Matching Items (40)
Filtering by
- All Subjects: Statistics
- All Subjects: solar
- Creators: Montgomery, Douglas C.
- Creators: Tamizhmani, Govindasamy
Description
Photovoltaic (PV) modules undergo performance degradation depending on climatic conditions, applications, and system configurations. The performance degradation prediction of PV modules is primarily based on Accelerated Life Testing (ALT) procedures. In order to further strengthen the ALT process, additional investigation of the power degradation of field aged PV modules in various configurations is required. A detailed investigation of 1,900 field aged (12-18 years) PV modules deployed in a power plant application was conducted for this study. Analysis was based on the current-voltage (I-V) measurement of all the 1,900 modules individually. I-V curve data of individual modules formed the basis for calculating the performance degradation of the modules. The percentage performance degradation and rates of degradation were compared to an earlier study done at the same plant. The current research was primarily focused on identifying the extent of potential induced degradation (PID) of individual modules with reference to the negative ground potential. To investigate this, the arrangement and connection of the individual modules/strings was examined in detail. The study also examined the extent of underperformance of every series string due to performance mismatch of individual modules in that string. The power loss due to individual module degradation and module mismatch at string level was then compared to the rated value.
ContributorsJaspreet Singh (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2011
Description
Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research, a new three dimensional model for tolerance transfer in manufacturing process planning is presented that is user friendly in the sense that it is built upon the Coordinate Measuring Machine (CMM) readings that are readily available in any decent manufacturing facility. This model can take care of datum reference change between non orthogonal datums (squeezed datums), non-linearly oriented datums (twisted datums) etc. Graph theoretic approach based upon ACIS, C++ and MFC is laid out to facilitate its implementation for automation of the model. A totally new approach to determining dimensions and tolerances for the manufacturing process plan is also presented. Secondly, a new statistical model for the statistical tolerance analysis based upon joint probability distribution of the trivariate normal distributed variables is presented. 4-D probability Maps have been developed in which the probability value of a point in space is represented by the size of the marker and the associated color. Points inside the part map represent the pass percentage for parts manufactured. The effect of refinement with form and orientation tolerance is highlighted by calculating the change in pass percentage with the pass percentage for size tolerance only. Delaunay triangulation and ray tracing algorithms have been used to automate the process of identifying the points inside and outside the part map. Proof of concept software has been implemented to demonstrate this model and to determine pass percentages for various cases. The model is further extended to assemblies by employing convolution algorithms on two trivariate statistical distributions to arrive at the statistical distribution of the assembly. Map generated by using Minkowski Sum techniques on the individual part maps is superimposed on the probability point cloud resulting from convolution. Delaunay triangulation and ray tracing algorithms are employed to determine the assembleability percentages for the assembly.
ContributorsKhan, M Nadeem Shafi (Author) / Phelan, Patrick E (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Farin, Gerald (Committee member) / Roberts, Chell (Committee member) / Henderson, Mark (Committee member) / Arizona State University (Publisher)
Created2011
Description
It is common in the analysis of data to provide a goodness-of-fit test to assess the performance of a model. In the analysis of contingency tables, goodness-of-fit statistics are frequently employed when modeling social science, educational or psychological data where the interest is often directed at investigating the association among multi-categorical variables. Pearson's chi-squared statistic is well-known in goodness-of-fit testing, but it is sometimes considered to produce an omnibus test as it gives little guidance to the source of poor fit once the null hypothesis is rejected. However, its components can provide powerful directional tests. In this dissertation, orthogonal components are used to develop goodness-of-fit tests for models fit to the counts obtained from the cross-classification of multi-category dependent variables. Ordinal categories are assumed. Orthogonal components defined on marginals are obtained when analyzing multi-dimensional contingency tables through the use of the QR decomposition. A subset of these orthogonal components can be used to construct limited-information tests that allow one to identify the source of lack-of-fit and provide an increase in power compared to Pearson's test. These tests can address the adverse effects presented when data are sparse. The tests rely on the set of first- and second-order marginals jointly, the set of second-order marginals only, and the random forest method, a popular algorithm for modeling large complex data sets. The performance of these tests is compared to the likelihood ratio test as well as to tests based on orthogonal polynomial components. The derived goodness-of-fit tests are evaluated with studies for detecting two- and three-way associations that are not accounted for by a categorical variable factor model with a single latent variable. In addition the tests are used to investigate the case when the model misspecification involves parameter constraints for large and sparse contingency tables. The methodology proposed here is applied to data from the 38th round of the State Survey conducted by the Institute for Public Policy and Michigan State University Social Research (2005) . The results illustrate the use of the proposed techniques in the context of a sparse data set.
ContributorsMilovanovic, Jelena (Author) / Young, Dennis (Thesis advisor) / Reiser, Mark R. (Thesis advisor) / Wilson, Jeffrey (Committee member) / Eubank, Randall (Committee member) / Yang, Yan (Committee member) / Arizona State University (Publisher)
Created2011
Description
Many longitudinal studies, especially in clinical trials, suffer from missing data issues. Most estimation procedures assume that the missing values are ignorable or missing at random (MAR). However, this assumption leads to unrealistic simplification and is implausible for many cases. For example, an investigator is examining the effect of treatment on depression. Subjects are scheduled with doctors on a regular basis and asked questions about recent emotional situations. Patients who are experiencing severe depression are more likely to miss an appointment and leave the data missing for that particular visit. Data that are not missing at random may produce bias in results if the missing mechanism is not taken into account. In other words, the missing mechanism is related to the unobserved responses. Data are said to be non-ignorable missing if the probabilities of missingness depend on quantities that might not be included in the model. Classical pattern-mixture models for non-ignorable missing values are widely used for longitudinal data analysis because they do not require explicit specification of the missing mechanism, with the data stratified according to a variety of missing patterns and a model specified for each stratum. However, this usually results in under-identifiability, because of the need to estimate many stratum-specific parameters even though the eventual interest is usually on the marginal parameters. Pattern mixture models have the drawback that a large sample is usually required. In this thesis, two studies are presented. The first study is motivated by an open problem from pattern mixture models. Simulation studies from this part show that information in the missing data indicators can be well summarized by a simple continuous latent structure, indicating that a large number of missing data patterns may be accounted by a simple latent factor. Simulation findings that are obtained in the first study lead to a novel model, a continuous latent factor model (CLFM). The second study develops CLFM which is utilized for modeling the joint distribution of missing values and longitudinal outcomes. The proposed CLFM model is feasible even for small sample size applications. The detailed estimation theory, including estimating techniques from both frequentist and Bayesian perspectives is presented. Model performance and evaluation are studied through designed simulations and three applications. Simulation and application settings change from correctly-specified missing data mechanism to mis-specified mechanism and include different sample sizes from longitudinal studies. Among three applications, an AIDS study includes non-ignorable missing values; the Peabody Picture Vocabulary Test data have no indication on missing data mechanism and it will be applied to a sensitivity analysis; the Growth of Language and Early Literacy Skills in Preschoolers with Developmental Speech and Language Impairment study, however, has full complete data and will be used to conduct a robust analysis. The CLFM model is shown to provide more precise estimators, specifically on intercept and slope related parameters, compared with Roy's latent class model and the classic linear mixed model. This advantage will be more obvious when a small sample size is the case, where Roy's model experiences challenges on estimation convergence. The proposed CLFM model is also robust when missing data are ignorable as demonstrated through a study on Growth of Language and Early Literacy Skills in Preschoolers.
ContributorsZhang, Jun (Author) / Reiser, Mark R. (Thesis advisor) / Barber, Jarrett (Thesis advisor) / Kao, Ming-Hung (Committee member) / Wilson, Jeffrey (Committee member) / St Louis, Robert D. (Committee member) / Arizona State University (Publisher)
Created2013
Description
Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has been done in the ALT area and optimal design for ALT is a major topic. This dissertation consists of three main studies. First, a methodology of finding optimal design for ALT with right censoring and interval censoring have been developed and it employs the proportional hazard (PH) model and generalized linear model (GLM) to simplify the computational process. A sensitivity study is also given to show the effects brought by parameters to the designs. Second, an extended version of I-optimal design for ALT is discussed and then a dual-objective design criterion is defined and showed with several examples. Also in order to evaluate different candidate designs, several graphical tools are developed. Finally, when there are more than one models available, different model checking designs are discussed.
ContributorsYang, Tao (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Borror, Connie (Committee member) / Rigdon, Steve (Committee member) / Arizona State University (Publisher)
Created2013
Description
ABSTRACT As the use of photovoltaic (PV) modules in large power plants continues to increase globally, more studies on degradation, reliability, failure modes, and mechanisms of field aged modules are needed to predict module life expectancy based on accelerated lifetime testing of PV modules. In this work, a 26+ year old PV power plant in Phoenix, Arizona has been evaluated for performance, reliability, and durability. The PV power plant, called Solar One, is owned and operated by John F. Long's homeowners association. It is a 200 kWdc, standard test conditions (STC) rated power plant comprised of 4000 PV modules or frameless laminates, in 100 panel groups (rated at 175 kWac). The power plant is made of two center-tapped bipolar arrays, the north array and the south array. Due to a limited time frame to execute this large project, this work was performed by two masters students (Jonathan Belmont and Kolapo Olakonu) and the test results are presented in two masters theses. This thesis presents the results obtained on the south array and the other thesis presents the results obtained on the north array. Each of these two arrays is made of four sub arrays, the east sub arrays (positive and negative polarities) and the west sub arrays (positive and negative polarities), making up eight sub arrays. The evaluation and analyses of the power plant included in this thesis consists of: visual inspection, electrical performance measurements, and infrared thermography. A possible presence of potential induced degradation (PID) due to potential difference between ground and strings was also investigated. Some installation practices were also studied and found to contribute to the power loss observed in this investigation. The power output measured in 2011 for all eight sub arrays at STC is approximately 76 kWdc and represents a power loss of 62% (from 200 kW to 76 kW) over 26+ years. The 2011 measured power output for the four south sub arrays at STC is 39 kWdc and represents a power loss of 61% (from 100 kW to 39 kW) over 26+ years. Encapsulation browning and non-cell interconnect ribbon breakages were determined to be the primary causes for the power loss.
ContributorsOlakonu, Kolapo (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
Description
Photovoltaic (PV) modules are typically rated at three test conditions: STC (standard test conditions), NOCT (nominal operating cell temperature) and Low E (low irradiance). The current thesis deals with the power rating of PV modules at twenty-three test conditions as per the recent International Electrotechnical Commission (IEC) standard of IEC 61853 – 1. In the current research, an automation software tool developed by a previous researcher of ASU – PRL (ASU Photovoltaic Reliability Laboratory) is validated at various stages. Also in the current research, the power rating of PV modules for four different manufacturers is carried out according to IEC 61853 – 1 standard using a new outdoor test method. The new outdoor method described in this thesis is very different from the one reported by a previous researcher of ASU – PRL. The new method was designed to reduce the labor hours in collecting the current-voltage ( I – V) curves at various temperatures and irradiance levels. The power matrices for all the four manufacturers were generated using the I – V data generated at different temperatures and irradiance levels and the translation procedures described in IEC 60891 standard. All the measurements were carried out on both clear and cloudy days using an automated 2 – axis tracker located at ASU – PRL, Mesa, Arizona. The modules were left on the 2 – axis tracker for 12 continuous days and the data was continuously and automatically collected for every two minutes from 6 am to 6 pm. In order to obtain the I – V data at wide range of temperatures and irradiance levels, four identical (or nearly identical) modules were simultaneously installed on the 2 – axis tracker with and without thermal insulators on the back of the modules and with and without mesh screens on the front of the modules. Several issues related to the automation software were uncovered and the required improvement in the software has been suggested. The power matrices for four manufacturers have been successfully generated using the new outdoor test method developed in this work. The data generated in this work has been extensively analyzed for accuracy and for performance efficiency comparison at various temperatures and irradiance levels.
ContributorsVemula, Meena Gupta (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Macia, Narcio F. (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
Description
Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a mixed model with a longitudinal database of test scores. There is concern, however, that missing values that are common in the longitudinal student scores can bias value-added assessments, especially when the models serve as a basis for personnel decisions -- such as promoting or dismissing teachers -- as they are being used in some states. Certain types of missing data require that the VAM be modeled jointly with the missingness process in order to obtain unbiased parameter estimates. This dissertation studies two problems. First, the flexibility and multimembership random effects structure of the generalized persistence model lead to computational challenges that have limited the model's availability. To this point, no methods have been developed for scalable maximum likelihood estimation of the model. An EM algorithm to compute maximum likelihood estimates efficiently is developed, making use of the sparse structure of the random effects and error covariance matrices. The algorithm is implemented in the package GPvam in R statistical software. Illustrations of the gains in computational efficiency achieved by the estimation procedure are given. Furthermore, to address the presence of potentially nonignorable missing data, a flexible correlated random effects model is developed that extends the generalized persistence model to jointly model the test scores and the missingness process, allowing the process to depend on both students and teachers. The joint model gives the ability to test the sensitivity of the VAM to the presence of nonignorable missing data. Estimation of the model is challenging due to the non-hierarchical dependence structure and the resulting intractable high-dimensional integrals. Maximum likelihood estimation of the model is performed using an EM algorithm with fully exponential Laplace approximations for the E step. The methods are illustrated with data from university calculus classes and with data from standardized test scores from an urban school district.
ContributorsKarl, Andrew (Author) / Lohr, Sharon L (Thesis advisor) / Yang, Yan (Thesis advisor) / Kao, Ming-Hung (Committee member) / Montgomery, Douglas C. (Committee member) / Wilson, Jeffrey R (Committee member) / Arizona State University (Publisher)
Created2012
Description
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but the data generated and their analysis is for high performance avionics. Avionics equipment typically requires 20 years expected life by aircraft equipment manufacturers and therefore ALT is the only practical way of performing life test estimates. Both thermal and vibration ALT induced failure are performed and analyzed to resolve industry questions relating to the introduction of lead-free solder product and processes into high reliability avionics. In chapter 2, thermal ALT using an industry standard failure machine implementing Interconnect Stress Test (IST) that simulates circuit board life data is compared to real production failure data by likelihood ratio tests to arrive at a mechanical theory. This mechanical theory results in a statistically equivalent energy bound such that failure distributions below a specific energy level are considered to be from the same distribution thus allowing testers to quantify parameter setting in IST prior to life testing. In chapter 3, vibration ALT comparing tin-lead and lead-free circuit board solder designs involves the use of the likelihood ratio (LR) test to assess both complete failure data and S-N curves to present methods for analyzing data. Failure data is analyzed using Regression and two-way analysis of variance (ANOVA) and reconciled with the LR test results that indicating that a costly aging pre-process may be eliminated in certain cases. In chapter 4, vibration ALT for side-by-side tin-lead and lead-free solder black box designs are life tested. Commercial models from strain data do not exist at the low levels associated with life testing and need to be developed because testing performed and presented here indicate that both tin-lead and lead-free solders are similar. In addition, earlier failures due to vibration like connector failure modes will occur before solder interconnect failures.
ContributorsJuarez, Joseph Moses (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie M. (Thesis advisor) / Gel, Esma (Committee member) / Mignolet, Marc (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2012
Description
Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is essential to identifying processing issues, improving quality, and meeting customer demand in the industry. However, the complicated fabrication process, the massive amount of data collected, and the number of models available make yield modeling a complex and challenging task. This work presents modeling strategies to forecast yield using generalized linear models (GLMs) based on defect metrology data. The research is divided into three main parts. First, the data integration and aggregation necessary for model building are described, and GLMs are constructed for yield forecasting. This technique yields results at both the die and the wafer levels, outperforms existing models found in the literature based on prediction errors, and identifies significant factors that can drive process improvement. This method also allows the nested structure of the process to be considered in the model, improving predictive capabilities and violating fewer assumptions. To account for the random sampling typically used in fabrication, the work is extended by using generalized linear mixed models (GLMMs) and a larger dataset to show the differences between batch-specific and population-averaged models in this application and how they compare to GLMs. These results show some additional improvements in forecasting abilities under certain conditions and show the differences between the significant effects identified in the GLM and GLMM models. The effects of link functions and sample size are also examined at the die and wafer levels. The third part of this research describes a methodology for integrating classification and regression trees (CART) with GLMs. This technique uses the terminal nodes identified in the classification tree to add predictors to a GLM. This method enables the model to consider important interaction terms in a simpler way than with the GLM alone, and provides valuable insight into the fabrication process through the combination of the tree structure and the statistical analysis of the GLM.
ContributorsKrueger, Dana Cheree (Author) / Montgomery, Douglas C. (Thesis advisor) / Fowler, John (Committee member) / Pan, Rong (Committee member) / Pfund, Michele (Committee member) / Arizona State University (Publisher)
Created2011