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- Creators: Tamizhmani, Govindasamy
- Creators: Chemical Engineering Program
Description
Encapsulant is a key packaging component of photovoltaic (PV) modules, which protects the solar cell from physical, environmental and electrical damages. Ethylene-vinyl acetate (EVA) is one of the major encapsulant materials used in the PV industry. This work focuses on indoor accelerated ultraviolet (UV) stress testing and characterization to investigate the EVA discoloration and delamination in PV modules by using various non-destructive characterization techniques, including current-voltage (IV) measurements, UV fluorescence (UVf) and colorimetry measurements. Mini-modules with glass/EVA/cell/EVA/backsheet construction were fabricated in the laboratory with two types of EVA, UV-cut EVA (UVC) and UV-pass EVA (UVP).
The accelerated UV testing was performed in a UV chamber equipped with UV lights at an ambient temperature of 50°C, little or no humidity and total UV dosage of 400 kWh/m2. The mini-modules were maintained at three different temperatures through UV light heating by placing different thickness of thermal insulation sheets over the backsheet. Also, prior to thermal insulation sheet placement, the backsheet and laminate edges were fully covered with aluminum tape to prevent oxygen diffusion into the module and hence the photobleaching reaction.
The characterization results showed that mini-modules with UV-cut EVA suffered from discoloration while the modules with UV-pass EVA suffered from delamination. UVf imaging technique has the capability to identify the discoloration region in the UVC modules in the very early stage when the discoloration is not visible to the naked eyes, whereas Isc measurement is unable to measure the performance loss until the color becomes visibly darker. YI also provides the direct evidence of yellowing in the encapsulant. As expected, the extent of degradation due to discoloration increases with the increase in module temperature. The Isc loss is dictated by both the regions – discolored area at the center and non-discolored area at the cell edges, whereas the YI is only determined at the discolored region due to low probe area. This led to the limited correlation between Isc and YI in UVC modules.
In case of UVP modules, UV radiation has caused an adverse impact on the interfacial adhesion between the EVA and solar cell, which was detected from UVf images and severe Isc loss. No change in YI confirms that the reason for Isc loss is not due to yellowing but the delamination.
Further, the activation energy of encapsulant discoloration was estimated by using Arrhenius model on two types of data, %Isc drop and ΔYI. The Ea determined from the change in YI data for the EVA encapsulant discoloration reaction without the influence of oxygen and humidity is 0.61 eV. Based on the activation energy determined in this work and hourly weather data of any site, the degradation rate for the encaspulant browning mode can be estimated.
The accelerated UV testing was performed in a UV chamber equipped with UV lights at an ambient temperature of 50°C, little or no humidity and total UV dosage of 400 kWh/m2. The mini-modules were maintained at three different temperatures through UV light heating by placing different thickness of thermal insulation sheets over the backsheet. Also, prior to thermal insulation sheet placement, the backsheet and laminate edges were fully covered with aluminum tape to prevent oxygen diffusion into the module and hence the photobleaching reaction.
The characterization results showed that mini-modules with UV-cut EVA suffered from discoloration while the modules with UV-pass EVA suffered from delamination. UVf imaging technique has the capability to identify the discoloration region in the UVC modules in the very early stage when the discoloration is not visible to the naked eyes, whereas Isc measurement is unable to measure the performance loss until the color becomes visibly darker. YI also provides the direct evidence of yellowing in the encapsulant. As expected, the extent of degradation due to discoloration increases with the increase in module temperature. The Isc loss is dictated by both the regions – discolored area at the center and non-discolored area at the cell edges, whereas the YI is only determined at the discolored region due to low probe area. This led to the limited correlation between Isc and YI in UVC modules.
In case of UVP modules, UV radiation has caused an adverse impact on the interfacial adhesion between the EVA and solar cell, which was detected from UVf images and severe Isc loss. No change in YI confirms that the reason for Isc loss is not due to yellowing but the delamination.
Further, the activation energy of encapsulant discoloration was estimated by using Arrhenius model on two types of data, %Isc drop and ΔYI. The Ea determined from the change in YI data for the EVA encapsulant discoloration reaction without the influence of oxygen and humidity is 0.61 eV. Based on the activation energy determined in this work and hourly weather data of any site, the degradation rate for the encaspulant browning mode can be estimated.
ContributorsDolia, Kshitiz (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Green, Matthew (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2018
Description
Solar photovoltaic (PV) deployment has grown at unprecedented rates since the early 2000s. As the global PV market increases, so will the volume of decommissioned PV panels. Growing PV panel waste presents a new environmental challenge, but also unprecedented opportunities to create value and pursue new economic avenues. Currently, in the United States, there are no regulations for governing the recycling of solar panels and the recycling process varies by the manufacturer. To bring in PV specific recycling regulations, whether the PV panels are toxic to the landfills, is to be determined. Per existing EPA regulations, PV panels are categorized as general waste and are subjected to a toxicity characterization leaching procedure (TCLP) to determine if it contains any toxic metals that can possibly leach into the landfill. In this thesis, a standardized procedure is developed for extracting samples from an end of life PV module. A literature review of the existing regulations in Europe and other countries is done. The sample extraction procedure is tested on a crystalline Si module to validate the method. The extracted samples are sent to an independent TCLP testing lab and the results are obtained. Image processing technique developed at ASU PRL is used to detect the particle size in a broken module and the size of samples sent is confirmed to follow the regulation.
ContributorsKrishnamurthy, Raghav (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2017
Description
A new class of layered materials called the transition metal trichalcogenides (TMTCs) exhibit strong anisotropic properties due to their quasi-1D nature. These 2D materials are composed of chain-like structures which are weakly bound to form planar sheets with highly directional properties. The vibrational properties of three materials from the TMTC family, specifically TiS3, ZrS3, and HfS3, are relatively unknown and studies performed in this work elucidates the origin of their Raman characteristics. The crystals were synthesized through chemical vapor transport prior to mechanical exfoliation onto Si/SiO¬2 substrates. XRD, AFM, and Raman spectroscopy were used to determine the crystallinity, thickness, and chemical signature of the exfoliated crystals. Vibrational modes and anisotropic polarization are investigated through density functional theory calculations and angle-resolved Raman spectroscopy. Particular Raman modes are explored in order to correlate select peaks to the b-axis crystalline direction. Mode III vibrations for TiS3, ZrS3, and HfS3 are shared between each material and serves as a unique identifier of the crystalline orientation in MX3 materials. Similar angle-resolved Raman studies were conducted on the novel Nb0.5Ti0.5S3 alloy material grown through chemical vapor transport. Results show that the anisotropy direction is more difficult to determine due to the randomization of quasi-1D chains caused by defects that are common in 2D alloys. This work provides a fundamental understanding of the vibrational properties of various TMTC materials which is needed to realize applications in direction dependent polarization and linear dichroism.
ContributorsKong, Wilson (Author) / Tongay, Sefaattin (Thesis advisor) / Wang, Liping (Committee member) / Green, Matthew (Committee member) / Arizona State University (Publisher)
Created2017
Description
Performance of photovoltaic (PV) modules decrease as the operating temperatures increase. In hot climatic conditions, the operating temperature can reach as high as 85°C for the rooftop modules. Considering a typical power drop of 0.5%/°C for crystalline silicon modules, a performance decrease of approximately 30% could be expected during peak summer seasons due to the difference between module rated temperature of 25°C and operating temperature of 85°C. Therefore, it is critical to accurately predict the temperature of the modules so the performance can be accurately predicted. The module operating temperature is based not only on the ambient and irradiance conditions but is also based on the thermal properties of module packaging materials. One of the key packaging materials that would influence the module operating temperature is the substrate, polymer backsheet or glass. In this study, the thermal influence of three different polymer backsheet substrates and one glass substrate has been investigated through five tasks:
1. Determination and modeling of substrate or module temperature of coupons using four different substrates (three backsheet materials and one glass material).
2. Determination and modeling of cell temperature of coupons using four different substrates (three backsheet materials and one glass material)
3. Determination of temperature difference between cell and individual substrates for coupons of all four substrates
4. Determination of NOCT (nominal operating cell temperature) of coupons using all four substrate materials
5. Comparison of operating temperature difference between backsheet substrate coupons.
All these five tasks have been executed using the specially constructed one-cell coupons with identical cells but with four different substrates. For redundancy, two coupons per substrate were constructed and investigated. This study has attempted to model the effect of thermal conductivity of backsheet material on the cell and backsheet temperatures.
1. Determination and modeling of substrate or module temperature of coupons using four different substrates (three backsheet materials and one glass material).
2. Determination and modeling of cell temperature of coupons using four different substrates (three backsheet materials and one glass material)
3. Determination of temperature difference between cell and individual substrates for coupons of all four substrates
4. Determination of NOCT (nominal operating cell temperature) of coupons using all four substrate materials
5. Comparison of operating temperature difference between backsheet substrate coupons.
All these five tasks have been executed using the specially constructed one-cell coupons with identical cells but with four different substrates. For redundancy, two coupons per substrate were constructed and investigated. This study has attempted to model the effect of thermal conductivity of backsheet material on the cell and backsheet temperatures.
ContributorsNatarajan Rammohan, Balamurali (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2017
Description
In the current photovoltaic (PV) industry, the O&M (operations and maintenance) personnel in the field primarily utilize three approaches to identify the underperforming or defective modules in a string: i) EL (electroluminescence) imaging of all the modules in the string; ii) IR (infrared) thermal imaging of all the modules in the string; and, iii) current-voltage (I-V) curve tracing of all the modules in the string. In the first and second approaches, the EL images are used to detect the modules with broken cells, and the IR images are used to detect the modules with hotspot cells, respectively. These two methods may identify the modules with defective cells only semi-qualitatively, but not accurately and quantitatively. The third method, I-V curve tracing, is a quantitative method to identify the underperforming modules in a string, but it is an extremely time consuming, labor-intensive, and highly ambient conditions dependent method. Since the I-V curves of individual modules in a string are obtained by disconnecting them individually at different irradiance levels, module operating temperatures, angle of incidences (AOI) and air-masses/spectra, all these measured curves are required to be translated to a single reporting condition (SRC) of a single irradiance, single temperature, single AOI and single spectrum. These translations are not only time consuming but are also prone to inaccuracy due to inherent issues in the translation models. Therefore, the current challenges in using the traditional I-V tracers are related to: i) obtaining I-V curves simultaneously of all the modules and substrings in a string at a single irradiance, operating temperature, irradiance spectrum and angle of incidence due to changing weather parameters and sun positions during the measurements, ii) safety of field personnel when disconnecting and reconnecting of cables in high voltage systems (especially field aged connectors), and iii) enormous time and hardship for the test personnel in harsh outdoor climatic conditions. In this thesis work, a non-contact I-V (NCIV) curve tracing tool has been integrated and implemented to address the above mentioned three challenges of the traditional I-V tracers.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
This work compares I-V curves obtained using a traditional I-V curve tracer with the I-V curves obtained using a NCIV curve tracer for the string, substring and individual modules of crystalline silicon (c-Si) and cadmium telluride (CdTe) technologies. The NCIV curve tracer equipment used in this study was integrated using three commercially available components: non-contact voltmeters (NCV) with voltage probes to measure the voltages of substrings/modules in a string, a hall sensor to measure the string current and a DAS (data acquisition system) for simultaneous collection of the voltage data obtained from the NCVs and the current data obtained from the hall sensor. This study demonstrates the concept and accuracy of the NCIV curve tracer by comparing the I-V curves obtained using a traditional capacitor-based tracer and the NCIV curve tracer in a three-module string of c-Si modules and of CdTe modules under natural sunlight with uniform light conditions on all the modules in the string and with partially shading one or more of the modules in the string to simulate and quantitatively detect the underperforming module(s) in a string.
ContributorsMurali, Sanjay (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2020
Description
The popularity of solar photovoltaic (PV) energy is growing across the globe with more than 500 GW installed in 2018 with a capacity of 640 GW in 2019. Improved PV module reliability minimizes the levelized cost of energy. Studying and accelerating encapsulant browning and solder bond degradation—two of the most commonly observed degradation modes in the field—in a lab requires replicating the stress conditions that induce the same field degradation modes in a controlled accelerated environment to reduce testing time.
Accelerated testing is vital in learning about the reliability of solar PV modules. The unique streamlined approach taken saves time and resources with a statistically significant number of samples being tested in one chamber under multiple experimental stress conditions that closely mirror field conditions that induce encapsulant browning and solder bond degradation. With short circuit current (Isc) and series resistance (Rs) degradation data sets at multiple temperatures, the activation energies (Ea) for encapsulant browning and solder bond degradation was calculated.
Regular degradation was replaced by the wear-out stages of encapsulant browning and solder bond degradation by subjecting two types of field-aged modules to further accelerated testing. For browning, the Ea calculated through the Arrhenius model was 0.37 ± 0.17 eV and 0.71 ± 0.07 eV. For solder bond degradation, the Arrhenius model was used to calculate an Ea of 0.12 ± 0.05 eV for solder with 2wt% Ag and 0.35 ± 0.04 eV for Sn60Pb40 solder.
To study the effect of types of encapsulant, backsheet, and solder on encapsulant browning and solder bond degradation, 9-cut-cell samples maximizing available data points while minimizing resources underwent accelerated tests described for modules. A ring-like browning feature was observed in samples with UV pass EVA above and UV cut EVA below the cells. The backsheet permeability influences the extent of oxygen photo-bleaching. In samples with solder bond degradation, increased bright spots and cell darkening resulted in increased Rs. Combining image processing with fluorescence imaging and electroluminescence imaging would yield great insight into the two degradation modes.
Accelerated testing is vital in learning about the reliability of solar PV modules. The unique streamlined approach taken saves time and resources with a statistically significant number of samples being tested in one chamber under multiple experimental stress conditions that closely mirror field conditions that induce encapsulant browning and solder bond degradation. With short circuit current (Isc) and series resistance (Rs) degradation data sets at multiple temperatures, the activation energies (Ea) for encapsulant browning and solder bond degradation was calculated.
Regular degradation was replaced by the wear-out stages of encapsulant browning and solder bond degradation by subjecting two types of field-aged modules to further accelerated testing. For browning, the Ea calculated through the Arrhenius model was 0.37 ± 0.17 eV and 0.71 ± 0.07 eV. For solder bond degradation, the Arrhenius model was used to calculate an Ea of 0.12 ± 0.05 eV for solder with 2wt% Ag and 0.35 ± 0.04 eV for Sn60Pb40 solder.
To study the effect of types of encapsulant, backsheet, and solder on encapsulant browning and solder bond degradation, 9-cut-cell samples maximizing available data points while minimizing resources underwent accelerated tests described for modules. A ring-like browning feature was observed in samples with UV pass EVA above and UV cut EVA below the cells. The backsheet permeability influences the extent of oxygen photo-bleaching. In samples with solder bond degradation, increased bright spots and cell darkening resulted in increased Rs. Combining image processing with fluorescence imaging and electroluminescence imaging would yield great insight into the two degradation modes.
ContributorsGopalakrishna, Hamsini (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Hacke, Peter (Committee member) / Arizona State University (Publisher)
Created2020
Description
The main objective of this research is to develop reliability assessment methodologies to quantify the effect of various environmental factors on photovoltaic (PV) module performance degradation. The manufacturers of these photovoltaic modules typically provide a warranty level of about 25 years for 20% power degradation from the initial specified power rating. To quantify the reliability of such PV modules, the Accelerated Life Testing (ALT) plays an important role. But there are several obstacles that needs to be tackled to conduct such experiments, since there has not been enough historical field data available. Even if some time-series performance data of maximum output power (Pmax) is available, it may not be useful to develop failure/degradation mode-specific accelerated tests. This is because, to study the specific failure modes, it is essential to use failure mode-specific performance variable (like short circuit current, open circuit voltage or fill factor) that is directly affected by the failure mode, instead of overall power which would be affected by one or more of the performance variables. Hence, to address several of the above-mentioned issues, this research is divided into three phases. The first phase deals with developing models to study climate specific failure modes using failure mode specific parameters instead of power degradation. The limited field data collected after a long time (say 18-21 years), is utilized to model the degradation rate and the developed model is then calibrated to account for several unknown environmental effects using the available qualification testing data. The second phase discusses the cumulative damage modeling method to quantify the effects of various environmental variables on the overall power production of the photovoltaic module. Mainly, this cumulative degradation modeling approach is used to model the power degradation path and quantify the effects of high frequency multiple environmental input data (like temperature, humidity measured every minute or hour) with very sparse response data (power measurements taken quarterly or annually). The third phase deals with optimal planning and inference framework using Iterative-Accelerated Life Testing (I-ALT) methodology. All the proposed methodologies are demonstrated and validated using appropriate case studies.
ContributorsBala Subramaniyan, Arun (Author) / Pan, Rong (Thesis advisor) / Tamizhmani, Govindasamy (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2020
Description
The goal of any solar photovoltaic (PV) system is to generate maximum energy throughout its lifetime. The parameters that can affect PV module power output include: solar irradiance, temperature, soil accumulation, shading, encapsulant browning, encapsulant delamination, series resistance increase due to solder bond degradation and corrosion and shunt resistance decrease due to potential induced degradation, etc. Several PV modules together in series makes up a string, and in a power plant there are a number of these strings in parallel which can be referred to as an array. Ideally, PV modules in a string should be identically matched to attain maximum power output from the entire string. Any underperforming module or mismatch among modules within a string can reduce the power output. The goal of this project is to quickly identify and quantitatively determine the underperforming module(s) in an operating string without the use of an I-V curve tracer, irradiance sensor or temperature sensor. This goal was achieved by utilizing Radiovoltmeters (RVM). In this project, it is demonstrated that the voltages at maximum power point (Vmax) of all the individual modules in a string can be simultaneously and quantitatively obtained using RVMs at a single irradiance, single module operating temperature, single spectrum and single angle of incidence. By combining these individual module voltages (Vmax) with the string current (Imax) using a Hall sensor, the power output of individual modules can be obtained, quickly and quantitatively.
ContributorsTahghighi, Arash (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2019
Description
Deformable heat exchangers could provide a multitude of previously untapped advantages ranging from adaptable performance via macroscale, dynamic shape change (akin to dilation/constriction seen in blood vessels) to enhanced heat transfer at thermal interfaces through microscale, surface deformations. So far, making deformable, ‘soft heat exchangers’ (SHXs) has been limited by the low thermal conductivity of materials with suitable mechanical properties. The recent introduction of liquid-metal embedded elastomers by Bartlett et al1 has addressed this need. Specifically, by remaining soft and stretchable despite the addition of filler, these thermally conductive composites provide an ideal material for the new class of “soft thermal systems”, which is introduced in this work. Understanding such thermal systems will be a key element in enabling technology that require high levels of stretchability, such as thermoregulatory garments, soft electronics, wearable electronics, and high-powered robotics. Shape change inherent to SHX operation has the potential to violate many conventional assumptions used in HX design and thus requires the development of new theoretical approaches to predict performance. To create a basis for understanding these devices, this work highlights two sequential studies. First, the effects of transitioning to a surface deformable, SHX under steady state static conditions in the setting of a liquid cooling device for thermoregulation, electronics and robotics applications was explored. In this study, a thermomechanical model was built and validated to predict the thermal performance and a system wide analysis to optimize such devices was carried out. Second, from a more fundamental perspective, the effects of SHXs undergoing transient shape deformation during operation was explored. A phase shift phenomenon in cooling performance dependent on stretch rate, stretch extent and thermal diffusivity was discovered and explained. With the use of a time scale analysis, the extent of quasi-static assumption viability in modeling such systems was quantified and multiple shape modulation regime limits were defined. Finally, nuance considerations and future work of using liquid metal-silicone composites in SHXs were discussed.
ContributorsKotagama, Praveen (Author) / Rykaczewski, Konrad (Thesis advisor) / Wang, Robert (Committee member) / Phelan, Patrick (Committee member) / Herrmann, Marcus (Committee member) / Green, Matthew (Committee member) / Arizona State University (Publisher)
Created2020
Description
The primary goal of this thesis is to evaluate the influence of ethyl vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulant types on the glass-glass (GG) photovoltaic (PV) module reliability. The influence of these two encapsulant types on the reliability of GG modules was compared with baseline glass-polymer backsheet (GB) modules for a benchmarking purpose. Three sets of modules, with four modules in each set, were constructed with two substrates types i.e. glass-glass (GG) and glass- polymer backsheet (GB); and 2 encapsulants types i.e. ethyl vinyl acetate (EVA) and polyolefin elastomer (POE). Each module set was subjected to the following accelerated tests as specified in the International Electrotechnical Commission (IEC) standard and Qualification Plus protocol of NREL: Ultraviolet (UV) 250 kWh/m2; Thermal Cycling (TC) 200 cycles; Damp Heat (DH) 1250 hours. To identify the failure modes and reliability issues of the stressed modules, several module-level non-destructive characterizations were carried out and they include colorimetry, UV-Vis-NIR spectral reflectance, ultraviolet fluorescence (UVF) imaging, electroluminescence (EL) imaging, and infrared (IR) imaging. The above-mentioned characterizations were performed on the front side of the modules both before the stress tests (i.e. pre-stress) and after the stress tests (i.e. post-stress). The UV-250 extended stress results indicated slight changes in the reflectance on the non-cell area of EVA modules probably due to minor adhesion loss at the cell and module edges. From the DH-1250 extended stress tests, significant changes, in both encapsulant types modules, were observed in reflectance and UVF images indicating early stages of delamination. In the case of the TC-200 stress test, practically no changes were observed in all sets of modules. From the above short-term stress tests, it appears although not conclusive at this stage of the analysis, delamination seems to be the only failure mode that could possibly be affecting the module performance, as observed from UV and DH extended stress tests. All these stress tests need to be continued to identify the wear-out failure modes and their impacts on the performance parameters of PV modules.
ContributorsBhaskaran, Rahul (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Phelan, Patrick (Thesis advisor) / Wang, Liping (Committee member) / Arizona State University (Publisher)
Created2020