Theses and Dissertations
This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students.
Displaying 1 - 2 of 2
Filtering by
- Creators: Turaga, Pavan
Description
Semantic image segmentation has been a key topic in applications involving image processing and computer vision. Owing to the success and continuous research in the field of deep learning, there have been plenty of deep learning-based segmentation architectures that have been designed for various tasks. In this thesis, deep-learning architectures for a specific application in material science; namely the segmentation process for the non-destructive study of the microstructure of Aluminum Alloy AA 7075 have been developed. This process requires the use of various imaging tools and methodologies to obtain the ground-truth information. The image dataset obtained using Transmission X-ray microscopy (TXM) consists of raw 2D image specimens captured from the projections at every beam scan. The segmented 2D ground-truth images are obtained by applying reconstruction and filtering algorithms before using a scientific visualization tool for segmentation. These images represent the corrosive behavior caused by the precipitates and inclusions particles on the Aluminum AA 7075 alloy. The study of the tools that work best for X-ray microscopy-based imaging is still in its early stages.
In this thesis, the underlying concepts behind Convolutional Neural Networks (CNNs) and state-of-the-art Semantic Segmentation architectures have been discussed in detail. The data generation and pre-processing process applied to the AA 7075 Data have also been described, along with the experimentation methodologies performed on the baseline and four other state-of-the-art Segmentation architectures that predict the segmented boundaries from the raw 2D images. A performance analysis based on various factors to decide the best techniques and tools to apply Semantic image segmentation for X-ray microscopy-based imaging was also conducted.
In this thesis, the underlying concepts behind Convolutional Neural Networks (CNNs) and state-of-the-art Semantic Segmentation architectures have been discussed in detail. The data generation and pre-processing process applied to the AA 7075 Data have also been described, along with the experimentation methodologies performed on the baseline and four other state-of-the-art Segmentation architectures that predict the segmented boundaries from the raw 2D images. A performance analysis based on various factors to decide the best techniques and tools to apply Semantic image segmentation for X-ray microscopy-based imaging was also conducted.
ContributorsBarboza, Daniel (Author) / Turaga, Pavan (Thesis advisor) / Chawla, Nikhilesh (Committee member) / Jayasuriya, Suren (Committee member) / Arizona State University (Publisher)
Created2020
Description
Despite the fact that machine learning supports the development of computer vision applications by shortening the development cycle, finding a general learning algorithm that solves a wide range of applications is still bounded by the ”no free lunch theorem”. The search for the right algorithm to solve a specific problem is driven by the problem itself, the data availability and many other requirements.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging.
In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the
multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.
ContributorsHaddad, Bashar Muneer (Author) / Karam, Lina (Thesis advisor) / Li, Baoxin (Committee member) / He, Jingrui (Committee member) / Turaga, Pavan (Committee member) / Arizona State University (Publisher)
Created2019