This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students. 

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Description
Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary

Micro Electro Mechanical Systems (MEMS) is one of the fastest growing field in silicon industry. Low cost production is key for any company to improve their market share. MEMS testing is challenging since input to test a MEMS device require physical stimulus like acceleration, pressure etc. Also, MEMS device vary with process and requires calibration to make them reliable. This increases test cost and testing time. This challenge can be overcome by combining electrical stimulus based testing along with statistical analysis on MEMS response for electrical stimulus and also limited physical stimulus response data. This thesis proposes electrical stimulus based built in self test(BIST) which can be used to get MEMS data and later this data can be used for statistical analysis. A capacitive MEMS accelerometer is considered to test this BIST approach. This BIST circuit overhead is less and utilizes most of the standard readout circuit. This thesis discusses accelerometer response for electrical stimulus and BIST architecture. As a part of this BIST circuit, a second order sigma delta modulator has been designed. This modulator has a sampling frequency of 1MHz and bandwidth of 6KHz. SNDR of 60dB is achieved with 1Vpp differential input signal and 3.3V supply
ContributorsKundur, Vinay (Author) / Bakkaloglu, Bertan (Committee member) / Ozev, Sule (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
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Description
The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem

The design and development of analog/mixed-signal (AMS) integrated circuits (ICs) is becoming increasingly expensive, complex, and lengthy. Rapid prototyping and emulation of analog ICs will be significant in the design and testing of complex analog systems. A new approach, Programmable ANalog Device Array (PANDA) that maps any AMS design problem to a transistor-level programmable hardware, is proposed. This approach enables fast system level validation and a reduction in post-Silicon bugs, minimizing design risk and cost. The unique features of the approach include 1) transistor-level programmability that emulates each transistor behavior in an analog design, achieving very fine granularity of reconfiguration; 2) programmable switches that are treated as a design component during analog transistor emulating, and optimized with the reconfiguration matrix; 3) compensation of AC performance degradation through boosting the bias current. Based on these principles, a digitally controlled PANDA platform is designed at 45nm node that can map AMS modules across 22nm to 90nm technology nodes. A systematic emulation approach to map any analog transistor to PANDA cell is proposed, which achieves transistor level matching accuracy of less than 5% for ID and less than 10% for Rout and Gm. Circuit level analog metrics of a voltage-controlled oscillator (VCO) emulated by PANDA, match to those of the original designs in 90nm nodes with less than a 5% error. Voltage-controlled delay lines at 65nm and 90nm are emulated by 32nm PANDA, which successfully match important analog metrics. And at-speed emulation is achieved as well. Several other 90nm analog blocks are successfully emulated by the 45nm PANDA platform, including a folded-cascode operational amplifier and a sample-and-hold module (S/H)
ContributorsXu, Cheng (Author) / Cao, Yu (Thesis advisor) / Blain Christen, Jennifer (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2012
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Description
In this thesis, quantitative evaluation of quality of movement during stroke rehabilitation will be discussed. Previous research on stroke rehabilitation in hospital has been shown to be effective. In this thesis, we study various issues that arise when creating a home-based system that can be deployed in a patient's home.

In this thesis, quantitative evaluation of quality of movement during stroke rehabilitation will be discussed. Previous research on stroke rehabilitation in hospital has been shown to be effective. In this thesis, we study various issues that arise when creating a home-based system that can be deployed in a patient's home. Limitation of motion capture due to reduced number of sensors leads to problems with design of kinematic features for quantitative evaluation. Also, the hierarchical three-level tasks of rehabilitation requires new design of kinematic features. In this thesis, the design of kinematic features for a home based stroke rehabilitation system will be presented. Results of the most challenging classifier are shown and proves the effectiveness of the design. Comparison between modern classification techniques and low computational cost threshold based classification with same features will also be shown.
ContributorsCheng, Long (Author) / Turaga, Pavan (Thesis advisor) / Arizona State University (Publisher)
Created2012
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Description
Motion capture using cost-effective sensing technology is challenging and the huge success of Microsoft Kinect has been attracting researchers to uncover the potential of using this technology into computer vision applications. In this thesis, an upper-body motion analysis in a home-based system for stroke rehabilitation using novel RGB-D camera -

Motion capture using cost-effective sensing technology is challenging and the huge success of Microsoft Kinect has been attracting researchers to uncover the potential of using this technology into computer vision applications. In this thesis, an upper-body motion analysis in a home-based system for stroke rehabilitation using novel RGB-D camera - Kinect is presented. We address this problem by first conducting a systematic analysis of the usability of Kinect for motion analysis in stroke rehabilitation. Then a hybrid upper body tracking approach is proposed which combines off-the-shelf skeleton tracking with a novel depth-fused mean shift tracking method. We proposed several kinematic features reliably extracted from the proposed inexpensive and portable motion capture system and classifiers that correlate torso movement to clinical measures of unimpaired and impaired. Experiment results show that the proposed sensing and analysis works reliably on measuring torso movement quality and is promising for end-point tracking. The system is currently being deployed for large-scale evaluations.
ContributorsDu, Tingfang (Author) / Turaga, Pavan (Thesis advisor) / Spanias, Andreas (Committee member) / Rikakis, Thanassis (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Image understanding has been playing an increasingly crucial role in vision applications. Sparse models form an important component in image understanding, since the statistics of natural images reveal the presence of sparse structure. Sparse methods lead to parsimonious models, in addition to being efficient for large scale learning. In sparse

Image understanding has been playing an increasingly crucial role in vision applications. Sparse models form an important component in image understanding, since the statistics of natural images reveal the presence of sparse structure. Sparse methods lead to parsimonious models, in addition to being efficient for large scale learning. In sparse modeling, data is represented as a sparse linear combination of atoms from a "dictionary" matrix. This dissertation focuses on understanding different aspects of sparse learning, thereby enhancing the use of sparse methods by incorporating tools from machine learning. With the growing need to adapt models for large scale data, it is important to design dictionaries that can model the entire data space and not just the samples considered. By exploiting the relation of dictionary learning to 1-D subspace clustering, a multilevel dictionary learning algorithm is developed, and it is shown to outperform conventional sparse models in compressed recovery, and image denoising. Theoretical aspects of learning such as algorithmic stability and generalization are considered, and ensemble learning is incorporated for effective large scale learning. In addition to building strategies for efficiently implementing 1-D subspace clustering, a discriminative clustering approach is designed to estimate the unknown mixing process in blind source separation. By exploiting the non-linear relation between the image descriptors, and allowing the use of multiple features, sparse methods can be made more effective in recognition problems. The idea of multiple kernel sparse representations is developed, and algorithms for learning dictionaries in the feature space are presented. Using object recognition experiments on standard datasets it is shown that the proposed approaches outperform other sparse coding-based recognition frameworks. Furthermore, a segmentation technique based on multiple kernel sparse representations is developed, and successfully applied for automated brain tumor identification. Using sparse codes to define the relation between data samples can lead to a more robust graph embedding for unsupervised clustering. By performing discriminative embedding using sparse coding-based graphs, an algorithm for measuring the glomerular number in kidney MRI images is developed. Finally, approaches to build dictionaries for local sparse coding of image descriptors are presented, and applied to object recognition and image retrieval.
ContributorsJayaraman Thiagarajan, Jayaraman (Author) / Spanias, Andreas (Thesis advisor) / Frakes, David (Committee member) / Tepedelenlioğlu, Cihan (Committee member) / Turaga, Pavan (Committee member) / Arizona State University (Publisher)
Created2013
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Description
The medical industry has benefited greatly by electronic integration resulting in the explosive growth of active medical implants. These devices often treat and monitor chronic health conditions and require very minimal power usage. A key part of these medical implants is an ultra-low power two way wireless communication system. This

The medical industry has benefited greatly by electronic integration resulting in the explosive growth of active medical implants. These devices often treat and monitor chronic health conditions and require very minimal power usage. A key part of these medical implants is an ultra-low power two way wireless communication system. This enables both control of the implant as well as relay of information collected. This research has focused on a high performance receiver for medical implant applications. One commonly quoted specification to compare receivers is energy per bit required. This metric is useful, but incomplete in that it ignores Sensitivity level, bit error rate, and immunity to interferers. In this study exploration of receiver architectures and convergence upon a comprehensive solution is done. This analysis is used to design and build a system for validation. The Direct Conversion Receiver architecture implemented for the MICS standard in 0.18 µm CMOS process consumes approximately 2 mW is competitive with published research.
ContributorsStevens, Mark (Author) / Kiaei, Sayfe (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Aberle, James T., 1961- (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there

Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test cost within an acceptable budget. Unfortunately, there is not a single straightforward solution to the problem. Products that are tested have several application domains and distinct customer profiles. Some products are required to operate for long periods of time while others are required to be low cost and optimized for low cost. Multitude of constraints and goals make it impossible to find a single solution that work for all cases. Hence, test development/optimization is typically design/circuit dependent and even process specific. Therefore, test optimization cannot be performed using a single test approach, but necessitates a diversity of approaches. This works aims at addressing test cost minimization and test quality improvement at various levels. In the first chapter of the work, we investigate pre-silicon strategies, such as design for test and pre-silicon statistical simulation optimization. In the second chapter, we investigate efficient post-silicon test strategies, such as adaptive test, adaptive multi-site test, outlier analysis, and process shift detection/tracking.
ContributorsYilmaz, Ender (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Cao, Yu (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Memories play an integral role in today's advanced ICs. Technology scaling has enabled high density designs at the price paid for impact due to variability and reliability. It is imperative to have accurate methods to measure and extract the variability in the SRAM cell to produce accurate reliability projections for

Memories play an integral role in today's advanced ICs. Technology scaling has enabled high density designs at the price paid for impact due to variability and reliability. It is imperative to have accurate methods to measure and extract the variability in the SRAM cell to produce accurate reliability projections for future technologies. This work presents a novel test measurement and extraction technique which is non-invasive to the actual operation of the SRAM memory array. The salient features of this work include i) A single ended SRAM test structure with no disturbance to SRAM operations ii) a convenient test procedure that only requires quasi-static control of external voltages iii) non-iterative method that extracts the VTH variation of each transistor from eight independent switch point measurements. With the present day technology scaling, in addition to the variability with the process, there is also the impact of other aging mechanisms which become dominant. The various aging mechanisms like Negative Bias Temperature Instability (NBTI), Channel Hot Carrier (CHC) and Time Dependent Dielectric Breakdown (TDDB) are critical in the present day nano-scale technology nodes. In this work, we focus on the impact of NBTI due to aging in the SRAM cell and have used Trapping/De-Trapping theory based log(t) model to explain the shift in threshold voltage VTH. The aging section focuses on the following i) Impact of Statistical aging in PMOS device due to NBTI dominates the temporal shift of SRAM cell ii) Besides static variations , shifting in VTH demands increased guard-banding margins in design stage iii) Aging statistics remain constant during the shift, presenting a secondary effect in aging prediction. iv) We have investigated to see if the aging mechanism can be used as a compensation technique to reduce mismatch due to process variations. Finally, the entire test setup has been tested in SPICE and also validated with silicon and the results are presented. The method also facilitates the study of design metrics such as static, read and write noise margins and also the data retention voltage and thus help designers to improve the cell stability of SRAM.
ContributorsRavi, Venkatesa (Author) / Cao, Yu (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Clark, Lawrence (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Effective modeling of high dimensional data is crucial in information processing and machine learning. Classical subspace methods have been very effective in such applications. However, over the past few decades, there has been considerable research towards the development of new modeling paradigms that go beyond subspace methods. This dissertation focuses

Effective modeling of high dimensional data is crucial in information processing and machine learning. Classical subspace methods have been very effective in such applications. However, over the past few decades, there has been considerable research towards the development of new modeling paradigms that go beyond subspace methods. This dissertation focuses on the study of sparse models and their interplay with modern machine learning techniques such as manifold, ensemble and graph-based methods, along with their applications in image analysis and recovery. By considering graph relations between data samples while learning sparse models, graph-embedded codes can be obtained for use in unsupervised, supervised and semi-supervised problems. Using experiments on standard datasets, it is demonstrated that the codes obtained from the proposed methods outperform several baseline algorithms. In order to facilitate sparse learning with large scale data, the paradigm of ensemble sparse coding is proposed, and different strategies for constructing weak base models are developed. Experiments with image recovery and clustering demonstrate that these ensemble models perform better when compared to conventional sparse coding frameworks. When examples from the data manifold are available, manifold constraints can be incorporated with sparse models and two approaches are proposed to combine sparse coding with manifold projection. The improved performance of the proposed techniques in comparison to sparse coding approaches is demonstrated using several image recovery experiments. In addition to these approaches, it might be required in some applications to combine multiple sparse models with different regularizations. In particular, combining an unconstrained sparse model with non-negative sparse coding is important in image analysis, and it poses several algorithmic and theoretical challenges. A convex and an efficient greedy algorithm for recovering combined representations are proposed. Theoretical guarantees on sparsity thresholds for exact recovery using these algorithms are derived and recovery performance is also demonstrated using simulations on synthetic data. Finally, the problem of non-linear compressive sensing, where the measurement process is carried out in feature space obtained using non-linear transformations, is considered. An optimized non-linear measurement system is proposed, and improvements in recovery performance are demonstrated in comparison to using random measurements as well as optimized linear measurements.
ContributorsNatesan Ramamurthy, Karthikeyan (Author) / Spanias, Andreas (Thesis advisor) / Tsakalis, Konstantinos (Committee member) / Karam, Lina (Committee member) / Turaga, Pavan (Committee member) / Arizona State University (Publisher)
Created2013
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Description
The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured

The applications which use MEMS accelerometer have been on rise and many new fields which are using the MEMS devices have been on rise. The industry is trying to reduce the cost of production of these MEMS devices. These devices are manufactured using micromachining and the interface circuitry is manufactured using CMOS and the final product is integrated on to a single chip. Amount spent on testing of the MEMS devices make up a considerable share of the total final cost of the device. In order to save the cost and time spent on testing, researchers have been trying to develop different methodologies. At present, MEMS devices are tested using mechanical stimuli to measure the device parameters and for calibration the device. This testing is necessary since the MEMS process is not a very well controlled process unlike CMOS. This is done using an ATE and the cost of using ATE (automatic testing equipment) contribute to 30-40% of the devices final cost. This thesis proposes an architecture which can use an Electrical Signal to stimulate the MEMS device and use the data from the MEMS response in approximating the calibration coefficients efficiently. As a proof of concept, we have designed a BIST (Built-in self-test) circuit for MEMS accelerometer. The BIST has an electrical stimulus generator, Capacitance-to-voltage converter, ∑ ∆ ADC. This thesis explains in detail the design of the Electrical stimulus generator. We have also designed a technique to correlate the parameters obtained from electrical stimuli to those obtained by mechanical stimuli. This method is cost effective since the additional circuitry needed to implement BIST is less since the technique utilizes most of the existing standard readout circuitry already present.
ContributorsJangala Naga, Naveen Sai (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2014