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- All Subjects: energy
- Creators: Tamizhmani, Govindasamy
- Member of: Theses and Dissertations
Description
Given the growing market in solar energy, specifically by the thin-film technologies, it is imperative that adequate and accurate standards be developed for these newer photovoltaic devices. Cadmium Telluride, CdTe, one of the major players in the thin-film PV industry is currently rated and certified using standards that have been developed under the context of older technologies. The behavior of CdTe has been shown to be unique enough to suggesting that standards be revised. In this research, methods built on previous industry and independent studies are used to identify these unique behaviors. As well new methods are developed to further characterize CdTe modules in the context of current standards. Clear transient and meta-stable behavior is identified across modules from four different commercial manufacturers. Conclusions drawn from this study show illumination and temperature hysteresis effects on module ratings. Furthermore, suggestions for further study are given that could be used to define parameters for any reexamination of module standards.
ContributorsPetersen, Chad (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Macia, Narciso (Committee member) / Munukutla, Lakshmi (Committee member) / Arizona State University (Publisher)
Created2010
Description
Solar photovoltaic (PV) generation has seen significant growth in 2021, with an increase of around 22% and exceeding 1000 TWh. However, this has also led to reliability and durability issues, particularly potential induced degradation (PID), which can reduce module output by up to 30%. This study uses cell- and module-level analysis to investigate the impact of superstrate, encapsulant, and substrate on PID.The influence of different substrates and encapsulants is studied using one-cell modules, showing that substrates with poor water-blocking properties can worsen PID, and encapsulants with lower volumetric resistance can conduct easily under damp conditions, enabling PID mechanisms (results show maximum degradation of 9%). Applying an anti-soiling coating on the front glass (superstrate) reduces PID by nearly 53%. Typical superstrates have sodium which accelerates the PID process, and therefore, using such coatings can lessen the PID problem.
At the module level, the study examines the influence of weakened interface adhesion strengths in traditional Glass-Backsheet (GB) and emerging Glass-Glass (GG) (primarily bifacial modules) constructions. The findings show nearly 64% more power degradation in GG modules than in GB. Moreover, the current methods for detecting PID use new modules, which can give inaccurate information instead of DH-stressed modules for PID testing, as done in this work.
A comprehensive PID susceptibility analysis for multiple fresh bifacial constructions shows significant degradation from 20 to 50% in various constructions. The presence of glass as the substrate exacerbates the PID problem due to more ionic activity available from the two glass sides. Recovery experiments are also conducted to understand the extent of the PID issue.
Overall, this study identifies, studies, and explains the impact of superstrate, substrate, and encapsulant on the underlying PID mechanisms. Various pre- and post-stress characterization tests, including light and dark current-voltage (I-V) tests, electroluminescence (EL) imaging, infrared (IR) imaging, and UV fluorescence (UVF) imaging, are used to evaluate the findings. This study is significant as it provides insights into the PID issues in solar PV systems, which can help improve their performance and reliability.
ContributorsMahmood, Farrukh ibne (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Oh, Jaewon (Committee member) / Rajadas, John (Committee member) / Arizona State University (Publisher)
Created2023
Description
A photovoltaic (PV) module is a series and parallel connection of multiple PV cells; defects in any cell can cause module power to drop. Similarly, a photovoltaic system is a series and parallel connection of multiple modules, and any low-performing module in the PV system can decrease the system output power. Defects in a solar cell include, but not limited to, the presence of cracks, potential induced degradation (PID), delamination, corrosion, and solder bond degradation. State-of-the-art characterization techniques to identify the defective cells in a module and defective module in a string are i) Current-voltage (IV) curve tracing, ii) Electroluminescence (EL) imaging, and iii) Infrared (IR) imaging. Shortcomings of these techniques include i) unsafe connection and disconnection need to be made with high voltage electrical cables, and ii) labor and time intensive disconnection of the photovoltaic strings from the system.This work presents a non-contact characterization technique to address the above two shortcomings. This technique uses a non-contact electrostatic voltmeter (ESV) along with a probe sensor to measure the surface potential of individual solar cells in a commercial module and the modules in a string in both off-grid and grid-connected systems. Unlike the EL approach, the ESV setup directly measures the surface potential by sensing the electric field lines that are present on the surface of the solar cell.
The off-grid testing of ESV on individual cells and multicells in crystalline silicon (c-Si) modules and on individual cells in cadmium telluride (CdTe) modules and individual modules in a CdTe string showed less than 2% difference in open circuit voltage compared to the voltmeter values. In addition, surface potential mapping of the defective cracked cells in a multicell module using ESV identified the dark, grey, and bright areas of EL images precisely at the exact locations shown by the EL characterization.
The on-grid testing of ESV measured the individual module voltages at maximum power point (Vmpp) and quantitatively identified the exact PID-affected module in the entire system. In addition, the poor-performing non-PID modules of a grid-connected PV system were also identified using the ESV technique.
ContributorsRaza, Hamza Ahmad (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Kiaei, Sayfe (Committee member) / Bakkaloglu, Bertan (Committee member) / Hacke, Peter (Committee member) / Arizona State University (Publisher)
Created2023
Description
In the current photovoltaic (PV) industry, the O&M (operations and maintenance) personnel in the field primarily utilize three approaches to identify the underperforming or defective modules in a string: i) EL (electroluminescence) imaging of all the modules in the string; ii) IR (infrared) thermal imaging of all the modules in the string; and, iii) current-voltage (I-V) curve tracing of all the modules in the string. In the first and second approaches, the EL images are used to detect the modules with broken cells, and the IR images are used to detect the modules with hotspot cells, respectively. These two methods may identify the modules with defective cells only semi-qualitatively, but not accurately and quantitatively. The third method, I-V curve tracing, is a quantitative method to identify the underperforming modules in a string, but it is an extremely time consuming, labor-intensive, and highly ambient conditions dependent method. Since the I-V curves of individual modules in a string are obtained by disconnecting them individually at different irradiance levels, module operating temperatures, angle of incidences (AOI) and air-masses/spectra, all these measured curves are required to be translated to a single reporting condition (SRC) of a single irradiance, single temperature, single AOI and single spectrum. These translations are not only time consuming but are also prone to inaccuracy due to inherent issues in the translation models. Therefore, the current challenges in using the traditional I-V tracers are related to: i) obtaining I-V curves simultaneously of all the modules and substrings in a string at a single irradiance, operating temperature, irradiance spectrum and angle of incidence due to changing weather parameters and sun positions during the measurements, ii) safety of field personnel when disconnecting and reconnecting of cables in high voltage systems (especially field aged connectors), and iii) enormous time and hardship for the test personnel in harsh outdoor climatic conditions. In this thesis work, a non-contact I-V (NCIV) curve tracing tool has been integrated and implemented to address the above mentioned three challenges of the traditional I-V tracers.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
ContributorsMurali, Sanjay (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2020
Description
The main objective of this research is to develop reliability assessment methodologies to quantify the effect of various environmental factors on photovoltaic (PV) module performance degradation. The manufacturers of these photovoltaic modules typically provide a warranty level of about 25 years for 20% power degradation from the initial specified power rating. To quantify the reliability of such PV modules, the Accelerated Life Testing (ALT) plays an important role. But there are several obstacles that needs to be tackled to conduct such experiments, since there has not been enough historical field data available. Even if some time-series performance data of maximum output power (Pmax) is available, it may not be useful to develop failure/degradation mode-specific accelerated tests. This is because, to study the specific failure modes, it is essential to use failure mode-specific performance variable (like short circuit current, open circuit voltage or fill factor) that is directly affected by the failure mode, instead of overall power which would be affected by one or more of the performance variables. Hence, to address several of the above-mentioned issues, this research is divided into three phases. The first phase deals with developing models to study climate specific failure modes using failure mode specific parameters instead of power degradation. The limited field data collected after a long time (say 18-21 years), is utilized to model the degradation rate and the developed model is then calibrated to account for several unknown environmental effects using the available qualification testing data. The second phase discusses the cumulative damage modeling method to quantify the effects of various environmental variables on the overall power production of the photovoltaic module. Mainly, this cumulative degradation modeling approach is used to model the power degradation path and quantify the effects of high frequency multiple environmental input data (like temperature, humidity measured every minute or hour) with very sparse response data (power measurements taken quarterly or annually). The third phase deals with optimal planning and inference framework using Iterative-Accelerated Life Testing (I-ALT) methodology. All the proposed methodologies are demonstrated and validated using appropriate case studies.
ContributorsBala Subramaniyan, Arun (Author) / Pan, Rong (Thesis advisor) / Tamizhmani, Govindasamy (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2020
Description
The popularity of solar photovoltaic (PV) energy is growing across the globe with more than 500 GW installed in 2018 with a capacity of 640 GW in 2019. Improved PV module reliability minimizes the levelized cost of energy. Studying and accelerating encapsulant browning and solder bond degradation—two of the most commonly observed degradation modes in the field—in a lab requires replicating the stress conditions that induce the same field degradation modes in a controlled accelerated environment to reduce testing time.
Accelerated testing is vital in learning about the reliability of solar PV modules. The unique streamlined approach taken saves time and resources with a statistically significant number of samples being tested in one chamber under multiple experimental stress conditions that closely mirror field conditions that induce encapsulant browning and solder bond degradation. With short circuit current (Isc) and series resistance (Rs) degradation data sets at multiple temperatures, the activation energies (Ea) for encapsulant browning and solder bond degradation was calculated.
Regular degradation was replaced by the wear-out stages of encapsulant browning and solder bond degradation by subjecting two types of field-aged modules to further accelerated testing. For browning, the Ea calculated through the Arrhenius model was 0.37 ± 0.17 eV and 0.71 ± 0.07 eV. For solder bond degradation, the Arrhenius model was used to calculate an Ea of 0.12 ± 0.05 eV for solder with 2wt% Ag and 0.35 ± 0.04 eV for Sn60Pb40 solder.
To study the effect of types of encapsulant, backsheet, and solder on encapsulant browning and solder bond degradation, 9-cut-cell samples maximizing available data points while minimizing resources underwent accelerated tests described for modules. A ring-like browning feature was observed in samples with UV pass EVA above and UV cut EVA below the cells. The backsheet permeability influences the extent of oxygen photo-bleaching. In samples with solder bond degradation, increased bright spots and cell darkening resulted in increased Rs. Combining image processing with fluorescence imaging and electroluminescence imaging would yield great insight into the two degradation modes.
Accelerated testing is vital in learning about the reliability of solar PV modules. The unique streamlined approach taken saves time and resources with a statistically significant number of samples being tested in one chamber under multiple experimental stress conditions that closely mirror field conditions that induce encapsulant browning and solder bond degradation. With short circuit current (Isc) and series resistance (Rs) degradation data sets at multiple temperatures, the activation energies (Ea) for encapsulant browning and solder bond degradation was calculated.
Regular degradation was replaced by the wear-out stages of encapsulant browning and solder bond degradation by subjecting two types of field-aged modules to further accelerated testing. For browning, the Ea calculated through the Arrhenius model was 0.37 ± 0.17 eV and 0.71 ± 0.07 eV. For solder bond degradation, the Arrhenius model was used to calculate an Ea of 0.12 ± 0.05 eV for solder with 2wt% Ag and 0.35 ± 0.04 eV for Sn60Pb40 solder.
To study the effect of types of encapsulant, backsheet, and solder on encapsulant browning and solder bond degradation, 9-cut-cell samples maximizing available data points while minimizing resources underwent accelerated tests described for modules. A ring-like browning feature was observed in samples with UV pass EVA above and UV cut EVA below the cells. The backsheet permeability influences the extent of oxygen photo-bleaching. In samples with solder bond degradation, increased bright spots and cell darkening resulted in increased Rs. Combining image processing with fluorescence imaging and electroluminescence imaging would yield great insight into the two degradation modes.
ContributorsGopalakrishna, Hamsini (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Hacke, Peter (Committee member) / Arizona State University (Publisher)
Created2020
Description
Demand for green energy alternatives to provide stable and reliable energy
solutions has increased over the years which has led to the rapid expansion of global
markets in renewable energy sources such as solar photovoltaic (PV) technology. Newest
amongst these technologies is the Bifacial PV modules, which harvests incident radiation
from both sides of the module. The overall power generation can be significantly increased
by using these bifacial modules. The purpose of this research is to investigate and maximize
the effect of back reflectors, designed to increase the efficiency of the module by utilizing
the intercell light passing through the module to increase the incident irradiance, on the
energy output using different profiles placed at varied distances from the plane of the array
(POA). The optimum reflector profile and displacement of the reflector from the module
are determined experimentally.
Theoretically, a 60-cell bifacial module can produce 26% additional energy in
comparison to a 48-cell bifacial module due to the 12 excess cells found in the 60-cell
module. It was determined that bifacial modules have the capacity to produce additional
energy when optimized back reflectors are utilized. The inverted U reflector produced
higher energy gain when placed at farther distances from the module, indicating direct
dependent proportionality between the placement distance of the reflector from the module
and the output energy gain. It performed the best out of all current construction geometries
with reflective coatings, generating more than half of the additional energy produced by a
densely-spaced 60-cell benchmark module compared to a sparsely-spaced 48-cell reference
module.ii
A gain of 11 and 14% was recorded on cloudy and sunny days respectively for the
inverted U reflector. This implies a reduction in the additional cells of the 60-cell module
by 50% can produce the same amount of energy of the 60-cell module by a 48-cell module
with an inverted U reflector. The use of the back reflectors does not only affect the
additional energy gain but structural and land costs. Row to row spacing for bifacial
systems(arrays) is reduced nearly by half as the ground height clearance is largely
minimized, thus almost 50% of height constraints for mounting bifacial modules, using
back reflectors resulting in reduced structural costs for mounting of bifacial modules
solutions has increased over the years which has led to the rapid expansion of global
markets in renewable energy sources such as solar photovoltaic (PV) technology. Newest
amongst these technologies is the Bifacial PV modules, which harvests incident radiation
from both sides of the module. The overall power generation can be significantly increased
by using these bifacial modules. The purpose of this research is to investigate and maximize
the effect of back reflectors, designed to increase the efficiency of the module by utilizing
the intercell light passing through the module to increase the incident irradiance, on the
energy output using different profiles placed at varied distances from the plane of the array
(POA). The optimum reflector profile and displacement of the reflector from the module
are determined experimentally.
Theoretically, a 60-cell bifacial module can produce 26% additional energy in
comparison to a 48-cell bifacial module due to the 12 excess cells found in the 60-cell
module. It was determined that bifacial modules have the capacity to produce additional
energy when optimized back reflectors are utilized. The inverted U reflector produced
higher energy gain when placed at farther distances from the module, indicating direct
dependent proportionality between the placement distance of the reflector from the module
and the output energy gain. It performed the best out of all current construction geometries
with reflective coatings, generating more than half of the additional energy produced by a
densely-spaced 60-cell benchmark module compared to a sparsely-spaced 48-cell reference
module.ii
A gain of 11 and 14% was recorded on cloudy and sunny days respectively for the
inverted U reflector. This implies a reduction in the additional cells of the 60-cell module
by 50% can produce the same amount of energy of the 60-cell module by a 48-cell module
with an inverted U reflector. The use of the back reflectors does not only affect the
additional energy gain but structural and land costs. Row to row spacing for bifacial
systems(arrays) is reduced nearly by half as the ground height clearance is largely
minimized, thus almost 50% of height constraints for mounting bifacial modules, using
back reflectors resulting in reduced structural costs for mounting of bifacial modules
ContributorsMARTIN, PEDRO JESSE (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Phelan, Patrick (Committee member) / Wang, Liping (Committee member) / Arizona State University (Publisher)
Created2019