. The hardness is verified and compared to other published designs via the proposed systematic simulation approach that comprehends multiple node charge collection and tests resiliency to upsets at all internal and input nodes. Comparison of the hardness, as measured by estimated upset cross-section, is made to other published designs. Additionally, the importance of specific circuit design aspects to achieving hardness is shown.
ContributorsShambhulingaiah, Sandeep (Author) / Clark, Lawrence (Thesis advisor) / Holbert, Keith E. (Committee member) / Seo, Jae sun (Committee member) / Allee, David (Committee member) / Arizona State University (Publisher)
Created2015
Description
This project examines the science of electric field sensing and completes experiments, gathering data to support its utility for various applications. The basic system consists of a transmitter, receiver, and lock-in amplifier. The primary goal of the study was to determine if such a system could detect a human disturbance, due to the capacitance of a human body, and such a thesis was supported. Much different results were obtained when a person disturbed the electric field transmitted by the system than when other types of objects, such as chairs and electronic devices, were placed in the field. In fact, there was a distinct difference between persons of varied sizes as well. This thesis goes through the basic design of the system and the process of experimental design for determining the capabilities of such an electric field sensing system.
ContributorsBranham, Breana Michelle (Author) / Allee, David (Thesis director) / Papandreou-Suppappola, Antonia (Committee member) / Phillips, Stephen (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor) / School of International Letters and Cultures (Contributor)
Created2013-05
Description
In-Band Full-Duplex (IBFD) can maximize the spectral resources and enable new types of technology, but generates self-interference (SI) that must be mitigated to enable practical applications. Analog domain SI cancellation (SIC), usually implemented as a digitally controlled adaptive filter, is one technique that is necessary to mitigate the interference below the noise floor. To maximize the efficiency and performance of the adaptive filter this thesis studies how key design choices impact the performance so that device designers can make better tradeoff decisions. Additionally, algorithms are introduced to maximize the SIC that incorporate the hardware constraints. The provided simulations show up to 45dB SIC with 7 bits of precision at 100MHz bandwidth.
ContributorsMorgenstern, Carl Willis (Author) / Bliss, Daniel W (Thesis advisor) / Herschfelt, Andrew (Committee member) / Papandreou-Suppappola, Antonia (Committee member) / Rong, Yu (Committee member) / Allee, David (Committee member) / Arizona State University (Publisher)
Created2023