This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students. 

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Low Power, High Speed Analog to Digital Converters continues to remain one of the major building blocks for modern communication systems. Due to continuing trend of the aggressive scaling of the MOS devices, the susceptibility of most of the deep-sub micron CMOS technologies to the ionizing radiation has decreased over

Low Power, High Speed Analog to Digital Converters continues to remain one of the major building blocks for modern communication systems. Due to continuing trend of the aggressive scaling of the MOS devices, the susceptibility of most of the deep-sub micron CMOS technologies to the ionizing radiation has decreased over the period of time. When electronic circuits fabricated in these CMOS technologies are exposed to ionizing radiations, considerable change in the performance of circuits can be seen over a period of time. The change in the performance can be quantified in terms of decreasing linearity of the circuit which directly relates to the resolution of the circuit. Analog to Digital Converter is one of the most critical blocks of any electronic circuitry sent to space. The degradation in the performance of an Analog to Digital Converter due to radiation effects can jeopardize many research programs related to space. These radiation effects can completely hamper the working of a circuit. This thesis discusses the effects of Ionizing radiation on an 11 bit 325 MSPS pipeline ADC. The ADC is exposed to different doses of radiation and performance is compared.
ContributorsVashisth, Siddharth (Author) / Barnaby, Hugh J (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Mikkola, Esko (Committee member) / Arizona State University (Publisher)
Created2013
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Description
VCO as a ubiquitous circuit in many systems is highly demanding for the phase noises. Lowering the noise migrated from the power supply has been the trending topics for many years. Considering the Ring Oscillator(RO) based VCO is more sensitive to the supply noise, it is more significant to find

VCO as a ubiquitous circuit in many systems is highly demanding for the phase noises. Lowering the noise migrated from the power supply has been the trending topics for many years. Considering the Ring Oscillator(RO) based VCO is more sensitive to the supply noise, it is more significant to find out a useful technique to reduce the supply noise. Among the conventional supply noise reduction techniques such as filtering, channel length adjusting for the transistors, and the current noise mutual canceling, the new feature of the 28nm UTBB-FD-SOI process launched by the ST semiconductor offered a new method to reduce the noise, which is realized by allowing the circuit designer to dynamically control the threshold voltage. In this thesis, a new structure of the linear coarse-fine VCO with 1V supply voltage is designed for the ring typed VCO. The structure is also designed to be flexible to tune the frequency coverage by the fine and coarse tunable on-board resistors. The thesis has given the model of the phase noise reduction method. The model has also been proved to be meaningful with the newly designed VCO circuit. For instances, given 1μV/√Hz white noise coupled on the supply, the 3GHz VCO can have a more than 7dBc/Hz phase noise lowering at the 10MHz frequency offset.
ContributorsTang, Miao (Author) / Barnaby, Hugh (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Mikkola, Esko (Committee member) / Arizona State University (Publisher)
Created2018