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- Creators: Tamizhmani, Govindasamy
Description
This study introduces a new outdoor accelerated testing method called “Field Accelerated Stress Testing (FAST)” for photovoltaic (PV) modules performed at two
different climatic sites in Arizona (hot-dry) and Florida (hot-humid). FAST is a combined
accelerated test methodology that simultaneously accounts for all the field-specific stresses
and accelerates only key stresses, such as temperature, to forecast the failure modes by 2-
7 times in advance depending on the activation energy of the degradation mechanism (i.e.,
10th year reliability issues can potentially be predicted in the 2nd year itself for an
acceleration factor of 5). In this outdoor combined accelerated stress study, the
temperatures of test modules were increased (by 16-19℃ compared to control modules)
using thermal insulations on the back of the modules. All other conditions (ambient
temperature, humidity, natural sunlight, wind speed, wind direction, and tilt angle) were
left constant for both test modules (with back thermal insulation) and control modules
(without thermal insulation). In this study, a total of sixteen 4-cell modules with two different construction types (glass/glass [GG] and glass/backsheet [GB]) and two different encapsulant types (ethylene
vinyl acetate [EVA] and polyolefin elastomer [POE]), were investigated at both sites with
eight modules at each site (four insulated and four non-insulated modules at each site). All
the modules were extensively characterized before installation in the field and after field
exposure over two years. The methods used for characterizing the devices included I-V
(current-voltage curves), EL (electroluminescence), UVF (ultraviolet fluorescence), and
reflectance. The key findings of this study are: i) the GG modules tend to operate at a higher temperature (1-3℃) than the GB modules at both sites of Arizona and Florida (a lower
lifetime is expected for GG modules compared to GB modules); ii) the GG modules tend
to experience a higher level of encapsulant discoloration and grid finger degradation than
the GB modules at both sites (a higher level of the degradation rate is expected in GG
modules compared to GB modules); and, iii) the EVA-based modules tend to have a higher
level of discoloration and finger degradation compared to the POE-based modules at both
sites.
ContributorsThayumanavan, Rishi Gokul (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Phelan, Patrick (Thesis advisor) / Calhoun, Ronald (Committee member) / Arizona State University (Publisher)
Created2023
Description
Global photovoltaic (PV) module installation in 2018 is estimated to exceed 100 GW, and crystalline Si (c-Si) solar cell-based modules have a share more than 90% of the global PV market. To reduce the social cost of PV electricity, further developments in reliability of solar panels are expected. These will lead to realize longer module lifetime and reduced levelized cost of energy. As many as 86 failure modes are observed in PV modules [1] and series resistance increase is one of the major durability issues of all. Series resistance constitutes emitter sheet resistance, metal-semiconductor contact resistance, and resistance across the metal-solder ribbon. Solder bond degradation at the cell interconnect is one of the primary causes for increase in series resistance, which is also considered to be an invisible defect [1]. Combination of intermetallic compounds (IMC) formation during soldering and their growth due to solid state diffusion over its lifetime result in formation of weak interfaces between the solar cell and the interconnect. Thermal cycling under regular operating conditions induce thermo-mechanical fatigue over these weak interfaces resulting in contact reduction or loss. Contact reduction or loss leads to increase in series resistance which further manifests into power and fill factor loss. The degree of intermixing of metallic interfaces and contact loss depends on climatic conditions as temperature and humidity (moisture ingression into the PV module laminate) play a vital role in reaction kinetics of these layers. Modules from Arizona and Florida served as a good sample set to analyze the effects of hot and humid climatic conditions respectively. The results obtained in the current thesis quantifies the thickness of IMC formation from SEM-EDS profiles, where similar modules obtained from different climatic conditions were compared. The results indicate the thickness of the IMC and detachment degree to be growing with age and operating temperatures of the module. This can be seen in CuxSny IMC which is thicker in the case of Arizona module. The results obtained from FL
ii
aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ii
aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ContributorsBuddha, Viswa Sai Pavan (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Alford, Terry (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2018
Characterization and analysis of long term field aged photovoltaic modules and encapsulant materials
Description
Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the severity of each degradation mode. In this thesis multiple modules from three climate zones (Arizona, California and Colorado) were investigated for a single module glass/polymer construction (Siemens M55) to determine the degree to which they had degraded, and the main factors that contributed to that degradation. To explain the loss in power, various nondestructive and destructive techniques were used to indicate possible causes of loss in performance. This is a two-part thesis. Part 1 presents non-destructive test results and analysis and Part 2 presents destructive test results and analysis.
ContributorsChicca, Matthew (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2015
Description
The primary goal of this thesis work is to determine the activation energy for encapsulant browning reaction of photovoltaic (PV) modules using outdoor field degradation data and indoor accelerated degradation data. For the outdoor field data, six PV modules fielded in Arizona (hot climate) over 21 years and four PV modules fielded in New York (cold climate) over 18 years have been analyzed. All the ten modules were manufactured by the same manufacturer with glass/EVA/cell/EVA/back sheet construction. The activation energy for the encapsulant browning is calculated using the degradation rates of short-circuit current (Isc, the response parameter), weather data (temperature, humidity, and UV, the stress parameters) and different empirical rate models such as Arrhenius, Peck, Klinger and modified Peck models. For the indoor accelerated data, three sets of mini-modules with the same construction/manufacturer as that of the outdoor fielded modules were subjected indoor accelerated weathering stress and the test data were analyzed. The indoor accelerated test was carried out in a weathering chamber at the chamber temperature of 20°C, chamber relative humidity of 65%, and irradiance of 1 W/m2 at 340nm using a xenon arc lamp. Typically, to obtain activation energy, the test samples are stressed at two (or more) temperatures in two (or more) chambers. However, in this work, it has been attempted to do the acceleration testing of eight mini-modules at multiple temperatures using a single chamber. Multiple temperatures in a single chamber were obtained using thermal insulators on the back of the mini-modules. Depending on the thickness of the thermal insulators with constant solar gain from the xenon lamp, different temperatures on the test samples were achieved using a single weathering chamber. The Isc loss and temperature of the mini-modules were continuously monitored using a data logger. Also, the mini-modules were taken out every two weeks and various characterization tests such as IV, QE, UV fluorescence and reflectance were carried out. Activation energy from the indoor accelerated tests was calculated using the short circuit current degradation rate and operating temperatures of the mini-modules. The activation energy for the encapsulant browning obtained from the outdoor field data and the indoor accelerated data are compared and analyzed in this work.
ContributorsVeerendra Kumar, Deepak Jain (Author) / Tamizhmani, Govindasamy (Committee member) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2016
Description
As the photovoltaic (PV) power plants age in the field, the PV modules degrade and generate visible and invisible defects. A defect and statistical degradation rate analysis of photovoltaic (PV) power plants is presented in two-part thesis. The first part of the thesis deals with the defect analysis and the second part of the thesis deals with the statistical degradation rate analysis. In the first part, a detailed analysis on the performance or financial risk related to each defect found in multiple PV power plants across various climatic regions of the USA is presented by assigning a risk priority number (RPN). The RPN for all the defects in each PV plant is determined based on two databases: degradation rate database; defect rate database. In this analysis it is determined that the RPN for each plant is dictated by the technology type (crystalline silicon or thin-film), climate and age. The PV modules aging between 3 and 19 years in four different climates of hot-dry, hot-humid, cold-dry and temperate are investigated in this study.
In the second part, a statistical degradation analysis is performed to determine if the degradation rates are linear or not in the power plants exposed in a hot-dry climate for the crystalline silicon technologies. This linearity degradation analysis is performed using the data obtained through two methods: current-voltage method; metered kWh method. For the current-voltage method, the annual power degradation data of hundreds of individual modules in six crystalline silicon power plants of different ages is used. For the metered kWh method, a residual plot analysis using Winters’ statistical method is performed for two crystalline silicon plants of different ages. The metered kWh data typically consists of the signal and noise components. Smoothers remove the noise component from the data by taking the average of the current and the previous observations. Once this is done, a residual plot analysis of the error component is performed to determine the noise was successfully separated from the data by proving the noise is random.
In the second part, a statistical degradation analysis is performed to determine if the degradation rates are linear or not in the power plants exposed in a hot-dry climate for the crystalline silicon technologies. This linearity degradation analysis is performed using the data obtained through two methods: current-voltage method; metered kWh method. For the current-voltage method, the annual power degradation data of hundreds of individual modules in six crystalline silicon power plants of different ages is used. For the metered kWh method, a residual plot analysis using Winters’ statistical method is performed for two crystalline silicon plants of different ages. The metered kWh data typically consists of the signal and noise components. Smoothers remove the noise component from the data by taking the average of the current and the previous observations. Once this is done, a residual plot analysis of the error component is performed to determine the noise was successfully separated from the data by proving the noise is random.
ContributorsSundarajan, Prasanna (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2016
Description
The deposition of airborne dust, especially in desert conditions, is very problematic as it leads to significant loss of power of photovoltaic (PV) modules on a daily basis during the dry period. As such, PV testing laboratories around the world have been trying to set up soil deposition stations to artificially deposit soil layers and to simulate outdoor soiling conditions in an accelerated manner. This thesis is a part of a twin thesis. The first thesis, authored by Shanmukha Mantha, is associated with the designing of an artificial soiling station. The second thesis (this thesis), authored by Darshan Choudhary, is associated with the characterization of the deposited soil layers. The soil layers deposited on glass coupons and one-cell laminates are characterized and presented in this thesis. This thesis focuses on the characterizations of the soil layers obtained in several soiling cycles using various techniques including current-voltage (I-V), quantum efficiency (QE), compositional analysis and optical profilometry. The I-V characterization was carried out to determine the impact of soil layer on current and other performance parameters of PV devices. The QE characterization was carried out to determine the impact of wavelength dependent influence of soil type and thickness on the QE curves. The soil type was determined using the compositional analysis. The compositional data of the soil is critical to determine the adhesion properties of the soil layers on the surface of PV modules. The optical profilometry was obtained to determine the particle size and distribution. The soil layers deposited using two different deposition techniques were characterized. The two deposition techniques are designated as “dew” technique and “humidity” technique. For the same deposition time, the humidity method was determined to deposit the soil layer at lower rates as compared to the dew method. Two types of deposited soil layers were characterized. The first type layer was deposited using a reference soil called Arizona (AZ) dust. The second type layer was deposited using the soil which was collected from the surface of the modules installed outdoor in Arizona. The density of the layers deposited using the surface collected soil was determined to be lower than AZ dust based layers for the same number of deposition cycles.
ContributorsChoudhary, Darshan (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley Barney (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2016
Description
Encapsulant is a key packaging component of photovoltaic (PV) modules, which protects the solar cell from physical, environmental and electrical damages. Ethylene-vinyl acetate (EVA) is one of the major encapsulant materials used in the PV industry. This work focuses on indoor accelerated ultraviolet (UV) stress testing and characterization to investigate the EVA discoloration and delamination in PV modules by using various non-destructive characterization techniques, including current-voltage (IV) measurements, UV fluorescence (UVf) and colorimetry measurements. Mini-modules with glass/EVA/cell/EVA/backsheet construction were fabricated in the laboratory with two types of EVA, UV-cut EVA (UVC) and UV-pass EVA (UVP).
The accelerated UV testing was performed in a UV chamber equipped with UV lights at an ambient temperature of 50°C, little or no humidity and total UV dosage of 400 kWh/m2. The mini-modules were maintained at three different temperatures through UV light heating by placing different thickness of thermal insulation sheets over the backsheet. Also, prior to thermal insulation sheet placement, the backsheet and laminate edges were fully covered with aluminum tape to prevent oxygen diffusion into the module and hence the photobleaching reaction.
The characterization results showed that mini-modules with UV-cut EVA suffered from discoloration while the modules with UV-pass EVA suffered from delamination. UVf imaging technique has the capability to identify the discoloration region in the UVC modules in the very early stage when the discoloration is not visible to the naked eyes, whereas Isc measurement is unable to measure the performance loss until the color becomes visibly darker. YI also provides the direct evidence of yellowing in the encapsulant. As expected, the extent of degradation due to discoloration increases with the increase in module temperature. The Isc loss is dictated by both the regions – discolored area at the center and non-discolored area at the cell edges, whereas the YI is only determined at the discolored region due to low probe area. This led to the limited correlation between Isc and YI in UVC modules.
In case of UVP modules, UV radiation has caused an adverse impact on the interfacial adhesion between the EVA and solar cell, which was detected from UVf images and severe Isc loss. No change in YI confirms that the reason for Isc loss is not due to yellowing but the delamination.
Further, the activation energy of encapsulant discoloration was estimated by using Arrhenius model on two types of data, %Isc drop and ΔYI. The Ea determined from the change in YI data for the EVA encapsulant discoloration reaction without the influence of oxygen and humidity is 0.61 eV. Based on the activation energy determined in this work and hourly weather data of any site, the degradation rate for the encaspulant browning mode can be estimated.
The accelerated UV testing was performed in a UV chamber equipped with UV lights at an ambient temperature of 50°C, little or no humidity and total UV dosage of 400 kWh/m2. The mini-modules were maintained at three different temperatures through UV light heating by placing different thickness of thermal insulation sheets over the backsheet. Also, prior to thermal insulation sheet placement, the backsheet and laminate edges were fully covered with aluminum tape to prevent oxygen diffusion into the module and hence the photobleaching reaction.
The characterization results showed that mini-modules with UV-cut EVA suffered from discoloration while the modules with UV-pass EVA suffered from delamination. UVf imaging technique has the capability to identify the discoloration region in the UVC modules in the very early stage when the discoloration is not visible to the naked eyes, whereas Isc measurement is unable to measure the performance loss until the color becomes visibly darker. YI also provides the direct evidence of yellowing in the encapsulant. As expected, the extent of degradation due to discoloration increases with the increase in module temperature. The Isc loss is dictated by both the regions – discolored area at the center and non-discolored area at the cell edges, whereas the YI is only determined at the discolored region due to low probe area. This led to the limited correlation between Isc and YI in UVC modules.
In case of UVP modules, UV radiation has caused an adverse impact on the interfacial adhesion between the EVA and solar cell, which was detected from UVf images and severe Isc loss. No change in YI confirms that the reason for Isc loss is not due to yellowing but the delamination.
Further, the activation energy of encapsulant discoloration was estimated by using Arrhenius model on two types of data, %Isc drop and ΔYI. The Ea determined from the change in YI data for the EVA encapsulant discoloration reaction without the influence of oxygen and humidity is 0.61 eV. Based on the activation energy determined in this work and hourly weather data of any site, the degradation rate for the encaspulant browning mode can be estimated.
ContributorsDolia, Kshitiz (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Green, Matthew (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2018
Description
Solar photovoltaic (PV) deployment has grown at unprecedented rates since the early 2000s. As the global PV market increases, so will the volume of decommissioned PV panels. Growing PV panel waste presents a new environmental challenge, but also unprecedented opportunities to create value and pursue new economic avenues. Currently, in the United States, there are no regulations for governing the recycling of solar panels and the recycling process varies by the manufacturer. To bring in PV specific recycling regulations, whether the PV panels are toxic to the landfills, is to be determined. Per existing EPA regulations, PV panels are categorized as general waste and are subjected to a toxicity characterization leaching procedure (TCLP) to determine if it contains any toxic metals that can possibly leach into the landfill. In this thesis, a standardized procedure is developed for extracting samples from an end of life PV module. A literature review of the existing regulations in Europe and other countries is done. The sample extraction procedure is tested on a crystalline Si module to validate the method. The extracted samples are sent to an independent TCLP testing lab and the results are obtained. Image processing technique developed at ASU PRL is used to detect the particle size in a broken module and the size of samples sent is confirmed to follow the regulation.
ContributorsKrishnamurthy, Raghav (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2017
Description
Performance of photovoltaic (PV) modules decrease as the operating temperatures increase. In hot climatic conditions, the operating temperature can reach as high as 85°C for the rooftop modules. Considering a typical power drop of 0.5%/°C for crystalline silicon modules, a performance decrease of approximately 30% could be expected during peak summer seasons due to the difference between module rated temperature of 25°C and operating temperature of 85°C. Therefore, it is critical to accurately predict the temperature of the modules so the performance can be accurately predicted. The module operating temperature is based not only on the ambient and irradiance conditions but is also based on the thermal properties of module packaging materials. One of the key packaging materials that would influence the module operating temperature is the substrate, polymer backsheet or glass. In this study, the thermal influence of three different polymer backsheet substrates and one glass substrate has been investigated through five tasks:
1. Determination and modeling of substrate or module temperature of coupons using four different substrates (three backsheet materials and one glass material).
2. Determination and modeling of cell temperature of coupons using four different substrates (three backsheet materials and one glass material)
3. Determination of temperature difference between cell and individual substrates for coupons of all four substrates
4. Determination of NOCT (nominal operating cell temperature) of coupons using all four substrate materials
5. Comparison of operating temperature difference between backsheet substrate coupons.
All these five tasks have been executed using the specially constructed one-cell coupons with identical cells but with four different substrates. For redundancy, two coupons per substrate were constructed and investigated. This study has attempted to model the effect of thermal conductivity of backsheet material on the cell and backsheet temperatures.
1. Determination and modeling of substrate or module temperature of coupons using four different substrates (three backsheet materials and one glass material).
2. Determination and modeling of cell temperature of coupons using four different substrates (three backsheet materials and one glass material)
3. Determination of temperature difference between cell and individual substrates for coupons of all four substrates
4. Determination of NOCT (nominal operating cell temperature) of coupons using all four substrate materials
5. Comparison of operating temperature difference between backsheet substrate coupons.
All these five tasks have been executed using the specially constructed one-cell coupons with identical cells but with four different substrates. For redundancy, two coupons per substrate were constructed and investigated. This study has attempted to model the effect of thermal conductivity of backsheet material on the cell and backsheet temperatures.
ContributorsNatarajan Rammohan, Balamurali (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2017
Description
In the current photovoltaic (PV) industry, the O&M (operations and maintenance) personnel in the field primarily utilize three approaches to identify the underperforming or defective modules in a string: i) EL (electroluminescence) imaging of all the modules in the string; ii) IR (infrared) thermal imaging of all the modules in the string; and, iii) current-voltage (I-V) curve tracing of all the modules in the string. In the first and second approaches, the EL images are used to detect the modules with broken cells, and the IR images are used to detect the modules with hotspot cells, respectively. These two methods may identify the modules with defective cells only semi-qualitatively, but not accurately and quantitatively. The third method, I-V curve tracing, is a quantitative method to identify the underperforming modules in a string, but it is an extremely time consuming, labor-intensive, and highly ambient conditions dependent method. Since the I-V curves of individual modules in a string are obtained by disconnecting them individually at different irradiance levels, module operating temperatures, angle of incidences (AOI) and air-masses/spectra, all these measured curves are required to be translated to a single reporting condition (SRC) of a single irradiance, single temperature, single AOI and single spectrum. These translations are not only time consuming but are also prone to inaccuracy due to inherent issues in the translation models. Therefore, the current challenges in using the traditional I-V tracers are related to: i) obtaining I-V curves simultaneously of all the modules and substrings in a string at a single irradiance, operating temperature, irradiance spectrum and angle of incidence due to changing weather parameters and sun positions during the measurements, ii) safety of field personnel when disconnecting and reconnecting of cables in high voltage systems (especially field aged connectors), and iii) enormous time and hardship for the test personnel in harsh outdoor climatic conditions. In this thesis work, a non-contact I-V (NCIV) curve tracing tool has been integrated and implemented to address the above mentioned three challenges of the traditional I-V tracers.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
ContributorsMurali, Sanjay (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2020