Theses and Dissertations
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- Creators: Turaga, Pavan
For each of these cases, I present a feasible image restoration pipeline to correct for their particular limitations. For the pinhole camera, I present an early pipeline to allow for practical pinhole photography by reducing noise levels caused by low-light imaging, enhancing exposure levels, and sharpening the blur caused by the pinhole. For lensless cameras, we explore a neural network architecture that performs joint image reconstruction and point spread function (PSF) estimation to robustly recover images captured with multiple PSFs from different cameras. Using adversarial learning, this approach achieves improved reconstruction results that do not require explicit knowledge of the PSF at test-time and shows an added improvement in the reconstruction model’s ability to generalize to variations in the camera’s PSF. This allows lensless cameras to be utilized in a wider range of applications that require multiple cameras without the need to explicitly train a separate model for each new camera. For UDCs, we utilize a multi-stage approach to correct for low light transmission, blur, and haze. This pipeline uses a PyNET deep neural network architecture to perform a majority of the restoration, while additionally using a traditional optimization approach which is then fused in a learned manner in the second stage to improve high-frequency features. I show results from this novel fusion approach that is on-par with the state of the art.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
Classification in machine learning is quite crucial to solve many problems that the world is presented with today. Therefore, it is key to understand one’s problem and develop an efficient model to achieve a solution. One technique to achieve greater model selection and thus further ease in problem solving is estimation of the Bayes Error Rate. This paper provides the development and analysis of two methods used to estimate the Bayes Error Rate on a given set of data to evaluate performance. The first method takes a “global” approach, looking at the data as a whole, and the second is more “local”—partitioning the data at the outset and then building up to a Bayes Error Estimation of the whole. It is found that one of the methods provides an accurate estimation of the true Bayes Error Rate when the dataset is at high dimension, while the other method provides accurate estimation at large sample size. This second conclusion, in particular, can have significant ramifications on “big data” problems, as one would be able to clarify the distribution with an accurate estimation of the Bayes Error Rate by using this method.