Theses and Dissertations
This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students.
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- Creators: Turaga, Pavan
Description
This work examines two main areas in model-based time-varying signal processing with emphasis in speech processing applications. The first area concentrates on improving speech intelligibility and on increasing the proposed methodologies application for clinical practice in speech-language pathology. The second area concentrates on signal expansions matched to physical-based models but without requiring independent basis functions; the significance of this work is demonstrated with speech vowels.
A fully automated Vowel Space Area (VSA) computation method is proposed that can be applied to any type of speech. It is shown that the VSA provides an efficient and reliable measure and is correlated to speech intelligibility. A clinical tool that incorporates the automated VSA was proposed for evaluation and treatment to be used by speech language pathologists. Two exploratory studies are performed using two databases by analyzing mean formant trajectories in healthy speech for a wide range of speakers, dialects, and coarticulation contexts. It is shown that phonemes crowded in formant space can often have distinct trajectories, possibly due to accurate perception.
A theory for analyzing time-varying signals models with amplitude modulation and frequency modulation is developed. Examples are provided that demonstrate other possible signal model decompositions with independent basis functions and corresponding physical interpretations. The Hilbert transform (HT) and the use of the analytic form of a signal are motivated, and a proof is provided to show that a signal can still preserve desirable mathematical properties without the use of the HT. A visualization of the Hilbert spectrum is proposed to aid in the interpretation. A signal demodulation is proposed and used to develop a modified Empirical Mode Decomposition (EMD) algorithm.
A fully automated Vowel Space Area (VSA) computation method is proposed that can be applied to any type of speech. It is shown that the VSA provides an efficient and reliable measure and is correlated to speech intelligibility. A clinical tool that incorporates the automated VSA was proposed for evaluation and treatment to be used by speech language pathologists. Two exploratory studies are performed using two databases by analyzing mean formant trajectories in healthy speech for a wide range of speakers, dialects, and coarticulation contexts. It is shown that phonemes crowded in formant space can often have distinct trajectories, possibly due to accurate perception.
A theory for analyzing time-varying signals models with amplitude modulation and frequency modulation is developed. Examples are provided that demonstrate other possible signal model decompositions with independent basis functions and corresponding physical interpretations. The Hilbert transform (HT) and the use of the analytic form of a signal are motivated, and a proof is provided to show that a signal can still preserve desirable mathematical properties without the use of the HT. A visualization of the Hilbert spectrum is proposed to aid in the interpretation. A signal demodulation is proposed and used to develop a modified Empirical Mode Decomposition (EMD) algorithm.
ContributorsSandoval, Steven, 1984- (Author) / Papandreou-Suppappola, Antonia (Thesis advisor) / Liss, Julie M (Committee member) / Turaga, Pavan (Committee member) / Kovvali, Narayan (Committee member) / Arizona State University (Publisher)
Created2016
Description
Despite the fact that machine learning supports the development of computer vision applications by shortening the development cycle, finding a general learning algorithm that solves a wide range of applications is still bounded by the ”no free lunch theorem”. The search for the right algorithm to solve a specific problem is driven by the problem itself, the data availability and many other requirements.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
ContributorsHaddad, Bashar Muneer (Author) / Karam, Lina (Thesis advisor) / Li, Baoxin (Committee member) / He, Jingrui (Committee member) / Turaga, Pavan (Committee member) / Arizona State University (Publisher)
Created2019