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- All Subjects: energy
- Creators: Rogers, Bradley
Description
The prevalence of renewable generation will increase in the next several decades and offset conventional generation more and more. Yet this increase is not coming without challenges. Solar, wind, and even some water resources are intermittent and unpredictable, and thereby create scheduling challenges due to their inherent “uncontrolled” nature. To effectively manage these distributed renewable assets, new control algorithms must be developed for applications including energy management, bridge power, and system stability. This can be completed through a centralized control center though efforts are being made to parallel the control architecture with the organization of the renewable assets themselves—namely, distributed controls. Building energy management systems are being employed to control localized energy generation, storage, and use to reduce disruption on the net utility load. One such example is VOLTTRONTM, an agent-based platform for building energy control in real time. In this thesis, algorithms developed in VOLTTRON simulate a home energy management system that consists of a solar PV array, a lithium-ion battery bank, and the grid. Dispatch strategies are implemented to reduce energy charges from overall consumption ($/kWh) and demand charges ($/kW). Dispatch strategies for implementing storage devices are tuned on a month-to-month basis to provide a meaningful economic advantage under simulated scenarios to explore algorithm sensitivity to changing external factors. VOLTTRON agents provide automated real-time optimization of dispatch strategies to efficiently manage energy supply and demand, lower consumer costs associated with energy usage, and reduce load on the utility grid.
ContributorsCardwell, Joseph (Author) / Johnson, Nathan (Thesis advisor) / Rogers, Bradley (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2015
Description
This is a two part thesis:
Part 1 of this thesis determines the most dominant failure modes of field aged photovoltaic (PV) modules using experimental data and statistical analysis, FMECA (Failure Mode, Effect, and Criticality Analysis). The failure and degradation modes of about 5900 crystalline-Si glass/polymer modules fielded for 6 to 16 years in three different photovoltaic (PV) power plants with different mounting systems under the hot-dry desert climate of Arizona are evaluated. A statistical reliability tool, FMECA that uses Risk Priority Number (RPN) is performed for each PV power plant to determine the dominant failure modes in the modules by means of ranking and prioritizing the modes. This study on PV power plants considers all the failure and degradation modes from both safety and performance perspectives, and thus, comes to the conclusion that solder bond fatigue/failure with/without gridline/metallization contact fatigue/failure is the most dominant failure mode for these module types in the hot-dry desert climate of Arizona.
Part 2 of this thesis determines the best method to compute degradation rates of PV modules. Three different PV systems were evaluated to compute degradation rates using four methods and they are: I-V measurement, metered kWh, performance ratio (PR) and performance index (PI). I-V method, being an ideal method for degradation rate computation, were compared to the results from other three methods. The median degradation rates computed from kWh method were within ±0.15% from I-V measured degradation rates (0.9-1.37 %/year of three models). Degradation rates from the PI method were within ±0.05% from the I-V measured rates for two systems but the calculated degradation rate was remarkably different (±1%) from the I-V method for the third system. The degradation rate from the PR method was within ±0.16% from the I-V measured rate for only one system but were remarkably different (±1%) from the I-V measured rate for the other two systems. Thus, it was concluded that metered raw kWh method is the best practical method, after I-V method and PI method (if ground mounted POA insolation and other weather data are available) for degradation computation as this method was found to be fairly accurate, easy, inexpensive, fast and convenient.
Part 1 of this thesis determines the most dominant failure modes of field aged photovoltaic (PV) modules using experimental data and statistical analysis, FMECA (Failure Mode, Effect, and Criticality Analysis). The failure and degradation modes of about 5900 crystalline-Si glass/polymer modules fielded for 6 to 16 years in three different photovoltaic (PV) power plants with different mounting systems under the hot-dry desert climate of Arizona are evaluated. A statistical reliability tool, FMECA that uses Risk Priority Number (RPN) is performed for each PV power plant to determine the dominant failure modes in the modules by means of ranking and prioritizing the modes. This study on PV power plants considers all the failure and degradation modes from both safety and performance perspectives, and thus, comes to the conclusion that solder bond fatigue/failure with/without gridline/metallization contact fatigue/failure is the most dominant failure mode for these module types in the hot-dry desert climate of Arizona.
Part 2 of this thesis determines the best method to compute degradation rates of PV modules. Three different PV systems were evaluated to compute degradation rates using four methods and they are: I-V measurement, metered kWh, performance ratio (PR) and performance index (PI). I-V method, being an ideal method for degradation rate computation, were compared to the results from other three methods. The median degradation rates computed from kWh method were within ±0.15% from I-V measured degradation rates (0.9-1.37 %/year of three models). Degradation rates from the PI method were within ±0.05% from the I-V measured rates for two systems but the calculated degradation rate was remarkably different (±1%) from the I-V method for the third system. The degradation rate from the PR method was within ±0.16% from the I-V measured rate for only one system but were remarkably different (±1%) from the I-V measured rate for the other two systems. Thus, it was concluded that metered raw kWh method is the best practical method, after I-V method and PI method (if ground mounted POA insolation and other weather data are available) for degradation computation as this method was found to be fairly accurate, easy, inexpensive, fast and convenient.
ContributorsShrestha, Sanjay (Author) / Tamizhmani, Govindsamy (Thesis advisor) / Srinivasan, Devrajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2014
Description
In the current photovoltaic (PV) industry, the O&M (operations and maintenance) personnel in the field primarily utilize three approaches to identify the underperforming or defective modules in a string: i) EL (electroluminescence) imaging of all the modules in the string; ii) IR (infrared) thermal imaging of all the modules in the string; and, iii) current-voltage (I-V) curve tracing of all the modules in the string. In the first and second approaches, the EL images are used to detect the modules with broken cells, and the IR images are used to detect the modules with hotspot cells, respectively. These two methods may identify the modules with defective cells only semi-qualitatively, but not accurately and quantitatively. The third method, I-V curve tracing, is a quantitative method to identify the underperforming modules in a string, but it is an extremely time consuming, labor-intensive, and highly ambient conditions dependent method. Since the I-V curves of individual modules in a string are obtained by disconnecting them individually at different irradiance levels, module operating temperatures, angle of incidences (AOI) and air-masses/spectra, all these measured curves are required to be translated to a single reporting condition (SRC) of a single irradiance, single temperature, single AOI and single spectrum. These translations are not only time consuming but are also prone to inaccuracy due to inherent issues in the translation models. Therefore, the current challenges in using the traditional I-V tracers are related to: i) obtaining I-V curves simultaneously of all the modules and substrings in a string at a single irradiance, operating temperature, irradiance spectrum and angle of incidence due to changing weather parameters and sun positions during the measurements, ii) safety of field personnel when disconnecting and reconnecting of cables in high voltage systems (especially field aged connectors), and iii) enormous time and hardship for the test personnel in harsh outdoor climatic conditions. In this thesis work, a non-contact I-V (NCIV) curve tracing tool has been integrated and implemented to address the above mentioned three challenges of the traditional I-V tracers.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
ContributorsMurali, Sanjay (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2020
Description
The popularity of solar photovoltaic (PV) energy is growing across the globe with more than 500 GW installed in 2018 with a capacity of 640 GW in 2019. Improved PV module reliability minimizes the levelized cost of energy. Studying and accelerating encapsulant browning and solder bond degradation—two of the most commonly observed degradation modes in the field—in a lab requires replicating the stress conditions that induce the same field degradation modes in a controlled accelerated environment to reduce testing time.
Accelerated testing is vital in learning about the reliability of solar PV modules. The unique streamlined approach taken saves time and resources with a statistically significant number of samples being tested in one chamber under multiple experimental stress conditions that closely mirror field conditions that induce encapsulant browning and solder bond degradation. With short circuit current (Isc) and series resistance (Rs) degradation data sets at multiple temperatures, the activation energies (Ea) for encapsulant browning and solder bond degradation was calculated.
Regular degradation was replaced by the wear-out stages of encapsulant browning and solder bond degradation by subjecting two types of field-aged modules to further accelerated testing. For browning, the Ea calculated through the Arrhenius model was 0.37 ± 0.17 eV and 0.71 ± 0.07 eV. For solder bond degradation, the Arrhenius model was used to calculate an Ea of 0.12 ± 0.05 eV for solder with 2wt% Ag and 0.35 ± 0.04 eV for Sn60Pb40 solder.
To study the effect of types of encapsulant, backsheet, and solder on encapsulant browning and solder bond degradation, 9-cut-cell samples maximizing available data points while minimizing resources underwent accelerated tests described for modules. A ring-like browning feature was observed in samples with UV pass EVA above and UV cut EVA below the cells. The backsheet permeability influences the extent of oxygen photo-bleaching. In samples with solder bond degradation, increased bright spots and cell darkening resulted in increased Rs. Combining image processing with fluorescence imaging and electroluminescence imaging would yield great insight into the two degradation modes.
Accelerated testing is vital in learning about the reliability of solar PV modules. The unique streamlined approach taken saves time and resources with a statistically significant number of samples being tested in one chamber under multiple experimental stress conditions that closely mirror field conditions that induce encapsulant browning and solder bond degradation. With short circuit current (Isc) and series resistance (Rs) degradation data sets at multiple temperatures, the activation energies (Ea) for encapsulant browning and solder bond degradation was calculated.
Regular degradation was replaced by the wear-out stages of encapsulant browning and solder bond degradation by subjecting two types of field-aged modules to further accelerated testing. For browning, the Ea calculated through the Arrhenius model was 0.37 ± 0.17 eV and 0.71 ± 0.07 eV. For solder bond degradation, the Arrhenius model was used to calculate an Ea of 0.12 ± 0.05 eV for solder with 2wt% Ag and 0.35 ± 0.04 eV for Sn60Pb40 solder.
To study the effect of types of encapsulant, backsheet, and solder on encapsulant browning and solder bond degradation, 9-cut-cell samples maximizing available data points while minimizing resources underwent accelerated tests described for modules. A ring-like browning feature was observed in samples with UV pass EVA above and UV cut EVA below the cells. The backsheet permeability influences the extent of oxygen photo-bleaching. In samples with solder bond degradation, increased bright spots and cell darkening resulted in increased Rs. Combining image processing with fluorescence imaging and electroluminescence imaging would yield great insight into the two degradation modes.
ContributorsGopalakrishna, Hamsini (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Hacke, Peter (Committee member) / Arizona State University (Publisher)
Created2020