Theses and Dissertations
This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students.
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- Creators: Turaga, Pavan
- Creators: Yang, Yezhou
Description
Network mining has been attracting a lot of research attention because of the prevalence of networks. As the world is becoming increasingly connected and correlated, networks arising from inter-dependent application domains are often collected from different sources, forming the so-called multi-sourced networks. Examples of such multi-sourced networks include critical infrastructure networks, multi-platform social networks, cross-domain collaboration networks, and many more. Compared with single-sourced network, multi-sourced networks bear more complex structures and therefore could potentially contain more valuable information.
This thesis proposes a multi-layered HITS (Hyperlink-Induced Topic Search) algorithm to perform the ranking task on multi-sourced networks. Specifically, each node in the network receives an authority score and a hub score for evaluating the value of the node itself and the value of its outgoing links respectively. Based on a recent multi-layered network model, which allows more flexible dependency structure across different sources (i.e., layers), the proposed algorithm leverages both within-layer smoothness and cross-layer consistency. This essentially allows nodes from different layers to be ranked accordingly. The multi-layered HITS is formulated as a regularized optimization problem with non-negative constraint and solved by an iterative update process. Extensive experimental evaluations demonstrate the effectiveness and explainability of the proposed algorithm.
This thesis proposes a multi-layered HITS (Hyperlink-Induced Topic Search) algorithm to perform the ranking task on multi-sourced networks. Specifically, each node in the network receives an authority score and a hub score for evaluating the value of the node itself and the value of its outgoing links respectively. Based on a recent multi-layered network model, which allows more flexible dependency structure across different sources (i.e., layers), the proposed algorithm leverages both within-layer smoothness and cross-layer consistency. This essentially allows nodes from different layers to be ranked accordingly. The multi-layered HITS is formulated as a regularized optimization problem with non-negative constraint and solved by an iterative update process. Extensive experimental evaluations demonstrate the effectiveness and explainability of the proposed algorithm.
ContributorsYu, Haichao (Author) / Tong, Hanghang (Thesis advisor) / He, Jingrui (Committee member) / Yang, Yezhou (Committee member) / Arizona State University (Publisher)
Created2018
Description
Despite the fact that machine learning supports the development of computer vision applications by shortening the development cycle, finding a general learning algorithm that solves a wide range of applications is still bounded by the ”no free lunch theorem”. The search for the right algorithm to solve a specific problem is driven by the problem itself, the data availability and many other requirements.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
ContributorsHaddad, Bashar Muneer (Author) / Karam, Lina (Thesis advisor) / Li, Baoxin (Committee member) / He, Jingrui (Committee member) / Turaga, Pavan (Committee member) / Arizona State University (Publisher)
Created2019